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Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision 基于双预测器协同决策的晶圆级自适应测试
Journal of Electronic Testing Pub Date : 2024-07-16 DOI: 10.1007/s10836-024-06125-7
Yuqi Pan, Huaguo Liang, Junming Li, Jinxing Qu, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu
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引用次数: 0
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs 支持 RTL 设计逼近的时态断言语法和语义分析
Journal of Electronic Testing Pub Date : 2024-04-23 DOI: 10.1007/s10836-024-06115-9
Alberto Bosio, Samuele Germiniani, G. Pravadelli, Marcello Traiola
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引用次数: 0
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