{"title":"Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms","authors":"J. Borja, T. Lu, J. Plawsky","doi":"10.1007/978-3-319-43220-5","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":436174,"journal":{"name":"Dielectric Breakdown in Gigascale Electronics","volume":"137 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Dielectric Breakdown in Gigascale Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-43220-5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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