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Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021最新文献

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Quantifizierung von Redundanz in Sensorsystemen und die Beziehung zur Messunsicherheit 量化出传感器系统的冗余以及测量不确定性的关系
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-35
G. Kok
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引用次数: 0
Quantitativer Ergebnis-Indikator zur Bewertung von Vergleichsmessungen – Vergleichsmessungen aus Sicht des Verbraucherschutzes auswerten 用消费者保护的角度评估基准数量
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-197
S. Friederici, S. Rudtsch, L. Bunger
{"title":"Quantitativer Ergebnis-Indikator zur Bewertung von Vergleichsmessungen – Vergleichsmessungen aus Sicht des Verbraucherschutzes auswerten","authors":"S. Friederici, S. Rudtsch, L. Bunger","doi":"10.51202/9783181023907-197","DOIUrl":"https://doi.org/10.51202/9783181023907-197","url":null,"abstract":"","PeriodicalId":369516,"journal":{"name":"Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123524233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Erfahrungen in der Anwendung von Messunsicherheitsbudgets in akkreditierten Werkstoffprüflaboren entsprechend DIN EN ISO/IEC 17025:2018 材料检验实验室参考了反叛的材料
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-253
S. Wieler, H. Frenz
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引用次数: 0
Eignungsprüfung – wurde wirklich so kalibriert oder geprüft wie spezifiziert? – Beispiel: Prüfung von Elektrizitätszählern 能力测试为自己定位或者指定部分。举例来说
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-87
C. Mester, J. Braun
{"title":"Eignungsprüfung – wurde wirklich so kalibriert oder geprüft wie spezifiziert? – Beispiel: Prüfung von Elektrizitätszählern","authors":"C. Mester, J. Braun","doi":"10.51202/9783181023907-87","DOIUrl":"https://doi.org/10.51202/9783181023907-87","url":null,"abstract":"","PeriodicalId":369516,"journal":{"name":"Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115359755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Messunsicherheitsbestimmung bei der Datenfusion lokaler und globaler Messtechnik zur Sektionsmontage im Flugzeugbau 本地和全球定位技术将数据整合用于飞机建造分离技术
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-47
M. Huber, C. Nicksch, R. Schmitt
{"title":"Messunsicherheitsbestimmung bei der Datenfusion lokaler und globaler Messtechnik zur Sektionsmontage im Flugzeugbau","authors":"M. Huber, C. Nicksch, R. Schmitt","doi":"10.51202/9783181023907-47","DOIUrl":"https://doi.org/10.51202/9783181023907-47","url":null,"abstract":"","PeriodicalId":369516,"journal":{"name":"Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021","volume":"os-13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123388129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Verknüpfung von Datensätzen mit unterschiedlicher Auflösung mittels parallelkinematischem Positioniersystem 但其实是收集了收集的数据用平行动态位置系统连接不同分辨率
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-75
S. Metzner, T. Hausotte
{"title":"Verknüpfung von Datensätzen mit unterschiedlicher Auflösung mittels parallelkinematischem Positioniersystem","authors":"S. Metzner, T. Hausotte","doi":"10.51202/9783181023907-75","DOIUrl":"https://doi.org/10.51202/9783181023907-75","url":null,"abstract":"","PeriodicalId":369516,"journal":{"name":"Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122834167","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Die Konformitätsbeurteilung von 5G-Basisstationen 遵守规则5根基站
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-111
F. Pythoud
{"title":"Die Konformitätsbeurteilung von 5G-Basisstationen","authors":"F. Pythoud","doi":"10.51202/9783181023907-111","DOIUrl":"https://doi.org/10.51202/9783181023907-111","url":null,"abstract":"","PeriodicalId":369516,"journal":{"name":"Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126459264","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
„Remote-leaded“ Annahmeprüfung für Koordinatenmessgeräte 反复无常
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-373
D. Imkamp, R. Friedel, D. Smolik, V. Greifzu, S. Maruyama, S. Miyazaki
{"title":"„Remote-leaded“ Annahmeprüfung für Koordinatenmessgeräte","authors":"D. Imkamp, R. Friedel, D. Smolik, V. Greifzu, S. Maruyama, S. Miyazaki","doi":"10.51202/9783181023907-373","DOIUrl":"https://doi.org/10.51202/9783181023907-373","url":null,"abstract":"","PeriodicalId":369516,"journal":{"name":"Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134623080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Frequenzkamm-gekoppelte Metrologielaser für den Einsatz in Nanopositionier- und Nanomessmaschinen 南级电波双弦动力镜和纳米探测仪使用
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-209
U. Blumroder, R. Fusl, E. Manske, P. Kochert, J. Flugge
{"title":"Frequenzkamm-gekoppelte Metrologielaser für den Einsatz in Nanopositionier- und Nanomessmaschinen","authors":"U. Blumroder, R. Fusl, E. Manske, P. Kochert, J. Flugge","doi":"10.51202/9783181023907-209","DOIUrl":"https://doi.org/10.51202/9783181023907-209","url":null,"abstract":"","PeriodicalId":369516,"journal":{"name":"Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021","volume":"337 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121117155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation of the measurement uncertainty in the 2D-instrument transfer function (ITF) characterization of areal surface topography measuring instruments 平面形貌测量仪器二维传递函数(ITF)表征中测量不确定度的研究
Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021 Pub Date : 1900-01-01 DOI: 10.51202/9783181023907-361
Z. Jiao, G. Dai, R. Tutsch
{"title":"Investigation of the measurement uncertainty in the 2D-instrument transfer function (ITF) characterization of areal surface topography measuring instruments","authors":"Z. Jiao, G. Dai, R. Tutsch","doi":"10.51202/9783181023907-361","DOIUrl":"https://doi.org/10.51202/9783181023907-361","url":null,"abstract":"","PeriodicalId":369516,"journal":{"name":"Messunsicherheit praxisgerecht bestimmen – Prüfprozesse in der industriellen Praxis 2021","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123248961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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