发布求助
文献互助 智能选刊 最新文献

Science in China. Series E, Technological Sciences最新文献

筛选
英文 中文
Disturbance decoupling robust control of vehicle full speed cruise dynamic system 车辆全速巡航动力系统的扰动解耦鲁棒控制
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0285-Z
Y. Bin, Keqiang Li, Nenglian Feng
{"title":"Disturbance decoupling robust control of vehicle full speed cruise dynamic system","authors":"Y. Bin, Keqiang Li, Nenglian Feng","doi":"10.1007/S11431-009-0285-Z","DOIUrl":"https://doi.org/10.1007/S11431-009-0285-Z","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"42 1","pages":"3545-3564"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78999228","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Simulation of three-dimensional nonideal MHD flow at low magnetic Reynolds number 低磁雷诺数下三维非理想MHD流动模拟
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0263-5
Haoyu Lu, Chunhian Lee
{"title":"Simulation of three-dimensional nonideal MHD flow at low magnetic Reynolds number","authors":"Haoyu Lu, Chunhian Lee","doi":"10.1007/S11431-009-0263-5","DOIUrl":"https://doi.org/10.1007/S11431-009-0263-5","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"1 1","pages":"3690-3697"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88141636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Pattern recognition of typical defects in high-voltage storage capacitors based on DC partial discharge 基于直流局部放电的高压存储电容器典型缺陷模式识别
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0380-1
Guangning Wu, Shanshan Bian, Liren Zhou, Xueqin Zhang, Hanzheng Ran, Chenglong Yu
{"title":"Pattern recognition of typical defects in high-voltage storage capacitors based on DC partial discharge","authors":"Guangning Wu, Shanshan Bian, Liren Zhou, Xueqin Zhang, Hanzheng Ran, Chenglong Yu","doi":"10.1007/S11431-009-0380-1","DOIUrl":"https://doi.org/10.1007/S11431-009-0380-1","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"23 1","pages":"3729-3735"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78189017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Stitching algorithm for ion beam figuring of optical mirrors 光学反射镜离子束计算的拼接算法
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0309-8
Shengyi Li, Changjun Jiao, Xuhui Xie, Lin Zhou
{"title":"Stitching algorithm for ion beam figuring of optical mirrors","authors":"Shengyi Li, Changjun Jiao, Xuhui Xie, Lin Zhou","doi":"10.1007/S11431-009-0309-8","DOIUrl":"https://doi.org/10.1007/S11431-009-0309-8","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"143 4","pages":"3580-3586"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72596601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Control of endwall secondary flow in a compressor cascade with dielectric barrier discharge plasma actuation 介质阻挡放电等离子体驱动压缩机叶栅端壁二次流控制
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0187-0
Gang Li, Yanji Xu, Bin Lin, Junqiang Zhu, Chaoqun Nie, Hongwei Ma, Zhaofeng Wang
{"title":"Control of endwall secondary flow in a compressor cascade with dielectric barrier discharge plasma actuation","authors":"Gang Li, Yanji Xu, Bin Lin, Junqiang Zhu, Chaoqun Nie, Hongwei Ma, Zhaofeng Wang","doi":"10.1007/S11431-009-0187-0","DOIUrl":"https://doi.org/10.1007/S11431-009-0187-0","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"14 1","pages":"3715-3721"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78254993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
An efficient method for identification of risk factors 一种识别危险因素的有效方法
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0383-Y
Jin Cheng, R. Xiao
{"title":"An efficient method for identification of risk factors","authors":"Jin Cheng, R. Xiao","doi":"10.1007/S11431-009-0383-Y","DOIUrl":"https://doi.org/10.1007/S11431-009-0383-Y","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"3 1","pages":"3626-3631"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77649055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Comparison of energy structure and spectral properties of Ce:LaAlO3 and Ce:Lu2(SiO4)O Ce:LaAlO3和Ce:Lu2(SiO4)O的能量结构和光谱性质比较
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0377-9
Xiaodan Wang, T. Pan, Tao Zang, Jiankang Li, Zhiwei Zhao, Lianhang Zhang, J. Xu
{"title":"Comparison of energy structure and spectral properties of Ce:LaAlO3 and Ce:Lu2(SiO4)O","authors":"Xiaodan Wang, T. Pan, Tao Zang, Jiankang Li, Zhiwei Zhao, Lianhang Zhang, J. Xu","doi":"10.1007/S11431-009-0377-9","DOIUrl":"https://doi.org/10.1007/S11431-009-0377-9","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"89 1 1","pages":"3678-3682"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82791734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Applications of electrohydrodynamics and Joule heating effects in microfluidic chips: A review 电流体力学和焦耳热效应在微流控芯片中的应用综述
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0313-Z
Jun Cao, P. Cheng, F. Hong
{"title":"Applications of electrohydrodynamics and Joule heating effects in microfluidic chips: A review","authors":"Jun Cao, P. Cheng, F. Hong","doi":"10.1007/S11431-009-0313-Z","DOIUrl":"https://doi.org/10.1007/S11431-009-0313-Z","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"27 1","pages":"3477-3490"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82065244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Modal identification of system driven by lévy random excitation based on continuous time AR model 基于连续时间AR模型的<s:1>随机激励驱动系统模态辨识
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0269-Z
Xiuli Du, Feng-quan Wang
{"title":"Modal identification of system driven by lévy random excitation based on continuous time AR model","authors":"Xiuli Du, Feng-quan Wang","doi":"10.1007/S11431-009-0269-Z","DOIUrl":"https://doi.org/10.1007/S11431-009-0269-Z","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"18 1","pages":"3649-3653"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73271383","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Super-resolution reconstruction and higher-degree function deformation model based matching for Chang’E-1 lunar images 基于超分辨率重构和高次函数变形模型的嫦娥一号月球图像匹配
Science in China. Series E, Technological Sciences Pub Date : 2009-12-18 DOI: 10.1007/S11431-009-0334-7
Lichun Li, Qifeng Yu, Yun Yuan, Y. Shang, Hongwei Lu, Xiangyi Sun
{"title":"Super-resolution reconstruction and higher-degree function deformation model based matching for Chang’E-1 lunar images","authors":"Lichun Li, Qifeng Yu, Yun Yuan, Y. Shang, Hongwei Lu, Xiangyi Sun","doi":"10.1007/S11431-009-0334-7","DOIUrl":"https://doi.org/10.1007/S11431-009-0334-7","url":null,"abstract":"","PeriodicalId":49125,"journal":{"name":"Science in China. Series E, Technological Sciences","volume":"217 1","pages":"3468-3476"},"PeriodicalIF":0.0,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79694294","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信