2020 IEEE Custom Integrated Circuits Conference (CICC)最新文献

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An Authentication IC with Visible Light Based Interrogation in 65nm CMOS 一种基于可见光的65nm CMOS认证集成电路
2020 IEEE Custom Integrated Circuits Conference (CICC) Pub Date : 2020-03-01 DOI: 10.1109/CICC48029.2020.9075943
Edward Lee, N. M. Rahman, Venkata Chaitanya Krishna Chekuri, S. Mukhopadhyay
{"title":"An Authentication IC with Visible Light Based Interrogation in 65nm CMOS","authors":"Edward Lee, N. M. Rahman, Venkata Chaitanya Krishna Chekuri, S. Mukhopadhyay","doi":"10.1109/CICC48029.2020.9075943","DOIUrl":"https://doi.org/10.1109/CICC48029.2020.9075943","url":null,"abstract":"This paper presents an authentication IC in 65nm CMOS. The IC is interrogated using optical power transfer via off-chip photodiodes and visible light based data transfer via on-chip CMOS diodes. Authentication is performed with a lightweight encryption engine PRINCE. The IC consumes 2.29μW standby power and achieves 53.8kbps data rate. Side channel analysis is performed with results showing that 820K encryptions are necessary to reveal the secret key of the tag.","PeriodicalId":409525,"journal":{"name":"2020 IEEE Custom Integrated Circuits Conference (CICC)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128569901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 16K Current-Based 8T SRAM Compute-In-Memory Macro with Decoupled Read/Write and 1-5bit Column ADC 基于16K电流的8T SRAM内存中计算宏,具有去耦读/写和1-5位列ADC
2020 IEEE Custom Integrated Circuits Conference (CICC) Pub Date : 2020-03-01 DOI: 10.1109/CICC48029.2020.9075883
Chengshuo Yu, Taegeun Yoo, T. T. Kim, K. Chai, Bongjin Kim
{"title":"A 16K Current-Based 8T SRAM Compute-In-Memory Macro with Decoupled Read/Write and 1-5bit Column ADC","authors":"Chengshuo Yu, Taegeun Yoo, T. T. Kim, K. Chai, Bongjin Kim","doi":"10.1109/CICC48029.2020.9075883","DOIUrl":"https://doi.org/10.1109/CICC48029.2020.9075883","url":null,"abstract":"A novel 8T SRAM -based bitcell is proposed for current-based compute-in-memory dot-product operations. The proposed bitcell with two extra NMOS transistors (vs. standard 6T SRAM) decouples SRAM read and write operation. A 128×128 8T SRAM bitcell array is built for processing a vector-matrix multiplication (or parallel dot-products) with 64x binary (0 or 1) inputs, 64×128 binary (-1 or +1) weights, and 128x 1-5bit outputs. Each column (i.e. neuron) of the proposed SRAM compute-in-memory macro consists of 64x bitcells for dot-product, 32x bitcells for ADC, and 32x bitcells for calibration. The column-based neuron minimizes the ADC overhead by reusing a sense amplifier for SRAM read. The column-wise ADC converts the analog dot-product results to N-bit output codes (N=1 to 5) by sweeping reference levels using replica bitcells for 2N-1 cycles for each conversion. Monte-Carlo simulations and test-chip measurement results have verified both linearity and process variation. The largest variation (σ=2.48%) results in the MNIST classification accuracy of 96.2% (i.e. 0.4% lower than a baseline with no variation). A test-chip is fabricated using 65nm, and the 16K SRAM bitcell array occupies 0.055mm2. The energy efficiency of the 1bit operation is 490-to-15.8TOPS/W at 1-5bit ADC mode using 0.45/0.8V core supply and 200MHz.","PeriodicalId":409525,"journal":{"name":"2020 IEEE Custom Integrated Circuits Conference (CICC)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126172328","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 41
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