ATZelectronics worldwide最新文献

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Thoroughly Examining Applications 彻底审查申请
ATZelectronics worldwide Pub Date : 2025-05-02 DOI: 10.1007/s38314-025-2001-6
Alexander Heintzel
{"title":"Thoroughly Examining Applications","authors":"Alexander Heintzel","doi":"10.1007/s38314-025-2001-6","DOIUrl":"10.1007/s38314-025-2001-6","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 5","pages":"6 - 7"},"PeriodicalIF":0.0,"publicationDate":"2025-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s38314-025-2001-6.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143896666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On Automotive Electronics 汽车电子
ATZelectronics worldwide Pub Date : 2025-05-02 DOI: 10.1007/s38314-025-1998-x
Paul Hansen
{"title":"On Automotive Electronics","authors":"Paul Hansen","doi":"10.1007/s38314-025-1998-x","DOIUrl":"10.1007/s38314-025-1998-x","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 5","pages":"26 - 29"},"PeriodicalIF":0.0,"publicationDate":"2025-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143896669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulating Battery Aging Through Customized Models 通过定制模型模拟电池老化
ATZelectronics worldwide Pub Date : 2025-05-02 DOI: 10.1007/s38314-025-1996-z
Mohammadali Mirsalehian, Rüdiger Beykirch, Matthias Rudolph
{"title":"Simulating Battery Aging Through Customized Models","authors":"Mohammadali Mirsalehian, Rüdiger Beykirch, Matthias Rudolph","doi":"10.1007/s38314-025-1996-z","DOIUrl":"10.1007/s38314-025-1996-z","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 5","pages":"18 - 24"},"PeriodicalIF":0.0,"publicationDate":"2025-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143896626","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ensuring Steering Accuracy with Next-generation EMC-robust Hall Sensors 确保转向精度与下一代电磁稳健霍尔传感器
ATZelectronics worldwide Pub Date : 2025-05-02 DOI: 10.1007/s38314-025-1979-0
Michael Delbaere, Antoine Delaporte
{"title":"Ensuring Steering Accuracy with Next-generation EMC-robust Hall Sensors","authors":"Michael Delbaere, Antoine Delaporte","doi":"10.1007/s38314-025-1979-0","DOIUrl":"10.1007/s38314-025-1979-0","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 5","pages":"46 - 49"},"PeriodicalIF":0.0,"publicationDate":"2025-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143896631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
springerprofessional.com springerprofessional.com
ATZelectronics worldwide Pub Date : 2025-04-04 DOI: 10.1007/s38314-025-1987-0
{"title":"springerprofessional.com","authors":"","doi":"10.1007/s38314-025-1987-0","DOIUrl":"10.1007/s38314-025-1987-0","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 3-4","pages":"36 - 37"},"PeriodicalIF":0.0,"publicationDate":"2025-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143769657","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On Automotive Electronics 汽车电子
ATZelectronics worldwide Pub Date : 2025-04-04 DOI: 10.1007/s38314-025-1993-2
Paul Hansen
{"title":"On Automotive Electronics","authors":"Paul Hansen","doi":"10.1007/s38314-025-1993-2","DOIUrl":"10.1007/s38314-025-1993-2","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 3-4","pages":"32 - 35"},"PeriodicalIF":0.0,"publicationDate":"2025-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143769656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Hansen Report 汉森报告
ATZelectronics worldwide Pub Date : 2025-04-04 DOI: 10.1007/s38314-025-1992-3
Paul Hansen
{"title":"The Hansen Report","authors":"Paul Hansen","doi":"10.1007/s38314-025-1992-3","DOIUrl":"10.1007/s38314-025-1992-3","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 3-4","pages":"31 - 31"},"PeriodicalIF":0.0,"publicationDate":"2025-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143769672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
“Significant action is required in Germany” “德国需要采取重大行动”
ATZelectronics worldwide Pub Date : 2025-04-04 DOI: 10.1007/s38314-025-1984-3
Robert Unseld
{"title":"“Significant action is required in Germany”","authors":"Robert Unseld","doi":"10.1007/s38314-025-1984-3","DOIUrl":"10.1007/s38314-025-1984-3","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 3-4","pages":"14 - 17"},"PeriodicalIF":0.0,"publicationDate":"2025-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143769785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
It's High Time to Evaluate 6G 是时候评估6G了
ATZelectronics worldwide Pub Date : 2025-04-04 DOI: 10.1007/s38314-025-1983-4
Bernhard Niemann
{"title":"It's High Time to Evaluate 6G","authors":"Bernhard Niemann","doi":"10.1007/s38314-025-1983-4","DOIUrl":"10.1007/s38314-025-1983-4","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 3-4","pages":"52 - 52"},"PeriodicalIF":0.0,"publicationDate":"2025-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143769660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Developments in Automated and Bidirectional Charging 自动化和双向收费的发展
ATZelectronics worldwide Pub Date : 2025-04-04 DOI: 10.1007/s38314-025-1982-5
Richard Backhaus
{"title":"Developments in Automated and Bidirectional Charging","authors":"Richard Backhaus","doi":"10.1007/s38314-025-1982-5","DOIUrl":"10.1007/s38314-025-1982-5","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 3-4","pages":"42 - 47"},"PeriodicalIF":0.0,"publicationDate":"2025-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143769659","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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