2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)最新文献_第5页

High Switching Beam Focusing Electrode Circuit Mosfets Reliabilty Analysis 高开关光束聚焦电极电路mosfet的可靠性分析

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/ICRITO.2018.8748561

Khilawan Choudhary, Neeraj Kumar, S. Monisha

引用次数: 0

Circuit Model for Statistical Method Based Reliability Estimation of MOS Transistors and Analog CMOS Circuits 基于统计方法的MOS晶体管和模拟CMOS电路可靠性估计电路模型

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/ICRITO.2018.8748763

A. Kuntman, H. Kuntman

{"title":"Circuit Model for Statistical Method Based Reliability Estimation of MOS Transistors and Analog CMOS Circuits","authors":"A. Kuntman, H. Kuntman","doi":"10.1109/ICRITO.2018.8748763","DOIUrl":"https://doi.org/10.1109/ICRITO.2018.8748763","url":null,"abstract":"Modern CMOS technologies are continuously scaling down. As a result of this, analog designers have serious reliability problems in their designs caused by physical effects such as hot carrier injection, negative and positive bias temperature instability (N/PBTI) and temperature dependent dielectric breakdown (TDDB). Therefore, it is an important factor estimating the deviations caused by these degradation mechanisms for a robust design. Note that the reliability of CMOS structures are considered for more than 40 years. Several works have been performed on these degradation effects in MOS structures and appeared in the literature. In most of the reliability studies available in the literature, physical models were proposed. However, difficulties in preparation of physical models seem to be the most important disadvantages of these type models. To overcome these disadvantages of physical models, statistical methods based on observation of experimental results have been introduced in some works. In this talk, statistical methods for modelling of the degradation caused deviations in the drain current and threshold voltage of the N-MOS and PMOS transistors are reviewed. [Note that these models are based on the observations by operating the device under stress voltage conditions. Using these observation results the effect of degradation was investigated statistically and a new statistical method was introduced to be an alternative to those given in the literature. The observed and the estimated values of the degradation are compared. The models introduced are independent of the realization technology and exhibit short simulation time and high accuracy. All data in this review is taken from the recent research works performed in Istanbul University and Istanbul Technical University.","PeriodicalId":439047,"journal":{"name":"2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124196831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Proposing an Encryption/ Decryption Scheme for IoT Communications using Binary-bit Sequence and Multistage Encryption 提出一种使用二进制序列和多阶段加密的物联网通信加密/解密方案

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/ICRITO.2018.8748293

Iqra Hussain, M. Negi, Nitin Pandey

{"title":"Proposing an Encryption/ Decryption Scheme for IoT Communications using Binary-bit Sequence and Multistage Encryption","authors":"Iqra Hussain, M. Negi, Nitin Pandey","doi":"10.1109/ICRITO.2018.8748293","DOIUrl":"https://doi.org/10.1109/ICRITO.2018.8748293","url":null,"abstract":"Currently for a secured communication to take place it has become important to use cryptography on both the sides i.e. encrypting data at sender’s side later followed by decryption processes at the receiver’s side. It is difficult to provide security against the attackers, since they can easily get the significant data by uncovering the encryption key. A lot of algorithms are being expounded for providing data security and most of these algorithms use random key generations, and perform arithmetic operations with the key. This paper puts forward a new encryption/decryption algorithm that is based on the ASCII, Binary-Bit sequence and further uses the XOR operation. It insinuates encryption at compound stages and the key is imparted by the user. In the proposed algorithm, the original data will be encrypted at multiple stages and a key will be made use for encryption of plaintext to cipher text; next same key will be put to use for decryption of cipher to plain text. The proposed algorithm comes under the category of Symmetric key algorithms.","PeriodicalId":439047,"journal":{"name":"2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134183465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 8

Incorporating Autonomic Capability as Quality Attribute for a Software System 将自主能力作为软件系统的质量属性

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/ICRITO.2018.8748488

P. Aggarwal, P. S. Grover, Laxmi Ahuja

引用次数: 6

ICRITO 2018 Author Index ICRITO 2018作者索引

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/icrito.2018.8748317

引用次数: 0

A Hybrid Nonlinear Manifold Detection Approach for Software Defect Prediction 软件缺陷预测的混合非线性流形检测方法

