{"title":"Reliability of electrolytic capacitors in computers","authors":"Mark Vanbuskirk","doi":"10.1145/1434878.1434903","DOIUrl":"https://doi.org/10.1145/1434878.1434903","url":null,"abstract":"If any person would ask ten different electronic manufacturers whose equipments cover a wide variety of electronic circuits for their opinions of electrolytic capacitors, it is possible there would be ten different answers. These answers might range from: \"We use them all the time, and never have any trouble,\" to the extreme: \"We wouldn't use them under any circumstance. They are not reliable.\"","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116126374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability and its relation to suitability and predictability","authors":"E. B. Ferrell","doi":"10.1145/1434878.1434905","DOIUrl":"https://doi.org/10.1145/1434878.1434905","url":null,"abstract":"Reliability, like a great many other words, means different things to different people. Let me illustrate with a purely imaginary example. Suppose we have a small vacuum tube with amplification, mutual conductance, and plate impedance all of useful magnitudes. Tubes of this type have been made in large quantity. Their characteristics, when measured at the factory have very good uniformity---all are within ±1 per cent of their nominal value. Every tube that has been examined has kept its characteristics within these narrow limits throughout its entire life, and a large fraction of the tubes made have been thus examined. These characteristics are entirely independent of such things as ambient temperature and mechanical shock.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122601148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability of a large REAC installation","authors":"Bernard Loveman","doi":"10.1145/1434878.1434892","DOIUrl":"https://doi.org/10.1145/1434878.1434892","url":null,"abstract":"Project cyclone at the Reeves Instrument Corporation is under the cognizance of the Bureau of Aeronautics of the Department of the Navy. The primary function of Project Cyclone is the development and operation of a Guided Missile Simulator and the establishment and operation of a Simulation Laboratory. Problems in aeroelasticity, engine control, aircraft stability, dynamics, and navigation have also been studied with the aid of the computing facilities of the Simulation Laboratory.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122712223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability and characteristics of the Illiac electrostatic memory","authors":"J. M. Wier","doi":"10.1145/1434878.1434896","DOIUrl":"https://doi.org/10.1145/1434878.1434896","url":null,"abstract":"The Illiac memory was completed in the spring of 1952. It was tested during the early part of the summer and in August was attached to the previously completed arithmetic unit. About three weeks were needed to complete the physical work necessary for this and to eliminate all unsoldered joints, misconnections, etc. Detailed records were kept after this time. This log begins on September 3 and covers every \"on\" period in detail. Later entries are more specific due to the added experience gained in isolating difficulties.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"238 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130367819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Recent progress in the production of error-free magnetic computer tape","authors":"J. Chapman, W. Wetzel","doi":"10.1145/1434878.1434902","DOIUrl":"https://doi.org/10.1145/1434878.1434902","url":null,"abstract":"Signal dropouts arising from magnetic tape are one cause of error in modern digital computers designed to use such tape as a long period storage medium. Noise pulses, which are of sufficient amplitude to act as spurious signals, form a second error source. Both dropouts and noise pulses are traceable to discontinuities in the magnetic coating.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133884837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Experience on the Air Force UNIVAC","authors":"R. Kopp","doi":"10.1145/1434878.1434894","DOIUrl":"https://doi.org/10.1145/1434878.1434894","url":null,"abstract":"The purpose of this paper is to discuss those factors the Air Force finds to have the most impact on electronic-computer reliability. In order to accomplish this purpose, I shall tell the story, in a general way, of the Air Force's experience with the UNIVAC for the past 18 months. During this time it has been under the sole control of the DCS/Comptroller, Headquarters, United States Air Force. I shall correlate these experiences with the reliability aspect of electronic computation.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121064677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A review of ORDVAC operating experience","authors":"Charles R. Williams","doi":"10.1145/1434878.1434899","DOIUrl":"https://doi.org/10.1145/1434878.1434899","url":null,"abstract":"The ORDVAC is one of three large-scale electronic computers located at the Computing Laboratory of the Ballistic Research Laboratories at Aberdeen Proving Ground, Maryland. It is the newest computer at the laboratory having been delivered in March, 1952. It operates in the binary number system in a parallel asynchronous manner, and it uses an electrostatic memory. Input to the machine is by punched teletype tape or punched IBM cards. Output from the machine is obtained on punched IBM cards, a teletype page printer, or punched teletype tape.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122082227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability experience on the OARAC","authors":"R. House","doi":"10.1145/1434878.1434889","DOIUrl":"https://doi.org/10.1145/1434878.1434889","url":null,"abstract":"The OARAC (Office of Air Research Automatic Computer) was delivered to the Aeronautical Research Laboratory at Wright Air Development Center in February 1953. After physical installation it required about two weeks for electrical installation and checking. Consequently, good computing time began the latter part of April.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128603684","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electron tube and crystal diode experience in computing equipment","authors":"J. A. Goetz, H. Geisler","doi":"10.1145/1434878.1434895","DOIUrl":"https://doi.org/10.1145/1434878.1434895","url":null,"abstract":"Three years ago, the first Conference on Electron Tubes for Computers was held in Atlantic City. At that meeting a paper of similar title was presented, outlining field experience with electron tubes employed in widely used IBM products. Data prepared at the time illustrated common causes and frequency of tube failure, as determined by laboratory analysis and statistics maintained on field replaced components. The program from which this data evolves is continuous, and since its inception in early 1949, has provided a substantial reduction in field tube failures. In some instances, improvement in machine performance has resulted from the introduction of newly developed tube types, and in others from corrections made in misapplication of existing tubes. It is the purpose of this paper to outline the program of component improvement phases of computer manufacturing.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122760815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Acceptance test for Raytheon hurricane computer","authors":"F. J. Murray","doi":"10.1145/1434878.1434891","DOIUrl":"https://doi.org/10.1145/1434878.1434891","url":null,"abstract":"The hurricane digital computer is a large-scale digital computer developed for the United States Navy by the Raytheon Manufacturing Company and installed at the Naval Air Missile Test Center at Point Mugu in the spring of 1953. It has many novel features including highly developed input and output equipment, magnetic-tape storage with an optical locating device, and a checking system which was designed not merely to detect errors but to prevent loss of any valid information available to the computer.","PeriodicalId":384732,"journal":{"name":"AIEE-IRE '53 (Eastern)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116448303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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