2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)最新文献

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Accelerating Cyclic Loading 加速循环加载
H. Seigneur, Jason Lincoln, E. Schneller, A. Gabor
{"title":"Accelerating Cyclic Loading","authors":"H. Seigneur, Jason Lincoln, E. Schneller, A. Gabor","doi":"10.1109/PVSC.2018.8547310","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547310","url":null,"abstract":"In this work, we performed four variations of cyclic load testing on four groups of modules using the LoadSpot tool. Each group first underwent 50 thermal cycles (TC50), 10 humidity-freeze cycles (HF10), and a 2400 Pa static load. Then, the baseline group was tested using standard cyclic loading conditions from IEC 62782, another with double the loading frequency, one with larger loading magnitude, and one with smaller loading magnitude and quadruple the loading frequency. Interestingly, we found that increasing the loading frequency actually reduces maximum power degradation with respect to the baseline, whereas increasing or decreasing the load amplitude respectively increases or decreases maximum power degradation with respect to the baseline. In order to confirm the results, we conducted another experiment with a new group using modules of a different make and model. This group did not undergo TC50 nor HF 10, only a 5400Pa static load to create cracks. For this group, the maximum power degradation did not show a dependence on the loading frequency during cyclic loading. We offer a possible explanation for this unexpected result associated with increasing the loading frequency.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"38 1","pages":"1328-1332"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79619555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Mapping carrier lifetime variations in polycrystalline CdTe thin films using confocal microscopy 利用共聚焦显微镜绘制多晶CdTe薄膜中载流子寿命的变化
S. Misra, D. Pruzan, Lauren R. Richey-Simonsen, Maoji Wang, V. Palekis, J. Aguiar, J. Gerton, C. Ferekides, M. Scarpulla
{"title":"Mapping carrier lifetime variations in polycrystalline CdTe thin films using confocal microscopy","authors":"S. Misra, D. Pruzan, Lauren R. Richey-Simonsen, Maoji Wang, V. Palekis, J. Aguiar, J. Gerton, C. Ferekides, M. Scarpulla","doi":"10.1109/PVSC.2018.8548004","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8548004","url":null,"abstract":"We discuss the optoelectronic property variation between grains and grain boundaries of CdTe polycrystalline thin films using a confocal microscopy system. Single-photon photoluminescence (PL) and time-resolved photoluminescence spectroscopy (PL) is used to map $10 times 10 mu mathrm {m}^{2}$ area at the back surface of CdTe with an optical resolution of 104 nm. TRPL maps show that different grain boundaries have different near-surface lifetimes. Surprisingly, grain-boundaries with high near-surface lifetime are associated with regions of the sample that have low PL yield. This study demonstrates the potential of confocal PL and TRPL mapping to understand carrier lifetime variations in thin films.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"25 1","pages":"1925-1927"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81045405","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Nanocrystalline silicon oxide interlayer in monolithic perovskite/silicon heterojunction tandem solar cells with total current density >39 mA/cm2 总电流密度>39 mA/cm2的单片钙钛矿/硅异质结串联太阳能电池中的纳米晶氧化硅中间层
B. Stannowski, L. Mazzarella, Yen‐Hung Lin, Simon Kirner, A. Morales-Vilches, L. Korte, S. Albrecht, Edward J. W. Crossland, C. Case, H. Snaith, R. Schlatmann
{"title":"Nanocrystalline silicon oxide interlayer in monolithic perovskite/silicon heterojunction tandem solar cells with total current density >39 mA/cm2","authors":"B. Stannowski, L. Mazzarella, Yen‐Hung Lin, Simon Kirner, A. Morales-Vilches, L. Korte, S. Albrecht, Edward J. W. Crossland, C. Case, H. Snaith, R. Schlatmann","doi":"10.1109/PVSC.2018.8547825","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547825","url":null,"abstract":"Silicon heterojunction solar cells are implemented as bottom cells in monolithic perovskite/silicon tandem solar cells. Commonly they are processed with a smooth front side to facilitate wet processing of the lead-halide perovskite cell on top. The inherent drawback of this design, namely, enhanced reflection of the cell, can be significantly reduced by replacing the amorphous or nanocrystalline silicon front side n layer of the silicon cell by a nanocrystalline silicon oxide n layer. It is deposited with the same commonly used plasma-enhanced chemical vapor deposition and can be tuned to feature opto-electrical properties for enhanced light coupling into the Si bottom cell, namely, low parasitic absorption and an intermediate refractive index of $sim 2.6$. We demonstrate that a 80 – 100 nm thick layer results in 0.9 mA/cm2 current gain in the bottom cell yielding tandem cells with a top cell + bottom cell total current above 39 mA/cm2. These first nc-SiOx:H-coupled tandem cells reach an efficiency >23.5 %.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"7 1","pages":"2627-2630"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84692875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Effective I-V Measurement Techniques for Busbarless and MultiBusbar Solar cells 无母线和多母线太阳能电池的有效I-V测量技术