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/ICRITO.2018.8748788

Soumi Ghosh, A. Rana, Vineet Kansal

{"title":"A Hybrid Nonlinear Manifold Detection Approach for Software Defect Prediction","authors":"Soumi Ghosh, A. Rana, Vineet Kansal","doi":"10.1109/ICRITO.2018.8748788","DOIUrl":"https://doi.org/10.1109/ICRITO.2018.8748788","url":null,"abstract":"Rapid development of software technology has influence on substantial industrial growth. Wide application of software in business related matters leads to development of reliable and defect free software system which is a challenging task. It requires development of effective techniques for prediction of software defects at early stage. For complexities in manual prediction of defects, automated techniques have come into effect. They are basically based on learning of pattern from earlier versions of software development and finding out the defects from the current version. Considerable impact of these techniques on industrial growth by predicting defects in software system attracted researchers in this field.In-spite of many studies performed by applying these techniques, desirable performance level and accurate defect prediction still remains a challenging task. For solving this problem, a hybrid technique based on Nonlinear Manifold Detection Techniques (Nonlinear MDTs) and machine learning for prediction of defects has been proposed in this paper. A new hybrid Nonlinear Manifold Detection (Nonlinear MD) Model has been applied for selecting and optimizing the features of software datasets that have been processed using Decision Tree (DT) and Random Forest (RF) classifications. Finally, a comparison and statistical evaluation of the experimental results obtained using new hybrid Nonlinear MD Model-DT have been made by Friedman test followed by Wilcoxon Sign rank test. The statistical outcome revealed that the proposed new hybrid Nonlinear MD Model-DT classification is better result oriented and more accurate in software defect prediction.","PeriodicalId":439047,"journal":{"name":"2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127696501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Estimation of Outage Duration for a Mobile Sensor Node 移动传感器节点停机时间估计

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/ICRITO.2018.8748791

Ritwik Haldar, Kirtan Gopal Panda, A. Hossain

引用次数: 0

Design and Development of a Tool for Analyzing the Effect of Refactoring on Maintainability 一个分析重构对可维护性影响的工具的设计与开发

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/ICRITO.2018.8748274

R. Malhotra, S. Meena

{"title":"Design and Development of a Tool for Analyzing the Effect of Refactoring on Maintainability","authors":"R. Malhotra, S. Meena","doi":"10.1109/ICRITO.2018.8748274","DOIUrl":"https://doi.org/10.1109/ICRITO.2018.8748274","url":null,"abstract":"The most important issue during software development phase is software quality. There are many methods to improve the quality. One of the methods widely used in literature is refactoring. It basically focuses on improving the quality of a software by changing its internal behavior. The objective of this paper is to develop an automated refactoring tool and then analyze the way in which different refactoring methods affect maintainability. We have also compared the prototype of a tool with other existing tools of refactoring. This, in turn, will assist the developer in determining that whether to apply a certain refactoring method to improve a desirable quality attribute. A refactoring tool possesses the ability to analyze each module of a project independently, in terms of applying refactoring and comment cleaning for a complete project. The proposed prototype of a tool can be potentially used by researchers, academicians and software professionals who are working on the projects related to refactoring and will help them in analyzing their projects module individually. The benefits of the designed tool include the benefits of high performance, platform independent and open source.","PeriodicalId":439047,"journal":{"name":"2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO)","volume":"93 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115888474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Effect of Sensing Duration Optimization in Cooperative Spectrum Sensing Game 协同频谱感知博弈中感知时长优化的效果

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/ICRITO.2018.8748866

Suddhendu Das Mahapatra, S. N. Sharan

引用次数: 2

IoT Based Smart Network for Blood Bank 基于物联网的血库智能网络

2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) Pub Date : 2018-08-01 DOI: 10.1109/ICRITO.2018.8748852

A. Al-Kalbani, Syed Imran Ali Kazmi, Jitendra Pandey

引用次数: 6