{"title":"Defect Tolerance in VLSI Circuits","authors":"I. Koren, C. M. Krishna","doi":"10.1016/b978-0-12-818105-8.00020-6","DOIUrl":"https://doi.org/10.1016/b978-0-12-818105-8.00020-6","url":null,"abstract":"","PeriodicalId":422902,"journal":{"name":"Fault-Tolerant Systems","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122831491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}