Samuel Raj, J. Wong, S. Ramprasad, Precis Teena, A. Khanna, Vinodh Shanmugam, J. Ho, A. Aberle, T. Mueller
{"title":"Effective I-V Measurement Techniques for Busbarless and MultiBusbar Solar cells","authors":"Samuel Raj, J. Wong, S. Ramprasad, Precis Teena, A. Khanna, Vinodh Shanmugam, J. Ho, A. Aberle, T. Mueller","doi":"10.1109/PVSC.2018.8547980","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547980","url":null,"abstract":"Conventional I-V testing of solar cells involves probe bars with voltage sense points and current sourcing points on the cell’s front busbars. However, this approach is not suitable for busbarless solar cells and multi-busbar (example: 12 to 18 narrow busbars) solar cells. This work introduces three measurement probe configurations for the I-V testing of busbarless and multibusbar solar cells: 1) probe bars that consist of a dense array of dipole testprobes for precise four-wire measurement; 2) staggered ring-type alternating source and sense contacts; 3) thin $200 mu mathrm{m}$ probe bars with contact points with negligible shading loss.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"55 1","pages":"3294-3297"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77260517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study on failure models and degradation rate of PV aged modules in field in China 国内现场光伏老化组件失效模式及退化率研究
Hailing Li, Fang Lv
{"title":"Study on failure models and degradation rate of PV aged modules in field in China","authors":"Hailing Li, Fang Lv","doi":"10.1109/PVSC.2018.8547795","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547795","url":null,"abstract":"This paper presents the analysis of degradation rate and fail models of PV crystalline silicon modules operated 1030 years from 5 plants 4 climatic zones in China. The PV modules wereused as off-grid home system, roof on-grid system, and ground on-grid system. The 4 climatic zones cover most of PV market in china. By visual inspection study we find that the highest frequency of failure model found here is metallization and interconnect corrosion. The average degradation rate of the tested modules is 0.73%/year. No clear correlation between degradation rate and climatic zone is found.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"11 1","pages":"727-730"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83631509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Long Term Testing over 6 Years on Crystalline Silicon Solar Modules with Snail Trails 长期测试超过6年的晶体硅太阳能组件与蜗牛径
W. He, Jin Yang, Liang Lei, Chuanke Chen, Hong Yang, He Wang, Mingchang Ding, Shuangqing Zhang
{"title":"Long Term Testing over 6 Years on Crystalline Silicon Solar Modules with Snail Trails","authors":"W. He, Jin Yang, Liang Lei, Chuanke Chen, Hong Yang, He Wang, Mingchang Ding, Shuangqing Zhang","doi":"10.1109/PVSC.2018.8547896","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547896","url":null,"abstract":"In this paper, the influence of the snail trails on the performance and long-term reliability of solar modules were investigated in detail by six years of tracking test of 4 solar modules with snail trails. The results show that the snail trails have no obvious expansion over the six years. And the average power degradation of the snail trails was 0.6% per year, which is in the normal range. These results indicated that the snail trail is only an appearance defect, which has no obvious negative effect on the electrical performance of solar modules.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"61 1","pages":"0700-0704"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88488316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Synchronization of Solar Stand-alone Devices and Autonomous Energy Management through Solar Time Measurements 通过太阳时间测量实现太阳能单机设备同步和自主能源管理
A. Adrián Santamaría Lancia, Nicholas Riedel, Rasmus Overgaard Ploug, Sune Thorsteinsson, P. Poulsen, A. Gisele dos Reis Benatto
{"title":"Synchronization of Solar Stand-alone Devices and Autonomous Energy Management through Solar Time Measurements","authors":"A. Adrián Santamaría Lancia, Nicholas Riedel, Rasmus Overgaard Ploug, Sune Thorsteinsson, P. Poulsen, A. Gisele dos Reis Benatto","doi":"10.1109/PVSC.2018.8548183","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8548183","url":null,"abstract":"This works present a method for synchronization of a solar device to real solar time for event triggering and energy management. Specifications require the devices to be off-grid and self-adjusting. Measurements of daylight duration were performed using one test device over the course of several months in Denmark. Analysis of viability over the accuracy of solar time determination and potential for self-adjusting energy management was carried out. Measurement results allowed for the development of an algorithm with good potential for performing the required tasks. Influence of variations in weather and different shadowing conditions were tested in two prototype devices. Results show a good potential for estimation of solar time and daily synchronization between devices within less than 5 minutes error.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"27 1","pages":"0632-0637"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90721764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Toward Higher Efficiency of Low-Cost Flexible Single-Crystal-Like GaAs Thin Film Solar Cells on Metal Tapes 金属带上低成本柔性单晶类砷化镓薄膜太阳能电池的研究
