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2015 IEEE 9th International Conference on Anti-counterfeiting, Security, and Identification (ASID)最新文献

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Design of digital standard cell based on silicon tunnel field-effect transistor 基于硅隧道场效应晶体管的数字标准电池设计
2015 IEEE 9th International Conference on Anti-counterfeiting, Security, and Identification (ASID) Pub Date : 2015-09-01 DOI: 10.1109/ICASID.2015.7405663
Hang Su, Yiwen Wang, Jipan Huang, Yufei Han, Mingjiang Wang
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