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Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981最新文献

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Vapor-mist dielectrics Vapor-mist电介质
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684675
R. Harrold
{"title":"Vapor-mist dielectrics","authors":"R. Harrold","doi":"10.1109/EIDP.1981.7684675","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684675","url":null,"abstract":"Although it is well known that particles reduce the strength of many dielectrics, it was recently discovered that a dense mist of micron-size liquid droplets in an insulating gas actually can considerably increase its electrical breakdown strength. As an example, the strength of SF6 at one atmosphere (0.1 MPa) pressure doubled when mixed with a dense mist of C2Cl4; and at ∼0.01 MPa pressure, the mist increased the dielectric strength by an order of magnitude. It is believed that the mechanism which these mixtures achieve a high dielectric strength involves supersaturated vapor from the small droplets, the strength of the gas-vapor mixture which forms; and the capture of electrons by the droplets. As the micron-size liquid droplets will not freeze, then vapor-mist dielectrics can be used at low temperature where many vapors have poor dielectric strength. Consequently, vapor-mist dielectrics are now being investigated* as possible cooling and insulating media for vapor-cooled pOvler trans formers.","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116914273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Partial discharge characteristics of liquid-impregnated laminate dielectric structures 液体浸渍层压介质结构的局部放电特性
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684641
K. J. Bickford, W. Sarjeant, G. H. Mauldin
{"title":"Partial discharge characteristics of liquid-impregnated laminate dielectric structures","authors":"K. J. Bickford, W. Sarjeant, G. H. Mauldin","doi":"10.1109/EIDP.1981.7684641","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684641","url":null,"abstract":"Evolving power conditioning system requirements in many important technological areas will place severe demands upon repetitive pulse-power components. A principal pacing system component in high reliability, repetitive pulse-power technology is the energy storage capacitor. A joint program for the research and development of repetitively operated, pulse discharge energy storage capacitors has been initiated at the Los Alamos and Sandia National Laboratories. The purpose of this ongoing activity is to create the knowledge base necessary for the design and fabrication of materials-limited, multikilojoule capacitors that are continuously operable to 100 pps with lifetimes approaching 109 charge-discharge cycles at 99.99% reliability. Recently increasing availabilities of quality plastic films, especially polypropylene, and the discovery of the excellent properties of perfluorocarbon liquids for impregnation fluids (1) make spirally-wound, plastic film/liquid impregnated capacitors the leading candidate for high energy density, repetitively operated pulse discharge energy storage devices. The dominant lifetime-limiting mechanism in this type of high energy density capacitor is a direct result of partial discharge activity at the buried foil edges, where the electric field is maximum. An initial objective of this joint program is to characterize and understand the mechanisms of this partial discharge phenomenon.","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114576510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Fourier transform dielectric spectroscopy utilizing a real time executive (RTE) system 利用实时执行(RTE)系统的傅里叶变换介电光谱
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684663
G. Johnson, E. Anderson, T. Furukawa
{"title":"Fourier transform dielectric spectroscopy utilizing a real time executive (RTE) system","authors":"G. Johnson, E. Anderson, T. Furukawa","doi":"10.1109/EIDP.1981.7684663","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684663","url":null,"abstract":"The use of an RTE operating system facilitates the development of an efficient Fourier transform spectrometer which can obtain time dependent data in the four microsecond to 3000 second range. Permittivities over a frequency range of 10−4 to 104 Hz are thus obtained. Program development is much easier than in more limited systems such as BCS. The Input/Output flexibility of the RTE system utilizing the HP-IB also contributes to the added capabilities. Both program development and Input/Output capabilities are used in creating time domain programming with analysis without transformation.","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129857417","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Diffusion studies of antioxidants in polyethylene 抗氧化剂在聚乙烯中的扩散研究
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684672
B. Andress, P. Röhl
{"title":"Diffusion studies of antioxidants in polyethylene","authors":"B. Andress, P. Röhl","doi":"10.1109/EIDP.1981.7684672","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684672","url":null,"abstract":"The successful use of polymeric insulating materials in electrotechnical applications requires a long-term stabilization of their initially excellent mechanical and electrical properties against degradation. One of the usual means of stabilization is to add special additives at low concentration levels. Apart from the necessary chemical effectiveness, the additives have to comply with certain physical requirements: The additive should be homogeneously distributed within the polymer, it should be sufficiently soluble and it should also be retained over extended periods of time. The questions pertaining to these problems can be answered by studying the local additive concentration and its time-dependence in respective systems.","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"8 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123803321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Laboratory testing of electrical insulating materials superficial resistance to HF vapours as selection criteria for SF6 circuit breakers insulators 作为SF6断路器绝缘子选择标准的电绝缘材料表面抗HF蒸气的实验室试验
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684688
J. Jarmula
{"title":"Laboratory testing of electrical insulating materials superficial resistance to HF vapours as selection criteria for SF6 circuit breakers insulators","authors":"J. Jarmula","doi":"10.1109/EIDP.1981.7684688","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684688","url":null,"abstract":"Electrical insulating materials show a temporal drop of electric surface resistivity R<inf>S</inf> when exposed to SF<inf>6</inf> electric arc decomposition products atmosphere. A general curve run had been presented /fig.1/ and three important points R<inf>o</inf>,R<inf>min</inf> and R<inf>e</inf> were marked on the curve [1].","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130071577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The feasibility of identifying and locating thermal mechanisms in large machines by remote sensing 利用遥感技术识别和定位大型机械热机制的可行性