S. Pouladi, M. Rathi, P. Dutta, S. Oh, D. Khatiwada, Yao Yao, Ying Gao, Sicong Sun, Yongkuan Li, M. Asadirad, Shahab Shervin, Jie Chen, V. Selvamanickam, J. Ryou
{"title":"Toward Higher Efficiency of Low-Cost Flexible Single-Crystal-Like GaAs Thin Film Solar Cells on Metal Tapes","authors":"S. Pouladi, M. Rathi, P. Dutta, S. Oh, D. Khatiwada, Yao Yao, Ying Gao, Sicong Sun, Yongkuan Li, M. Asadirad, Shahab Shervin, Jie Chen, V. Selvamanickam, J. Ryou","doi":"10.1109/PVSC.2018.8548010","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8548010","url":null,"abstract":"III-V compound semiconductors are the best photovoltaic solar cell (SC) materials for highest conversion efficiencies. However, they are expensive and lack in mechanical flexibility and manufacturing scalability. We developed a new PV platform where nearly single-crystalline III-V thin films were directly deposited on inexpensive polycrystalline metal tapes. While a promising efficiency of ~7.5% was achieved for flexible single junction SCs on this platform, the open circuit voltage of SC suffers from minority carrier recombination at grainboundary sites according to a simulation study. A bulk passivation treatment is conducted on the SC devices which resulted in more than 350mV increase for Voc.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"27 1","pages":"0237-0239"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91079402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Diversified Applications of UV-Ozone Oxide: Effective Surface Clean and High-Quality Passivation uv -臭氧氧化物的多样化应用:有效的表面清洁和高品质的钝化
S. Bakhshi, N. Zin, Marshall Wilson, I. Kashkoush, K. Davis, W. Schoenfeld
{"title":"Diversified Applications of UV-Ozone Oxide: Effective Surface Clean and High-Quality Passivation","authors":"S. Bakhshi, N. Zin, Marshall Wilson, I. Kashkoush, K. Davis, W. Schoenfeld","doi":"10.1109/PVSC.2018.8548304","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8548304","url":null,"abstract":"It is long recognized that the effective surface clean is critical for the increased performance of solar cell and semiconductor devices. In this contribution, we introduced the effectiveness of crystalline silicon surface clean by a simple ultraviolet-ozone (UVo) process by comparing it against the industry standard RCA and UV assisted deionized water (DiO3) techniques. Despite being simple, UV-ozone cleaning results in an effective surface passivation quality that is comparable to both RCA and DiO3 clean, i.e., saturation current density (J0) of 7 fA/cm2 compared to 5 fA/cm2 and 8 fA/cm2. In addition to the surface clean, we presented that both UVo and DiO3 oxides can be used as a highly-quality chemical passivation to the crystalline silicon substrate, but with UVo oxide offering an improved passivation than DiO3 oxide. Incorporating the UV}o oxide in between the interface of silicon and aluminum oxide or silicon nitride reduces J0 by $gt 50$%, compared to the interface without the UVo oxide.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"1 1","pages":"3065-3068"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89561212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Reactive Silver Ink as a Novel Low-Temperature Metallization: Monitoring Corrosion 反应银油墨作为一种新型低温金属化:监测腐蚀
A. Jeffries, M. Bertoni
{"title":"Reactive Silver Ink as a Novel Low-Temperature Metallization: Monitoring Corrosion","authors":"A. Jeffries, M. Bertoni","doi":"10.1109/PVSC.2018.8548247","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8548247","url":null,"abstract":"Reactive silver ink (RSI) forms low-resistivity (<5μΩ.cm) metallization at temperatures below 100 °C-enabling lower resistive losses for thermally sensitive solar cells while drastically reducing Ag usage compared to other low-temperature Ag pastes. However, before adoption of the technology many reliability related questions must be addressed. Ag-based metallizations are susceptible to corrosion by acetic acid formed in encapsulated modules, resulting in increased resistive losses. Here we report on corrosion of three types of metallizations; high-firing-temperature Ag paste (HT Ag Paste), low-temperature Ag paste (LT Ag Paste), and RSI. We develop a method for exposing these metallizations to dilute acetic acid in concentrations comparable to those found in field- and damp heat-exposed modules. We find that HT Ag and RSI are quickly affected by acetic acid exposure after only 24 h. Interestingly, Raman spectroscopy suggests the formation of AgCl or AgCH3COO on HT Ag Paste, dissolution of AgCH3COO from RSI, and LT Ag Paste remains relatively unchanged throughout 2936 h of exposure to diluted acetic acid.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"199 1","pages":"1013-1017"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90818547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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