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2011 IEEE International Vacuum Electronics Conference (IVEC)最新文献

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The problem of diagnostics of electronics and plasma units 电子和等离子体设备的诊断问题
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2012-09-01 DOI: 10.1109/DEIV.2012.6412603
Y. A. Kovalenko, D. Korolev
{"title":"The problem of diagnostics of electronics and plasma units","authors":"Y. A. Kovalenko, D. Korolev","doi":"10.1109/DEIV.2012.6412603","DOIUrl":"https://doi.org/10.1109/DEIV.2012.6412603","url":null,"abstract":"This is to propose a method for determining the heterogeneity emission based on the analysis of Schottky plot of saturation. It is shown that the problem of determining the emission heterogeneity is ill-posed problems and requires for its solution some prior information about the nature of the solution. Since the current emission equation is described by the Fredholm-1st kind of convolution type, the solution of the inverse problem described by the Tikhonov functional, whose solution for a fixed regularization parameter can be found in closed form by Fourier transformation.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114916937","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cathode manufacturing relational data collection and process control system 阴极制造相关数据采集及过程控制系统
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2012-04-01 DOI: 10.1109/IVESC.2012.6264202
M. Effgen
{"title":"Cathode manufacturing relational data collection and process control system","authors":"M. Effgen","doi":"10.1109/IVESC.2012.6264202","DOIUrl":"https://doi.org/10.1109/IVESC.2012.6264202","url":null,"abstract":"The manufacture of cathodes for microwave vacuum electron device industry is in essence the sale of precisely controlled processes verses the sale of goods. This paper will discuss in a novel approach for applying multilayered relational database that permits the use of both purchased and customized reporting software for data collection and process monitoring for the purpose of establishing best practices for control of manufacturing.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122683915","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental results of feedback attenuation in traveling wave tube regenerative oscillators 行波管再生振荡器反馈衰减的实验结果
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2011-02-21 DOI: 10.1109/IVEC.2011.5746963
P. Gao, J. Booske
{"title":"Experimental results of feedback attenuation in traveling wave tube regenerative oscillators","authors":"P. Gao, J. Booske","doi":"10.1109/IVEC.2011.5746963","DOIUrl":"https://doi.org/10.1109/IVEC.2011.5746963","url":null,"abstract":"Traveling Wave Tube (TWT) regenerative oscillators have been proposed and validated as very attractive Terahertz (GHz) sources. Microfabricated integration requires intensive attention before the feedback loop is fully built into a TWT, which makes it very important to investigate the effect of feedback attenuation in a high frequency TWT regenerative oscillator. In this paper, a 5 GHz helix TWT regenerative oscillator is used to predict this effect experimentally.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121239515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Selection of helix tape parameters for Ku-band 140 W SL-TWT ku波段140w SL-TWT螺旋带参数的选择
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2011-02-21 DOI: 10.1109/IVEC.2011.5746931
Abhishek Jain, D. Kumar, R. Tomar, S. Ghosh, Ranjan Sharma, V. Srivastava
{"title":"Selection of helix tape parameters for Ku-band 140 W SL-TWT","authors":"Abhishek Jain, D. Kumar, R. Tomar, S. Ghosh, Ranjan Sharma, V. Srivastava","doi":"10.1109/IVEC.2011.5746931","DOIUrl":"https://doi.org/10.1109/IVEC.2011.5746931","url":null,"abstract":"This paper presents the optimum selection of helix tape parameters for the design of Ku-band 140W short length TWT for space communication application. CST MWS code and in-house developed SUNRAY-3D codes have been used to design helical slow wave structure. In this model, helix is considered as perfectly conducting tape. The dependency of gain flatness and gain per unit length on tape thickness, tape width and helix pitch have been studied by maintaining the propagation constant(β) fixed at central frequency(i.e. 11.3GHz). Dependency of interaction impedance on helix tape width and tape thickness has also been studied.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127296925","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Small-signal field analysis of gyro-TWT amplifier 陀螺行波管放大器的小信号场分析
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2011-02-21 DOI: 10.1109/IVEC.2011.5747013
N. Kalyasundaram, J. Saini, G. N. Babu
{"title":"Small-signal field analysis of gyro-TWT amplifier","authors":"N. Kalyasundaram, J. Saini, G. N. Babu","doi":"10.1109/IVEC.2011.5747013","DOIUrl":"https://doi.org/10.1109/IVEC.2011.5747013","url":null,"abstract":"The corrected dispersion relation governing the linear interaction of a TE mode in a circular cylindrical wave guide with an annular beam of gyrating electrons in a gyro-TWT configuration is derived. When the cyclotron resonance condition is satisfied by the TE mode for a positive s-number, the small-signal theory is shown to give rise to an initial exponential growth of the mode with axial distance over a small but finite band of frequencies around the design frequency.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124824642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Temperature dynamic response of slow-wave structure of space traveling wave tube 空间行波管慢波结构的温度动态响应
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2011-02-21 DOI: 10.1109/IVEC.2011.5747009
