{"title":"The Need for a New Paradigm for Hardware Reliability and Software Quality","authors":"","doi":"10.1002/9781119179429.ch1","DOIUrl":"https://doi.org/10.1002/9781119179429.ch1","url":null,"abstract":"","PeriodicalId":414386,"journal":{"name":"Improving Product Reliability and Software Quality","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133530907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. J. Gitman, Carl McDaniel, Amit Shah, Monique Reece, Linda Koffel, B. Talsma, James C. Hyatt
{"title":"The Product Life Cycle","authors":"L. J. Gitman, Carl McDaniel, Amit Shah, Monique Reece, Linda Koffel, B. Talsma, James C. Hyatt","doi":"10.1002/9781119179429.ch5","DOIUrl":"https://doi.org/10.1002/9781119179429.ch5","url":null,"abstract":"","PeriodicalId":414386,"journal":{"name":"Improving Product Reliability and Software Quality","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114782329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Alternative Approaches to Implementing Reliability","authors":"M. Levin, T. T. Kalal","doi":"10.1002/0470014024.CH4","DOIUrl":"https://doi.org/10.1002/0470014024.CH4","url":null,"abstract":"","PeriodicalId":414386,"journal":{"name":"Improving Product Reliability and Software Quality","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123585209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design Concept Phase","authors":"M. Levin, T. T. Kalal","doi":"10.1002/0470014024.CH14","DOIUrl":"https://doi.org/10.1002/0470014024.CH14","url":null,"abstract":"","PeriodicalId":414386,"journal":{"name":"Improving Product Reliability and Software Quality","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130902019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}