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Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms 千兆级电子器件中的介电击穿:时间相关的失效机制
Dielectric Breakdown in Gigascale Electronics Pub Date : 2016-09-16 DOI: 10.1007/978-3-319-43220-5
J. Borja, T. Lu, J. Plawsky
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引用次数: 4
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