2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)最新文献

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Optimal edge termination for high oxide reliability aiming 10kV SiC n-IGBTs 针对10kV SiC n- igbt的高氧化物可靠性的最佳边缘终止
S. Perkins, M. Antoniou, Amit K. Tiwari, A. Arvanitopoulos, Konstantinos N. Gyftakis, T. Trajkovic, F. Udrea, N. Lophitis
{"title":"Optimal edge termination for high oxide reliability aiming 10kV SiC n-IGBTs","authors":"S. Perkins, M. Antoniou, Amit K. Tiwari, A. Arvanitopoulos, Konstantinos N. Gyftakis, T. Trajkovic, F. Udrea, N. Lophitis","doi":"10.1109/DEMPED.2019.8864919","DOIUrl":"https://doi.org/10.1109/DEMPED.2019.8864919","url":null,"abstract":"The edge termination design strongly affects the ability of a power device to support the desired voltage and its reliable operation. In this paper we present three appropriate termination designs for 10kV n-IGBTs which achieve the desired blocking requirement without the need for deep and expensive implantations. Thus, they improve the ability to fabricate, minimise the cost and reduce the lattice damage due to the high implantation energy. The edge terminations presented are optimised both for achieving the widest immunity to dopant activation and to minimise the electric field at the oxide. Thus, they ensure the long-term reliability of the device. This work has shown that the optimum design for blocking voltage and widest dose window does not necessarily give the best design for reliability. Further, it has been shown that Hybrid Junction Termination Extension structure with Space Modulated Floating Field Rings can give the best result of very high termination efficiency, as high as 99%, the widest doping variation immunity and the lowest electric field in the oxide.","PeriodicalId":397001,"journal":{"name":"2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122571396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Detectability study of broken rotor bars in induction motors at different loads and supplies 感应电动机在不同负载和电源条件下转子断条的可检测性研究
Daniele De Palo, D. Morinigo-Sotelo, L. Frosini
{"title":"Detectability study of broken rotor bars in induction motors at different loads and supplies","authors":"Daniele De Palo, D. Morinigo-Sotelo, L. Frosini","doi":"10.1109/DEMPED.2019.8864837","DOIUrl":"https://doi.org/10.1109/DEMPED.2019.8864837","url":null,"abstract":"The aim of this paper is to evaluate the detectability of broken rotor bars in induction motors by means of the analysis in the frequency domain of three quantities (stator current, external stray flux and vibration) measured in steady state condition, at different levels of load and with different power supplies. The effects of the spectral leakage and of the harmonics arising from the inverters are assessed in the observation of the fault-associated harmonics.","PeriodicalId":397001,"journal":{"name":"2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123239499","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Influence of Winding's Active Parts on Axial Flux in AC Machines 交流电机绕组有功部件对轴向磁通的影响
T. Sobczyk, M. Sułowicz, J. Tulicki
{"title":"Influence of Winding's Active Parts on Axial Flux in AC Machines","authors":"T. Sobczyk, M. Sułowicz, J. Tulicki","doi":"10.1109/DEMPED.2019.8864883","DOIUrl":"https://doi.org/10.1109/DEMPED.2019.8864883","url":null,"abstract":"This paper discusses the conditions for generating axial flux using the active parts of stator and rotor windings in AC machines even if these parts are axially located. The 1D flux density analysis of the air gap shows that the axial flux is generated due to the asymmetry of windings or asymmetry of the air gap. Respective conditions are stated and an analytical formula for the axial flux is presented in the paper. Exemplary, the axial flux due to static rotor eccentricity is analyzed in detail.","PeriodicalId":397001,"journal":{"name":"2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131498265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Information fusion with Correlation Coefficient for detecting inter-turn short circuit faults in asynchronous machines 利用相关系数进行信息融合,检测异步机匝间短路故障
M. Irhoumah, R. Pusca, E. Lefevre, D. Mercier, R. Romary
{"title":"Information fusion with Correlation Coefficient for detecting inter-turn short circuit faults in asynchronous machines","authors":"M. Irhoumah, R. Pusca, E. Lefevre, D. Mercier, R. Romary","doi":"10.1109/DEMPED.2019.8864854","DOIUrl":"https://doi.org/10.1109/DEMPED.2019.8864854","url":null,"abstract":"This paper presents a new method giving high efficiency for detecting an inter-turn short-circuit fault in the stator winding of asynchronous machines. For evaluation of the machine state and final decision, the monitoring of the magnetic field variation in the vicinity of an electrical machine is used. The proposed approach is based on the fusion of information extracted from signals delivered by flux sensors placed in different positions around the machine and the calculation of Pearson correlation coefficient. This coefficient allows one to quantify the linear relationship between the signals delivered by two sensors S1 and S2 placed at 180° around the machine in several positions. The proposed approach is non-invasive and relies on the calculation of a correlation coefficient derived from measurements of the external magnetic leakage field for different load working cases. The ability of proposed coefficient to provide useful information about faults is investigated in the paper.","PeriodicalId":397001,"journal":{"name":"2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129387871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Parametric degradation model of OLED using Design of Experiments (DoE) 基于实验设计的OLED参数化退化模型
Andrea Al Haddad, A. Picot, L. Canale, G. Zissis, P. Maussion
{"title":"Parametric degradation model of OLED using Design of Experiments (DoE)","authors":"Andrea Al Haddad, A. Picot, L. Canale, G. Zissis, P. Maussion","doi":"10.1109/DEMPED.2019.8864855","DOIUrl":"https://doi.org/10.1109/DEMPED.2019.8864855","url":null,"abstract":"This article presents an original parametric degradation model using Design of Experiments. This method is based on the estimation of a Weibull function under accelerated conditions. It is applied on cold white organic light emitting diodes OLEDs from Philips with a 10000 hrs theoretical lifetime. Accelerated degradation using thermal and electrical stress is tested. The predicted degrading model is a function of time, temperature, current density and their interaction. It illustrates the behaviour of the degradation of the OLED using multiple stress factors without really knowing the physics of these degradations. The proposed model is tested on experimental data for different luminances. The average error of the predicted model compared to real values is around 3 %. The proposed model is then compared to a previously developed lifespan model. The results obtained with the present approach are closer to the real values.","PeriodicalId":397001,"journal":{"name":"2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128360646","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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