{"title":"IMPATT Diodes Based on GaAs for Millimeter Wave Applications with Reference to Si","authors":"J. Pradhan, S. R. Pattanaik","doi":"10.5772/INTECHOPEN.95874","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.95874","url":null,"abstract":"The small signal characteristics of DDR IMPATTs based on GaAs designed to operate at mm-wave window frequencies such as 94, 140, and 220 GHz are presented in this chapter. Both the DC and Small signal performance of the above-mentioned devices are investigated by using a small signal simulation technique developed by the authors. The efficiency, output power and power density of GaAs IMPATT is higher than that of Si IMPATT. Results show that the DDR IMPATTs based on GaAs are most suitable for generation of RF power with maximum conversion efficiency up to 220 GHz. The noise behavior of GaAs IMPATT yield less noise as compared to Si IMPATT.","PeriodicalId":446707,"journal":{"name":"Post-Transition Metals","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114746563","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Radionov Boris Konstantinovich, Svirsky Ilya Anatolievich
{"title":"Features of the Ionic State of Indium in Perchlorate Solutions and the Physicochemical Properties of Indium Perchlorate","authors":"Radionov Boris Konstantinovich, Svirsky Ilya Anatolievich","doi":"10.5772/intechopen.94258","DOIUrl":"https://doi.org/10.5772/intechopen.94258","url":null,"abstract":"The possibility of the formation of India perchlorate and mixed ligand complexes has been studied. It is assumed that during the extraction of indium in aqueous solutions of hydrochloric acid at various concentrations and constant ionic strength maintained by the addition of perchloric acid, indium is present in the organic phase in the form of ionic aggregates HClO4 · HInCl4. To study the hydration of Ions, the method of electrical conductivity was carried out in the “In(ClO4)3 - HClO4 - H2O” system. The structure of aqueous solutions of India perchlorates was determined by IR spectroscopy. The structures of trivalent perchlorate India have been established.","PeriodicalId":446707,"journal":{"name":"Post-Transition Metals","volume":"144 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-12-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131985763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Comparative Analysis Carried Out on Modern Indentation Techniques for the Measurement of Mechanical Properties: A Review","authors":"Saquib Rouf, S. Altaf, S. Malik, K. Najar","doi":"10.5772/intechopen.94224","DOIUrl":"https://doi.org/10.5772/intechopen.94224","url":null,"abstract":"Nowadays many indentation techniques are being commonly employed for determining some mechanical properties (harness, elastic modulus, toughness, etc.) using simple method of measuring the indentation depth. On the basis of measurement of depth of penetration, indentation technique has be classified into major categories i.e. microindentation and nanoindentation. Nanoindentation technique uses indirect method of determining the contact area as the depth of penetration is measured in nanometers, while in conventional indentation the area in contact is measured by elementary measurement of the residual area after the indenter is removed from the specimen. Dynamic hardness is the best result of dynamic indentation which can be expressed as the ratio of energy consumed during a rapid indentation to the volume of indentation. The parameter which are taken into consideration are indentation depth, contact force, contact area, mean contact pressure.","PeriodicalId":446707,"journal":{"name":"Post-Transition Metals","volume":"161 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114635669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Investigation of Indium Oxide Effect on Indium Particles Properties Used as Silicon Nanowires Catalyst","authors":"R. Zaghouani","doi":"10.5772/intechopen.93648","DOIUrl":"https://doi.org/10.5772/intechopen.93648","url":null,"abstract":"In this chapter, we investigate on indium particles elaboration by different annealing processes: rapid thermal annealing (RTA) and conventional processes. The elaborated particles are dedicated to be used as catalyst for silicon nanowires’ (SiNWs) growth by vapor–liquid–solid (VLS) process. The annealing parameters effect on indium particles properties is studied. After conventional annealing, the indium layer is cracked into elongated and inhomogeneous islands of micrometric sizes. XRD analysis depicts, in addition to pure indium planes, the presence of new peaks attributed to indium oxide (In2O3) planes formed during annealing. After hydrogen treatment with a flow rate of 60 sccm during 10 min, some In2O3 peaks are eliminated and replaced by new indium peaks, explaining the amelioration of indium particles morphology. These formed particles have been used as catalyst for SiNWs’ growth. A low density of SiNWs is obtained, attributed to In2O3 persistence, decreasing the indium catalytic effect. Quasi-spherical and homogeneously distributed indium particles with an average size of 422 nm are successfully grown in one step by the RTA process during short time (5 min) at lower temperature (450°C). XRD analysis shows the absence of indium oxide in the contrary to those formed by the conventional furnace. SiNWs with higher density are obtained, highlighting the harmful role of indium oxide.","PeriodicalId":446707,"journal":{"name":"Post-Transition Metals","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129772017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}