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684659
W. K. Hogg, D. Ryder, J. W. Wood
{"title":"The feasibility of identifying and locating thermal mechanisms in large machines by remote sensing","authors":"W. K. Hogg, D. Ryder, J. W. Wood","doi":"10.1109/EIDP.1981.7684659","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684659","url":null,"abstract":"In order to obtain an early warning of any over-heating problem within large electrical machines, instruments have been designed and are now commercially available, called ‘Condition Monitors’ (C.M.). Their function is to produce an electrical signal when any particles/materials, i.e. as emitted by over heated insulation, pass through the sensitive ion chamber. In the USA, considerable success has been claimed in preventing catastrophic failure of machines by responding to the condition monitor signals and removing the machine from load. However, electricity suppliers are generally cautious in responding to any condition monitor signal, resulting in either load shedding or desynchronisation of the machine. At present a condition monitor signal will not indicate to the operator the cause for the alarm, nor its location within the machine, even if it is an over heating problem. If the cause for the alarm can be identified and it is a thermal process which can be related to a particular material, then the relative importance of the alarm can probably be assessed. However, these processes are time consuming and often interpretation of the results is difficult and inconclusive. Certain techniques will be discussed, together with promising new developments.","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117289228","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Transient glow discharges in laser excitation and breakdown 激光激发和击穿中的瞬态辉光放电
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684648
L. Kline
{"title":"Transient glow discharges in laser excitation and breakdown","authors":"L. Kline","doi":"10.1109/EIDP.1981.7684648","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684648","url":null,"abstract":"The spatiotempora1 development of discharges in parallel plane gaps at high overvo1tage has been studied for many years in order to understand the physical mechanisms of breakdown. These studies have shown that a glow discharge structure is produced, even at high overvoltages where the duration of the glow discharge can be as short as tens or hundreds of nanoseconds. Recently, these transient glow discharges have been used as a pumping source for a variety of gas lasers including CO2 lasers and rare gas-halide excimer lasers. Ultraviolet preionization of the gas volume is widely used to “stabilize” these laser glow discharges, i.e., to increase the energy which can be deposited into the discharge without causing a glow-to-arc transition. There has also been recent work which indicates that the corona discharges which occur in point-plane gaps have a glow discharge structure. The phenomena that are observed in these three types of discharges will be compared. We will also offer some speculations about the “corona stabilization” process that is observed in the breakdown of point-plane gaps in SF6 and SF6 mixtures.","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130766010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Thermal breakdown in dielectrics 电介质中的热击穿
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684643
J. O'dwyer, B. L. Beers
{"title":"Thermal breakdown in dielectrics","authors":"J. O'dwyer, B. L. Beers","doi":"10.1109/EIDP.1981.7684643","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684643","url":null,"abstract":"The basic equations governing thermal breakdown are the heat flow equation equation (1) and the equation of current continuity equation (2) where the symbols have their usual meanings. The conservation of energy is expressed by Eq. 1, and it is therefore necessary. Equation 2 requires that the dielectric relaxation time ε/σ be much smaller than time intervals considered in the integration of Eq. 1. This condition holds for the examples worked below.","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124290333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Future development in solid dielectric insulators for compressed gas insulated transmission systems 压缩气体绝缘传输系统用固体介电绝缘子的未来发展
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684680
S. Dale
{"title":"Future development in solid dielectric insulators for compressed gas insulated transmission systems","authors":"S. Dale","doi":"10.1109/EIDP.1981.7684680","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684680","url":null,"abstract":"Compressed gas insulated transmission lines (CGIT) have a conductor supported by solid dielectric insulators inside a metal enclosure. Sulfur hexafluoride gas at 240 kPa to 500 kPa provides the required dielectric strength. The critical dielectric design factor is usually the impulse BIL requirements. The conductor field is typically from 16 to 18 kV/mm at the BIL voltage for gas pressures of 400 to 500 kPa. This is only about 37 percent of the theoretical strength of SF6 and the operating conductor fields vary from 6 percent to 14 percent depending on the system voltage.","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126100851","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Time dependence of the radiation-induced conductivity 辐射诱导电导率的时间依赖性
Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981 Pub Date : 1981-10-01 DOI: 10.1109/EIDP.1981.7684623
K. Labonte
{"title":"Time dependence of the radiation-induced conductivity","authors":"K. Labonte","doi":"10.1109/EIDP.1981.7684623","DOIUrl":"https://doi.org/10.1109/EIDP.1981.7684623","url":null,"abstract":"Knowledge of the radiation-induced conductivity (RIC) in dielectrics is of great importance for the understanding of the charge dynamics in such materials during electron beam irradiation. In previous studies of the charge buildup, the RIC in the irradiated region was assumed to be constant in space and time (1). In 1976 Matsuoka et al. (2) improved the so-called box model introducing experimental depth-dose and charge-deposition profiles which reflect the effect of the range straggling of the incident electrons. Monte Carlo simulations (3,4) of the elastic and inelastic scattering effects during electron bombardment verified the experimental data of the space dependence of the RIC. In 1980 Gross et al. (5) showed that the time dependence of the RIC cannot be neglected, and replaced the prompt conductivity by an exponential buildup of the RIC after the onset of irradiation.","PeriodicalId":399490,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1981","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1981-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131414778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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