{"title":"Fully-Depleted Silicon on Oxide Transistor and Compact Model","authors":"C. Hu","doi":"10.1016/B978-0-08-102401-0.00001-7","DOIUrl":"https://doi.org/10.1016/B978-0-08-102401-0.00001-7","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121995990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Channel Current Model With Real Device Effects in BSIM-IMG","authors":"S. Khandelwal","doi":"10.1016/B978-0-08-102401-0.00003-0","DOIUrl":"https://doi.org/10.1016/B978-0-08-102401-0.00003-0","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127734023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Copyright","authors":"","doi":"10.1016/b978-0-08-102401-0.00010-8","DOIUrl":"https://doi.org/10.1016/b978-0-08-102401-0.00010-8","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"40 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120895035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Parameter Extraction With BSIM-IMG Compact Model","authors":"H. Agarwal","doi":"10.1016/B978-0-08-102401-0.00006-6","DOIUrl":"https://doi.org/10.1016/B978-0-08-102401-0.00006-6","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"33 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132811319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Testing BSIM-IMG Model Quality","authors":"H. Agarwal","doi":"10.1016/B978-0-08-102401-0.00007-8","DOIUrl":"https://doi.org/10.1016/B978-0-08-102401-0.00007-8","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134086430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"High-Frequency and Noise Models in BSIM-IMG","authors":"P. Kushwaha, Y. Chauhan","doi":"10.1016/B978-0-08-102401-0.00008-X","DOIUrl":"https://doi.org/10.1016/B978-0-08-102401-0.00008-X","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122116512","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Leakage Current and Thermal Effects","authors":"S. Khandelwal, P. Kushwaha","doi":"10.1016/B978-0-08-102401-0.00004-2","DOIUrl":"https://doi.org/10.1016/B978-0-08-102401-0.00004-2","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"213 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130017099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Model for Terminal Charges and Capacitances in BSIM-IMG","authors":"S. Khandelwal","doi":"10.1016/B978-0-08-102401-0.00005-4","DOIUrl":"https://doi.org/10.1016/B978-0-08-102401-0.00005-4","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121647025","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Index","authors":"","doi":"10.1016/b978-0-08-102401-0.00020-0","DOIUrl":"https://doi.org/10.1016/b978-0-08-102401-0.00020-0","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131447716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"FDSOI Industry Perspective and Analog/Radio-Frequency Circuit Design","authors":"J. Watts, G. MckayThomas","doi":"10.1016/b978-0-08-102401-0.00012-1","DOIUrl":"https://doi.org/10.1016/b978-0-08-102401-0.00012-1","url":null,"abstract":"","PeriodicalId":427208,"journal":{"name":"Industry Standard FDSOI Compact Model BSIM-IMG for IC Design","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125078340","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}