MetallographyPub Date : 1989-05-01DOI: 10.1016/0026-0800(89)90008-6
Donald C. Songer
{"title":"A new etchant for alloy 3004-H19 thin gauge sheet","authors":"Donald C. Songer","doi":"10.1016/0026-0800(89)90008-6","DOIUrl":"10.1016/0026-0800(89)90008-6","url":null,"abstract":"","PeriodicalId":100918,"journal":{"name":"Metallography","volume":"22 3","pages":"Pages 271-274"},"PeriodicalIF":0.0,"publicationDate":"1989-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0026-0800(89)90008-6","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78149109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetallographyPub Date : 1989-05-01DOI: 10.1016/0026-0800(89)90003-7
W. Prantl
{"title":"Indexing of planar defects from the relative change of the apparent width by computer","authors":"W. Prantl","doi":"10.1016/0026-0800(89)90003-7","DOIUrl":"10.1016/0026-0800(89)90003-7","url":null,"abstract":"<div><p>A method is discussed, which provides quick and unique indexing of a planar defect only from the relative change of its apparent width when the crystal is tilted in the goniometer stage of a transmission electron microscope. Two micrographs are necessary, showing different apparent widths of the defect and three diffraction patterns of arbitrary negative beam direction B, to index the foil normal and the goniometer axis II. Neither a calibration of the magnification nor the determination of the foil thickness is necessary, since the apparent widths may be supplied to the computer in arbitrary units. In addition to being of less experimental effort, this method also has accuracy that proves to be equal or better than that of other methods.</p></div>","PeriodicalId":100918,"journal":{"name":"Metallography","volume":"22 3","pages":"Pages 211-218"},"PeriodicalIF":0.0,"publicationDate":"1989-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0026-0800(89)90003-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79009892","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetallographyPub Date : 1989-05-01DOI: 10.1016/0026-0800(89)90001-3
Yee C. Lin, C.R. Brooks
{"title":"Microstructures of a Ni-9.6 at.% Ta-16.6 at.% Cr alloy after aging up to 1000 hours from 600 to 1,000°C","authors":"Yee C. Lin, C.R. Brooks","doi":"10.1016/0026-0800(89)90001-3","DOIUrl":"10.1016/0026-0800(89)90001-3","url":null,"abstract":"<div><p>The effects of aging of a Ni-rich Ni-Ta-Cr alloy on the microstructure (using optical and scanning electron microscopy) and hardness are presented. In the solution-annealed condition (1280°C, 4 h) the microstructure consisted of a face-centered cubic matrix and about 10% of a Ni<sub>3</sub>Ta type phase, which contained some Cr; the hardness was about 530 DPH. No change in the microstructure nor significant change in hardness occurred upon aging at 600°C for 1,000 h. Aging from 700 to 1000°C produced a significant decrease in hardness, to about 330 DPH after 1000 h. A lamellar product formed, usually initiating at the secondary particles present in the solution-annealed condition. At longer times and higher temperatures, a coarser lamellar product formed. The results of qualitative EDS analysis of the phases are reported.</p></div>","PeriodicalId":100918,"journal":{"name":"Metallography","volume":"22 3","pages":"Pages 177-197"},"PeriodicalIF":0.0,"publicationDate":"1989-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0026-0800(89)90001-3","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83117273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetallographyPub Date : 1989-05-01DOI: 10.1016/0026-0800(89)90009-8
S.A. Bashu, S.V. Reddy
{"title":"Preparation of elevated temperature fracture surfaces for SEM studies","authors":"S.A. Bashu, S.V. Reddy","doi":"10.1016/0026-0800(89)90009-8","DOIUrl":"10.1016/0026-0800(89)90009-8","url":null,"abstract":"","PeriodicalId":100918,"journal":{"name":"Metallography","volume":"22 3","pages":"Pages 275-282"},"PeriodicalIF":0.0,"publicationDate":"1989-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0026-0800(89)90009-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88817049","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetallographyPub Date : 1989-05-01DOI: 10.1016/0026-0800(89)90004-9
Stephen A. Court , Geoffrey Pollard
