ATZelectronics worldwide最新文献

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20th International MTZ Conference on Future Powertrains 第20届国际MTZ未来动力总成会议
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2169-4
Marc Ziegler
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引用次数: 0
Enabling the Ramp-up of Electric Heavy-duty Fleets 推动电动重型车队的发展
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2153-z
Michele Del Mondo
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引用次数: 0
springerprofessional.com springerprofessional.com
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2163-x
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引用次数: 0
Validation of SDV Functions with Indoor Vehicle-in-the-Loop 室内车辆在环的SDV功能验证
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2145-z
Martin Wipfler, Henrik Liebau, Luca Hadler, Felix Pfister
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引用次数: 0
Framework for Analyzing Testing Efficiency 测试效率分析框架
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2134-2
Robert Fey
{"title":"Framework for Analyzing Testing Efficiency","authors":"Robert Fey","doi":"10.1007/s38314-026-2134-2","DOIUrl":"10.1007/s38314-026-2134-2","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"21 7-8","pages":"28 - 33"},"PeriodicalIF":0.0,"publicationDate":"2026-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148552859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Real-world Development in a Virtual Environment 虚拟环境中的真实世界开发
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2165-8
Alexander Heintzel
{"title":"Real-world Development in a Virtual Environment","authors":"Alexander Heintzel","doi":"10.1007/s38314-026-2165-8","DOIUrl":"10.1007/s38314-026-2165-8","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"21 7-8","pages":"14 - 15"},"PeriodicalIF":0.0,"publicationDate":"2026-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148552955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Soft Active Short-circuit Strategies for Inverters 逆变器软有源短路策略
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2150-2
Nima Saadat, Syed Abdul Hafeez, Vivek Tailor, Johannes Rauhut
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引用次数: 0
Tolerance Compensation in Board-to-Board Connections 板对板连接中的公差补偿
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2146-y
Vinay Shettar, Jiang Ming
{"title":"Tolerance Compensation in Board-to-Board Connections","authors":"Vinay Shettar, Jiang Ming","doi":"10.1007/s38314-026-2146-y","DOIUrl":"10.1007/s38314-026-2146-y","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"21 7-8","pages":"66 - 69"},"PeriodicalIF":0.0,"publicationDate":"2026-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148552958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Making AI Indirectly Testable 让AI间接可测试
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2152-0
Ricardo Camacho
{"title":"Making AI Indirectly Testable","authors":"Ricardo Camacho","doi":"10.1007/s38314-026-2152-0","DOIUrl":"10.1007/s38314-026-2152-0","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"21 7-8","pages":"80 - 80"},"PeriodicalIF":0.0,"publicationDate":"2026-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148552974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PCB-based Diagnostics for Reliable Vehicle Systems 基于pcb的可靠车辆系统诊断
ATZelectronics worldwide Pub Date : 2026-07-24 DOI: 10.1007/s38314-026-2147-x
Arnaud Wendling
{"title":"PCB-based Diagnostics for Reliable Vehicle Systems","authors":"Arnaud Wendling","doi":"10.1007/s38314-026-2147-x","DOIUrl":"10.1007/s38314-026-2147-x","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"21 7-8","pages":"60 - 65"},"PeriodicalIF":0.0,"publicationDate":"2026-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148552957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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