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Comparison of microstrain indicators measurements based on Anderson’s Loop and Wheatstone Bridge 基于Anderson’s Loop和Wheatstone Bridge的微应变指标测量比较
16th International Conference on Electronics, Communications and Computers (CONIELECOMP'06) Pub Date : 1900-01-01 DOI: 10.1109/conielecomp.2006.23
A. Diaz Cuenca, L. Olivares Beltran, J.P. Talledo Vilela, J. Carlos Miranda
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