International Symposium on Signals, Systems, and Electronics最新文献

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Natural Language-Based Software Analyses and Tools for Software Maintenance 基于自然语言的软件分析和软件维护工具
International Symposium on Signals, Systems, and Electronics Pub Date : 2010-08-31 DOI: 10.1007/978-3-642-36054-1_4
L. Pollock, K. Vijay-Shanker, Emily Hill, G. Sridhara, D. Shepherd
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引用次数: 24
Open Source Practices in Software Product Line Engineering 软件产品线工程中的开源实践
International Symposium on Signals, Systems, and Electronics Pub Date : 2010-08-31 DOI: 10.1007/978-3-642-36054-1_8
F. V. Linden
{"title":"Open Source Practices in Software Product Line Engineering","authors":"F. V. Linden","doi":"10.1007/978-3-642-36054-1_8","DOIUrl":"https://doi.org/10.1007/978-3-642-36054-1_8","url":null,"abstract":"","PeriodicalId":402344,"journal":{"name":"International Symposium on Signals, Systems, and Electronics","volume":"6 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132954704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
People-Centered Software Development: An Overview of Agile Methodologies 以人为中心的软件开发:敏捷方法概述
International Symposium on Signals, Systems, and Electronics Pub Date : 2010-08-31 DOI: 10.1007/978-3-642-36054-1_7
F. Maurer, T. Hellmann
{"title":"People-Centered Software Development: An Overview of Agile Methodologies","authors":"F. Maurer, T. Hellmann","doi":"10.1007/978-3-642-36054-1_7","DOIUrl":"https://doi.org/10.1007/978-3-642-36054-1_7","url":null,"abstract":"","PeriodicalId":402344,"journal":{"name":"International Symposium on Signals, Systems, and Electronics","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115317345","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Fundamental Aspects of Software Measurement 软件度量的基本方面
International Symposium on Signals, Systems, and Electronics Pub Date : 2010-08-31 DOI: 10.1007/978-3-642-36054-1_1
S. Morasca
{"title":"Fundamental Aspects of Software Measurement","authors":"S. Morasca","doi":"10.1007/978-3-642-36054-1_1","DOIUrl":"https://doi.org/10.1007/978-3-642-36054-1_1","url":null,"abstract":"","PeriodicalId":402344,"journal":{"name":"International Symposium on Signals, Systems, and Electronics","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126161243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Text Retrieval Approaches for Concept Location in Source Code 源代码中概念定位的文本检索方法
International Symposium on Signals, Systems, and Electronics Pub Date : 2010-08-31 DOI: 10.1007/978-3-642-36054-1_5
Andrian Marcus, S. Haiduc
{"title":"Text Retrieval Approaches for Concept Location in Source Code","authors":"Andrian Marcus, S. Haiduc","doi":"10.1007/978-3-642-36054-1_5","DOIUrl":"https://doi.org/10.1007/978-3-642-36054-1_5","url":null,"abstract":"","PeriodicalId":402344,"journal":{"name":"International Symposium on Signals, Systems, and Electronics","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124885686","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
Predicting Bugs in Large Industrial Software Systems 预测大型工业软件系统中的bug
International Symposium on Signals, Systems, and Electronics Pub Date : 2010-08-31 DOI: 10.1007/978-3-642-36054-1_3
T. Ostrand, E. Weyuker
{"title":"Predicting Bugs in Large Industrial Software Systems","authors":"T. Ostrand, E. Weyuker","doi":"10.1007/978-3-642-36054-1_3","DOIUrl":"https://doi.org/10.1007/978-3-642-36054-1_3","url":null,"abstract":"","PeriodicalId":402344,"journal":{"name":"International Symposium on Signals, Systems, and Electronics","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131466855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Combining Evidence and Meta-analysis in Software Engineering 软件工程中证据与元分析的结合
International Symposium on Signals, Systems, and Electronics Pub Date : 2010-08-31 DOI: 10.1007/978-3-642-36054-1_2
M. Shepperd
{"title":"Combining Evidence and Meta-analysis in Software Engineering","authors":"M. Shepperd","doi":"10.1007/978-3-642-36054-1_2","DOIUrl":"https://doi.org/10.1007/978-3-642-36054-1_2","url":null,"abstract":"","PeriodicalId":402344,"journal":{"name":"International Symposium on Signals, Systems, and Electronics","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133778632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
The Future of Software: Adaptation and Dependability 软件的未来:适应性和可靠性
International Symposium on Signals, Systems, and Electronics Pub Date : 2009-01-22 DOI: 10.1007/978-3-540-95888-8_1
P. Inverardi, Massimo Tivoli
{"title":"The Future of Software: Adaptation and Dependability","authors":"P. Inverardi, Massimo Tivoli","doi":"10.1007/978-3-540-95888-8_1","DOIUrl":"https://doi.org/10.1007/978-3-540-95888-8_1","url":null,"abstract":"","PeriodicalId":402344,"journal":{"name":"International Symposium on Signals, Systems, and Electronics","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134297140","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 37
Autonomic Computing Now You See It, Now You Don't 自主计算,现在你看到了,现在你没有
International Symposium on Signals, Systems, and Electronics Pub Date : 2009-01-22 DOI: 10.1007/978-3-540-95888-8_2
H. Müller, H. Kienle, U. Stege
{"title":"Autonomic Computing Now You See It, Now You Don't","authors":"H. Müller, H. Kienle, U. Stege","doi":"10.1007/978-3-540-95888-8_2","DOIUrl":"https://doi.org/10.1007/978-3-540-95888-8_2","url":null,"abstract":"","PeriodicalId":402344,"journal":{"name":"International Symposium on Signals, Systems, and Electronics","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132086159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 71
The PLASTIC Framework and Tools for Testing Service-Oriented Applications 测试面向服务的应用程序的塑料框架和工具
International Symposium on Signals, Systems, and Electronics Pub Date : 2009-01-22 DOI: 10.1007/978-3-540-95888-8_5
A. Bertolino, G. D. Angelis, L. Frantzen, A. Polini
{"title":"The PLASTIC Framework and Tools for Testing Service-Oriented Applications","authors":"A. Bertolino, G. D. Angelis, L. Frantzen, A. Polini","doi":"10.1007/978-3-540-95888-8_5","DOIUrl":"https://doi.org/10.1007/978-3-540-95888-8_5","url":null,"abstract":"","PeriodicalId":402344,"journal":{"name":"International Symposium on Signals, Systems, and Electronics","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116597167","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 50
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