Applied Optical Metrology III最新文献

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Front Matter: Volume 11102 封面:第11102卷
Applied Optical Metrology III Pub Date : 2019-10-16 DOI: 10.1117/12.2551001
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引用次数: 0
Recent development in BTDF/BRDF metrology on large-scale Lambertian-like diffusers: application to on-board calibration units in space instrumentation 大型类朗伯扩散器上BTDF/BRDF计量的最新进展:在空间仪器机载校准装置上的应用
Applied Optical Metrology III Pub Date : 2019-09-12 DOI: 10.1117/12.2529542
E. Mazy, C. Michel, Sarah Marcotte, L. Clermont, B. Marquet, Jérôme Jacobs, I. Domken, Y. Stockman
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引用次数: 0
Close-range image stitching based on depth information and moving DLT 基于深度信息和移动DLT的近景图像拼接
Applied Optical Metrology III Pub Date : 2019-09-11 DOI: 10.1117/12.2528992
Mowen Xue, Xudong Li, Hongzhi Jiang, Huijie Zhao
{"title":"Close-range image stitching based on depth information and moving DLT","authors":"Mowen Xue, Xudong Li, Hongzhi Jiang, Huijie Zhao","doi":"10.1117/12.2528992","DOIUrl":"https://doi.org/10.1117/12.2528992","url":null,"abstract":"In the image-based industrial inspection field, the imaging distance between the scene and the camera is relatively short, and the field-of-view of the imaging system is too small to meet the requirements of detection. So a close-range image stitching method is needed to get high quality and large field-of-view images. The traditional image stitching method uses a global homography transformation matrix for image stitching, which is stable, but only suitable for flat scenes, remote scenes or the scenes which are captured by the camera with rotation only. The As-Projective-As-Possible and Content- Preserving-Warping methods, which are realized by mesh optimization, improve the stitching result to a certain degree, but there will still have obvious ghost for the close-range scenes and images which have relatively large parallax. In this paper, an image stitching method which utilizes depth information and mesh optimization is proposed. The feature points are detected and clustered, and the depth information and grouping points are used to assign weights to each mesh to compute homography for each mesh respectively. Other state-of-the-art methods are compared with our method, it can be seen that the proposed method can get a better result.","PeriodicalId":375241,"journal":{"name":"Applied Optical Metrology III","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116806433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Point spread function measurement for projector based on Fourier single-pixel imaging 基于傅里叶单像素成像的投影仪点扩展函数测量
Applied Optical Metrology III Pub Date : 2019-09-11 DOI: 10.1117/12.2529200
R. Wu, Hongzhi Jiang, Huijie Zhao, Xudong Li, Q. Guo
{"title":"Point spread function measurement for projector based on Fourier single-pixel imaging","authors":"R. Wu, Hongzhi Jiang, Huijie Zhao, Xudong Li, Q. Guo","doi":"10.1117/12.2529200","DOIUrl":"https://doi.org/10.1117/12.2529200","url":null,"abstract":"Point spread function (PSF) of projector plays an important role in coaxial projection-imaging profilometry and binary defocusing fringe projection profilometry. In the proposed method, the SPI (Single Pixel Imaging)-based PSF measurement method has been used to obtain the PSF of the projector point by point. We use the camera to capture the SPI patterns projected by the projector on a white plane. By considering each pixel of the camera as a single-pixel detector, we can apply SPI technology to the camera pixels and acquire the light transport coefficients between the object points on the white plane and image points of projector, which is the spatially varying blur. Owing to the characteristic of SPI, the proposed method could obtain the spatially varying blur of every pixel directly. The experiment also verified that the proposed method could provide a more accurate blur kernel than the traditional Gaussian blur kernel to fit the blur model of the camera lens.","PeriodicalId":375241,"journal":{"name":"Applied Optical Metrology III","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128139840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Combining multispectral and hyperspectral imaging techniques to monitor and manage wax apple orchard (Conference Presentation) 结合多光谱和高光谱成像技术监测和管理腊苹果园(会议报告)
Applied Optical Metrology III Pub Date : 2019-09-10 DOI: 10.1117/12.2529788
Yi-Chun Chen, Bo-Yan Lai, Ku-Yu Chen, C. Huang, Yung-Jhe Yan, Shiou-Gwo Lin, Tzung-Cheng Chen, M. Ou‐Yang