Xingqun Zhao, S. Wan, Yixue Wei, Ningfeng Bai, Shilu Zhao, T. Yan, Xiaohan Sun
{"title":"Temperature dynamic response of slow-wave structure of space traveling wave tube","authors":"Xingqun Zhao, S. Wan, Yixue Wei, Ningfeng Bai, Shilu Zhao, T. Yan, Xiaohan Sun","doi":"10.1109/IVEC.2011.5747009","DOIUrl":"https://doi.org/10.1109/IVEC.2011.5747009","url":null,"abstract":"The thermal condition of slow-wave structure is very important to the normal and stable work of the space traveling wave tube. This paper theoretically analyzes dynamic response of helical slow-wave structure, and simulates it with the help of ANSYS., The dynamic response of temperature under different pulse duration and duty cycle is acquired through analysis and simulation.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126635584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Influence of Os-Ru coating on closed-space diode tests of M-Type dispenser cathodes Os-Ru涂层对m型阴极封闭空间二极管试验的影响
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2011-02-21 DOI: 10.1109/IVEC.2011.5747045
P. Swartzentruber, T. Balk, S. Roberts
{"title":"Influence of Os-Ru coating on closed-space diode tests of M-Type dispenser cathodes","authors":"P. Swartzentruber, T. Balk, S. Roberts","doi":"10.1109/IVEC.2011.5747045","DOIUrl":"https://doi.org/10.1109/IVEC.2011.5747045","url":null,"abstract":"Life testing of M-Type dispenser cathodes was performed for 1000 hours to help quantify the performance enhancement due to different osmium-ruthenium (Os-Ru) thin film microstructures. Os-Ru film microstructures were selected based on their potential to inhibit tungsten/Os-Ru interdiffusion as identified in previous studies. The results show that the 10W substrate biased 150nm thick film yielded a very stable knee temperature throughout its life. However, the knee temperature was high in comparison to the standard Semicon film.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114886601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Development of high voltage pulser for High Power Electromagnetic (HPEM) simulation 大功率电磁仿真用高压脉冲发生器的研制
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2011-02-21 DOI: 10.1109/IVEC.2011.5746870
V. Bhosale, D. C. Pande
{"title":"Development of high voltage pulser for High Power Electromagnetic (HPEM) simulation","authors":"V. Bhosale, D. C. Pande","doi":"10.1109/IVEC.2011.5746870","DOIUrl":"https://doi.org/10.1109/IVEC.2011.5746870","url":null,"abstract":"In the present scenario, the pulse power technology plays a vital role in variety of applications ranging from industrial & medical fields to scientific & defence applications. One of the defensive applications is in the hardness assurance testing of the hardened mission critical defence electronics. Sophisticated mission critical defence electronics is highly susceptible to the transient Electromagnetic Environment (EME) of high intensity. Hence sufficient protection needs to be given to such critical defence electronics to withstand against the damaging & upsetting effects of High Power Electro Magnetics (HPEM). In order to validate the degree of protection provided, the hardened system(s) needs to be exposed to the simulated transient environment. This requires the development of a high voltage pulser with a very peculiar wave shape of the output impulse voltage. The challenges faced in realization & development of a typical 640 kV High Voltage pulser for one of the HPEM environment simulators are discussed in this paper.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115585813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design of interaction cavity for 170 GHz, 1 MW ITER gyrotron 170ghz, 1mw ITER回旋加速器相互作用腔设计
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2011-02-21 DOI: 10.1109/IVEC.2011.5746901
Anil Kumar, N. Kumar, H. Khatun, U. Singh, V. Vyas, A. Sinha
{"title":"Design of interaction cavity for 170 GHz, 1 MW ITER gyrotron","authors":"Anil Kumar, N. Kumar, H. Khatun, U. Singh, V. Vyas, A. Sinha","doi":"10.1109/IVEC.2011.5746901","DOIUrl":"https://doi.org/10.1109/IVEC.2011.5746901","url":null,"abstract":"In this paper the design of interaction cavity for 170GHz, 1MW gyrotron is presented. An in-house developed code GCOMS has been used for operating mode selection and mode competition. For 170 GHz, 1 MW gyrotron interaction cavity TE28,7 mode excite as a operating mode at the fundamental harmonic number. The Electromagnetic simulator-MAGIC, a Particle-in-Cell (PIC) code has been used for the cold cavity analysis and the beam-wave interaction. More than 1MW output power has been achieved at guiding cavity magnetic field 6.77 T.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"189 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122821307","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measurement of surface roughness effects on conductivity in the terahertz regime with a high-Q quasioptical resonator 用高q准光谐振器测量太赫兹区表面粗糙度对电导率的影响
2011 IEEE International Vacuum Electronics Conference (IVEC) Pub Date : 2011-02-21 DOI: 10.1109/IVEC.2011.5747018
Benjamin B. Yang, S. L. Katz, J. Booske
{"title":"Measurement of surface roughness effects on conductivity in the terahertz regime with a high-Q quasioptical resonator","authors":"Benjamin B. Yang, S. L. Katz, J. Booske","doi":"10.1109/IVEC.2011.5747018","DOIUrl":"https://doi.org/10.1109/IVEC.2011.5747018","url":null,"abstract":"A high-Q quasi-optical resonator is used to experimentally measure metal samples with controlled nano-scale textures at 400 GHz and 650 GHz. The results explore the effect of surface roughness on effective conductivity in the terahertz regime.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125109393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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