{"title":"Inclusion chemistry and morphology in shielded metal arc (SMA) steel weld deposits","authors":"Stephen A. Court , Geoffrey Pollard","doi":"10.1016/0026-0800(89)90004-9","DOIUrl":"10.1016/0026-0800(89)90004-9","url":null,"abstract":"<div><p>The composition and morphology, and the size and distribution of the nonmetallic inclusions found within a series of shielded metal arc (SMA), C-Mn steel weld deposits, produced using AWS E7016 type electrodes, have been investigated using transmission electron microscopy (TEM) and associated x-ray microanalysis techniques. The majority of the inclusions were ≈ 0.1 μm to ≈ 1.0 μm in diameter, and microanalysis generally showed them to be rich in Mn, Si, and Ti, with lower levels of Al, Cu, and S. Most of the inclusions were heterogeneous, often containing Mn- or Cu-rich sulphide globules embedded in their surfaces.</p><p>Inclusion composition could be related to that of the overall weld deposit, in a similar manner to that described previously for inclusion compositions and the flux type employed in submerged arc weld deposits. Specifically, the Ti content, Mn content, and the Mn/Si ratio of the inclusions could be related directly to that of the overall weld composition. Varying the basicity index (BI) of the electrode coating was found to have little effect on inclusion composition.</p><p>No correlation was found between inclusion size and composition, although large inclusions (say ≥4 μm in diameter) were generally found to have atypical compositions, often indicating the presence of significant levels of elements such as Al, K, Ca, and Na. A further precipitate or inclusion type was found to be a feature of all the welds examined, namely a distribution of fine copper sulphide particles (≤100 nm in diameter).</p><p>In addition, the observation of acicular ferrite nucleation events frequently showed them to be associated with the surface Mn- or Cu-rich inclusion globules of inclusions ≥0.2 μm in diameter.</p></div>","PeriodicalId":100918,"journal":{"name":"Metallography","volume":"22 3","pages":"Pages 219-243"},"PeriodicalIF":0.0,"publicationDate":"1989-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0026-0800(89)90004-9","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86197901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetallographyPub Date : 1989-05-01DOI: 10.1016/0026-0800(89)90005-0
J.D Verhoeven
{"title":"A method for measuring optical twin spacings in the superconducting material, YBa2Cu3Ox","authors":"J.D Verhoeven","doi":"10.1016/0026-0800(89)90005-0","DOIUrl":"10.1016/0026-0800(89)90005-0","url":null,"abstract":"<div><p>The optical twins in grains of the high temperature superconducting material, YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub>, lie along {110} planes, and the long boundaries of elongated grains are basal planes. Equations are presented utilizing these facts, which allow the apparent twin spacing to be converted to true twin spacing by measurement of the angles between twin sets and the basal plane boundary on the polish surface. The true thickness of the elongated grains in their <em>C</em> axis direction may also be determined from the analysis.</p></div>","PeriodicalId":100918,"journal":{"name":"Metallography","volume":"22 3","pages":"Pages 245-252"},"PeriodicalIF":0.0,"publicationDate":"1989-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0026-0800(89)90005-0","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83705772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MetallographyPub Date : 1989-01-01DOI: 10.1016/0026-0800(89)90020-7
M. Shamsuzzoha , L.M. Hogan
{"title":"Crystal morphology of massive eutectic silicon in unmodified Al-Si eutectic","authors":"M. Shamsuzzoha , L.M. Hogan","doi":"10.1016/0026-0800(89)90020-7","DOIUrl":"10.1016/0026-0800(89)90020-7","url":null,"abstract":"<div><p>We describe crystallographic observations of the silicon phase in massive eutectic crystallization of an aluminum-silicon alloy, formed by very slow directional growth under a steep temperature gradient. The silicon particles examined were twinned, and their growth crystallography conformed with two distinct mechanisms of TPRE crystal growth. Thus, the TPRE growth mechanism can play a significant part in massive eutectic growth in this system, but it is not assumed to be essential.</p></div>","PeriodicalId":100918,"journal":{"name":"Metallography","volume":"22 1","pages":"Pages 37-45"},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0026-0800(89)90020-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83014969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}