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Radiation Effects on Integrated Circuits and Systems for Space Applications最新文献

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COTS for Deep Space Missions 用于深空任务的COTS
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 2017-10-17 DOI: 10.1007/978-3-030-04660-6_16
Hans-Juergen Sedlmayr, Alexander Beyer, Klaus Johl, Klaus Kunze, Thomas Obermeier
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引用次数: 1
Error Rate Prediction of Applications Implemented in Multi-Core and Many-Core Processors 多核与多核处理器中应用程序的错误率预测
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-04660-6_7
P. Ramos, Vanessa Vargas, R. Velazco, N. Zergainoh
{"title":"Error Rate Prediction of Applications Implemented in Multi-Core and Many-Core Processors","authors":"P. Ramos, Vanessa Vargas, R. Velazco, N. Zergainoh","doi":"10.1007/978-3-030-04660-6_7","DOIUrl":"https://doi.org/10.1007/978-3-030-04660-6_7","url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"140 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133831503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
System Hardening and Real Applications 系统加固和实际应用
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-04660-6_9
M. Pignol
{"title":"System Hardening and Real Applications","authors":"M. Pignol","doi":"10.1007/978-3-030-04660-6_9","DOIUrl":"https://doi.org/10.1007/978-3-030-04660-6_9","url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"194 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127753747","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
COTS and the NewSpace COTS和新空间
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-04660-6_13
Jaime Estela
{"title":"COTS and the NewSpace","authors":"Jaime Estela","doi":"10.1007/978-3-030-04660-6_13","DOIUrl":"https://doi.org/10.1007/978-3-030-04660-6_13","url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125737247","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUs) 系统级处理器单事件中断(SEUs)漏洞建模与分析
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-04660-6_2
Marwan Ammar, Ghaith Bany Hamad, O. Mohamed, Y. Savaria
{"title":"System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUs)","authors":"Marwan Ammar, Ghaith Bany Hamad, O. Mohamed, Y. Savaria","doi":"10.1007/978-3-030-04660-6_2","DOIUrl":"https://doi.org/10.1007/978-3-030-04660-6_2","url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125596477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single-Event Effects Test Methods 单事件效应试验方法
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-04660-6_3
K. Tapero
{"title":"Single-Event Effects Test Methods","authors":"K. Tapero","doi":"10.1007/978-3-030-04660-6_3","DOIUrl":"https://doi.org/10.1007/978-3-030-04660-6_3","url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130998070","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
COTS in Space: Constraints, Limitations and Disruptive Capability 空间COTS:约束、限制和破坏能力
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-04660-6_12
M. Pignol, F. Malou, C. Aicardi
{"title":"COTS in Space: Constraints, Limitations and Disruptive Capability","authors":"M. Pignol, F. Malou, C. Aicardi","doi":"10.1007/978-3-030-04660-6_12","DOIUrl":"https://doi.org/10.1007/978-3-030-04660-6_12","url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"83 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124272242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Microprocessor Testing 微处理器测试
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-04660-6_5
H. Quinn
{"title":"Microprocessor Testing","authors":"H. Quinn","doi":"10.1007/978-3-030-04660-6_5","DOIUrl":"https://doi.org/10.1007/978-3-030-04660-6_5","url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124014581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Characteristics and Applications of Pulsed Laser-Induced Single-Event Effects 脉冲激光诱导单事件效应的特性及应用
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-04660-6_4
D. McMorrow
{"title":"Characteristics and Applications of Pulsed Laser-Induced Single-Event Effects","authors":"D. McMorrow","doi":"10.1007/978-3-030-04660-6_4","DOIUrl":"https://doi.org/10.1007/978-3-030-04660-6_4","url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"23 25","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120813667","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of a Hardened 150 nm Standard Cell Library 硬化型150nm标准细胞库的研制
Radiation Effects on Integrated Circuits and Systems for Space Applications Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-04660-6_11
J. B. Martins, J. J. S. Noval
{"title":"Development of a Hardened 150 nm Standard Cell Library","authors":"J. B. Martins, J. J. S. Noval","doi":"10.1007/978-3-030-04660-6_11","DOIUrl":"https://doi.org/10.1007/978-3-030-04660-6_11","url":null,"abstract":"","PeriodicalId":403600,"journal":{"name":"Radiation Effects on Integrated Circuits and Systems for Space Applications","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128574544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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