2010 IEEE International Conference on Software Maintenance最新文献_第8页

Using ontology fragments in concept location 在概念定位中使用本体片段

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-12 DOI: 10.1109/ICSM.2010.5609555

Leon A. Wilson

引用次数: 13

Using Relational Topic Models to capture coupling among classes in object-oriented software systems 使用关系主题模型捕获面向对象软件系统中类之间的耦合

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-12 DOI: 10.1109/ICSM.2010.5609687

Malcom Gethers, D. Poshyvanyk

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引用次数: 128

Theil index for aggregation of software metrics values 它们是软件度量值聚合的索引

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-12 DOI: 10.1109/ICSM.2010.5609637

Alexander Serebrenik, M. Brand

引用次数: 68

Automatic identification of class stereotypes 类原型的自动识别

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-12 DOI: 10.1109/ICSM.2010.5609703

Natalia Dragan, M. Collard, Jonathan I. Maletic

引用次数: 60

Assessment of product maintainability for two space domain simulators 两个空间域模拟器的产品可维护性评估

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-12 DOI: 10.1109/ICSM.2010.5609752

Tiago L. Alves

{"title":"Assessment of product maintainability for two space domain simulators","authors":"Tiago L. Alves","doi":"10.1109/ICSM.2010.5609752","DOIUrl":"https://doi.org/10.1109/ICSM.2010.5609752","url":null,"abstract":"The software life-cycle of applications supporting space missions follows a rigorous process in order to ensure the application compliance with all the specified requirements. Ensuring the correct behavior of the application is critical since an error can lead, ultimately, to the loss of a complete space mission. However, it is not only important to ensure the correct behavior of the application but also to achieve good product quality since the applications need to be maintained for several years. Then, the question arises, is a rigorous process enough to guarantee good product maintainability? In this paper we assess the software product maintainability of two simulators used to support space missions. The assessment is done using both a standardized analysis, using the SIG quality model for maintainability, and a customized copyright license analysis. The assessment results revealed several quality problems leading to three lessons. First, rigorous process requirements by themselves do not ensure product quality. Second, quality models can be used not only to pinpoint code problems but also to reveal team issues. Finally, tailored analyses, complementing quality models, are necessary for in-depth investigation of quality.","PeriodicalId":101801,"journal":{"name":"2010 IEEE International Conference on Software Maintenance","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128129089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Sampling program quality 抽样程序质量

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-12 DOI: 10.1109/ICSM.2010.5609671

Hongyu Zhang, Rongxin Wu

引用次数: 8

Supporting change propagation in UML models 支持UML模型中的变更传播

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-12 DOI: 10.1109/ICSM.2010.5609712

K. Dam, M. Winikoff

引用次数: 35

Improved size and effort estimation models for software maintenance 改进了软件维护的规模和工作量估计模型

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-12 DOI: 10.1109/ICSM.2010.5609554

Vu Nguyen

引用次数: 37

Comprehensive evaluation of association measures for fault localization 故障定位关联测度的综合评价

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-01 DOI: 10.1109/ICSM.2010.5609542

Lucia, D. Lo, Lingxiao Jiang, Aditya Budi

{"title":"Comprehensive evaluation of association measures for fault localization","authors":"Lucia, D. Lo, Lingxiao Jiang, Aditya Budi","doi":"10.1109/ICSM.2010.5609542","DOIUrl":"https://doi.org/10.1109/ICSM.2010.5609542","url":null,"abstract":"In statistics and data mining communities, there have been many measures proposed to gauge the strength of association between two variables of interest, such as odds ratio, confidence, Yule-Y, Yule-Q, Kappa, and gini index. These association measures have been used in various domains, for example, to evaluate whether a particular medical practice is associated positively to a cure of a disease or whether a particular marketing strategy is associated positively to an increase in revenue, etc. This paper models the problem of locating faults as association between the execution or non-execution of particular program elements with failures. There have been special measures, termed as suspiciousness measures, proposed for the task. Two state-of-the-art measures are Tarantula and Ochiai, which are different from many other statistical measures. To the best of our knowledge, there is no study that comprehensively investigates the effectiveness of various association measures in localizing faults. This paper fills in the gap by evaluating 20 well-known association measures and compares their effectiveness in fault localization tasks with Tarantula and Ochiai. Evaluation on the Siemens programs show that a number of association measures perform statistically comparable as Tarantula and Ochiai.","PeriodicalId":101801,"journal":{"name":"2010 IEEE International Conference on Software Maintenance","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122153725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 74

Deriving metric thresholds from benchmark data 从基准数据派生度量阈值

2010 IEEE International Conference on Software Maintenance Pub Date : 2010-09-01 DOI: 10.1109/ICSM.2010.5609747

Tiago L. Alves, Christiaan Ypma, Joost Visser

引用次数: 223