{"title":"Combining multispectral and hyperspectral imaging techniques to monitor and manage wax apple orchard (Conference Presentation)","authors":"Yi-Chun Chen, Bo-Yan Lai, Ku-Yu Chen, C. Huang, Yung-Jhe Yan, Shiou-Gwo Lin, Tzung-Cheng Chen, M. Ou‐Yang","doi":"10.1117/12.2529788","DOIUrl":"https://doi.org/10.1117/12.2529788","url":null,"abstract":"","PeriodicalId":375241,"journal":{"name":"Applied Optical Metrology III","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128204661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Comparison of interferometer and d’nanoimager for profiling large objects (Conference Presentation) 干涉仪与纳米成像仪在大型物体成像中的比较(会议报告)
Applied Optical Metrology III Pub Date : 2019-09-10 DOI: 10.1117/12.2524704
Dingfu Chen, Yingjie Yu, Jianfei Sun, P. Buranasiri, S. Sutthiruangwong, Thanthanat Srisuwan, A. Asundi
{"title":"Comparison of interferometer and d’nanoimager for profiling large objects (Conference Presentation)","authors":"Dingfu Chen, Yingjie Yu, Jianfei Sun, P. Buranasiri, S. Sutthiruangwong, Thanthanat Srisuwan, A. Asundi","doi":"10.1117/12.2524704","DOIUrl":"https://doi.org/10.1117/12.2524704","url":null,"abstract":"","PeriodicalId":375241,"journal":{"name":"Applied Optical Metrology III","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129780615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Light fields: from shape recovery to sparse reconstruction (Conference Presentation) 光场:从形状恢复到稀疏重建(会议报告)
Applied Optical Metrology III Pub Date : 2019-09-10 DOI: 10.1117/12.2527582
R. Ramamoorthi
{"title":"Light fields: from shape recovery to sparse reconstruction (Conference Presentation)","authors":"R. Ramamoorthi","doi":"10.1117/12.2527582","DOIUrl":"https://doi.org/10.1117/12.2527582","url":null,"abstract":"","PeriodicalId":375241,"journal":{"name":"Applied Optical Metrology III","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133753759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optical metrology in times of digital transition (Conference Presentation) 数字化转型时代的光学计量学(会议报告)
Applied Optical Metrology III Pub Date : 2019-09-10 DOI: 10.1117/12.2530173
W. Osten, Yuhong Bai
{"title":"Optical metrology in times of digital transition (Conference Presentation)","authors":"W. Osten, Yuhong Bai","doi":"10.1117/12.2530173","DOIUrl":"https://doi.org/10.1117/12.2530173","url":null,"abstract":"","PeriodicalId":375241,"journal":{"name":"Applied Optical Metrology III","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122204541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Real-time digital demodulation algorithm for an interferometric magnetic field sensor 干涉式磁场传感器的实时数字解调算法
Applied Optical Metrology III Pub Date : 2019-09-03 DOI: 10.1117/12.2528538
Chris Prasai, Lauren E. Getz, B. Krause, T. Tayag
{"title":"Real-time digital demodulation algorithm for an interferometric magnetic field sensor","authors":"Chris Prasai, Lauren E. Getz, B. Krause, T. Tayag","doi":"10.1117/12.2528538","DOIUrl":"https://doi.org/10.1117/12.2528538","url":null,"abstract":"","PeriodicalId":375241,"journal":{"name":"Applied Optical Metrology III","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125032504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-accuracy surface measurement through modelling of the surface transfer function in interference microscopy 通过干涉显微镜中表面传递函数的建模实现高精度表面测量
Applied Optical Metrology III Pub Date : 2019-09-03 DOI: 10.1117/12.2528911
Rong Su, Matthew Thomas, Mingyu Liu, J. Coupland, R. Leach
{"title":"High-accuracy surface measurement through modelling of the surface transfer function in interference microscopy","authors":"Rong Su, Matthew Thomas, Mingyu Liu, J. Coupland, R. Leach","doi":"10.1117/12.2528911","DOIUrl":"https://doi.org/10.1117/12.2528911","url":null,"abstract":"Surfaces featuring complex topographies, such as high slope angles, large curvatures and high aspect-ratio structures on both macro-and micro-scales, present significant challenges to optical measuring instruments. Here we demonstrate a method to characterise and correct the three-dimensional surface transfer function (3D STF) of a coherence scanning interferometer (CSI). Slope-dependent errors present in the original measurements are reduced after phase inversion of the 3D STF, and the final results agree with traceable contact stylus measurements within the 30 nm reproducibility of the stylus measurements. This method enables in-situ compensation for errors related to aberrations, defocus and diffraction.","PeriodicalId":375241,"journal":{"name":"Applied Optical Metrology III","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122781951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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