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Microscopy of Semiconducting Materials, 1987最新文献

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Metal impurities at the SiO2–Si interface SiO2-Si界面上的金属杂质
Microscopy of Semiconducting Materials, 1987 Pub Date : 2021-01-31 DOI: 10.1201/9781003069621-74
K. Honda, T. Nakanishi, A. Ohsawa, N. Toyokura
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引用次数: 0
Laser beam testing of finished integrated circuits 成品集成电路的激光束测试
Microscopy of Semiconducting Materials, 1987 Pub Date : 2021-01-31 DOI: 10.1201/9781003069621-90
G. Auvert
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引用次数: 0
On the visibility of small SiAs particles in silicon by HREM 硅中SiAs小颗粒的HREM可见性研究
Microscopy of Semiconducting Materials, 1987 Pub Date : 1900-01-01 DOI: 10.1201/9781003069621-9
A. Armigliato, A. Bourret, S. Frabboni, A. Parisini
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引用次数: 0
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