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Mechanically Flexible Nonvolatile Field Effect Transistor Memories with Ferroelectric Polymers 铁电聚合物机械柔性非易失性场效应晶体管存储器
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-981-15-1212-4_13
R. H. Kim, Cheolmin Park
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引用次数: 0
Scanning Small-Angle X-ray Scattering and Coherent X-ray Imaging of Cells 扫描小角度x射线散射和细胞相干x射线成像
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-3-030-34413-9_15
T. Salditt, S. Köster
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引用次数: 1
Oxide-Channel Ferroelectric-Gate Thin-Film Transistors with Nonvolatile Memory Function 具有非易失性记忆功能的氧化沟道铁电栅薄膜晶体管
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-981-15-1212-4_6
E. Tokumitsu
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引用次数: 0
Efficient, Quantitative Numerical Methods for Statistical Image Deconvolution and Denoising 统计图像去卷积和去噪的高效定量数值方法
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-3-030-34413-9_12
D. R. Luke, C. Charitha, Ron Shefi, Yura Malitsky
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引用次数: 1
Holographic Imaging and Tomography of Biological Cells and Tissues 生物细胞和组织的全息成像和断层扫描
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-3-030-34413-9_13
T. Salditt, M. Töpperwien
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引用次数: 1
Wavefront and Coherence Characteristics of Extreme UV and Soft X-ray Sources 极紫外和软x射线源的波前和相干特性
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-3-030-34413-9_20
B. Schäfer, B. Flöter, T. Mey, K. Mann
{"title":"Wavefront and Coherence Characteristics of Extreme UV and Soft X-ray Sources","authors":"B. Schäfer, B. Flöter, T. Mey, K. Mann","doi":"10.1007/978-3-030-34413-9_20","DOIUrl":"https://doi.org/10.1007/978-3-030-34413-9_20","url":null,"abstract":"","PeriodicalId":54426,"journal":{"name":"Topics in Applied Physics","volume":"52 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"50962448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Laboratory-Scale Soft X-ray Source for Microscopy and Absorption Spectroscopy 用于显微镜和吸收光谱学的实验室规模软x射线源
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-3-030-34413-9_21
M. Müller, K. Mann
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引用次数: 1
STED Nanoscopy STED Nanoscopy
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-3-030-34413-9_1
A. Egner, C. Geisler, R. Siegmund
{"title":"STED Nanoscopy","authors":"A. Egner, C. Geisler, R. Siegmund","doi":"10.1007/978-3-030-34413-9_1","DOIUrl":"https://doi.org/10.1007/978-3-030-34413-9_1","url":null,"abstract":"","PeriodicalId":54426,"journal":{"name":"Topics in Applied Physics","volume":"46 5","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"50962669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Novel Application of FeFETs to NAND Flash Memory Circuits 效应场效应效应在NAND闪存电路中的新应用
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-94-024-0841-6_13
S. Sakai, Mitsue Takahashi
{"title":"Novel Application of FeFETs to NAND Flash Memory Circuits","authors":"S. Sakai, Mitsue Takahashi","doi":"10.1007/978-94-024-0841-6_13","DOIUrl":"https://doi.org/10.1007/978-94-024-0841-6_13","url":null,"abstract":"","PeriodicalId":54426,"journal":{"name":"Topics in Applied Physics","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/978-94-024-0841-6_13","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"51059323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Ferroelectric-Gate Field Effect Transistor Memories 铁电门场效应晶体管存储器
4区 物理与天体物理
Topics in Applied Physics Pub Date : 2020-01-01 DOI: 10.1007/978-94-024-0841-6
Byung-Eun Park, H. Ishiwara, M. Okuyama, S. Sakai, Sung‐Min Yoon
{"title":"Ferroelectric-Gate Field Effect Transistor Memories","authors":"Byung-Eun Park, H. Ishiwara, M. Okuyama, S. Sakai, Sung‐Min Yoon","doi":"10.1007/978-94-024-0841-6","DOIUrl":"https://doi.org/10.1007/978-94-024-0841-6","url":null,"abstract":"","PeriodicalId":54426,"journal":{"name":"Topics in Applied Physics","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/978-94-024-0841-6","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"51059517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 61
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