发布求助
文献互助 智能选刊 最新文献

Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation最新文献

筛选
英文 中文
Single-crystal x-ray diffraction at high pressures 高压下的单晶x射线衍射
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-10-01 DOI: 10.6028/JRES.069C.032
C. Weir, S. Block, G. Piermarini
{"title":"Single-crystal x-ray diffraction at high pressures","authors":"C. Weir, S. Block, G. Piermarini","doi":"10.6028/JRES.069C.032","DOIUrl":"https://doi.org/10.6028/JRES.069C.032","url":null,"abstract":"Construc tion and ope ration or a high·pressure single·c rys lal x·ray d iffract ion precess ion camera is described . The inslrument appears app li cable to single crystal s tudi es 10 pressures as high as al least 30 kilobars a nd te mperatures or a t leas l 250 °C. Application or Ih e instrume nl is illustrated by single crystal s tudi es or ice VI and ice VII. Unit cell parame ters are given ror these Iwo rorms or ice. Further modifications a nd app lications are di scussed.","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126278879","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 39
Equipment for single-crystal growth from the melt suitable for substances with a low melting point 用于从熔体中生长单晶的设备，适用于低熔点物质
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-07-01 DOI: 10.6028/JRES.069C.023
A. Horton, A. Glasgow
{"title":"Equipment for single-crystal growth from the melt suitable for substances with a low melting point","authors":"A. Horton, A. Glasgow","doi":"10.6028/JRES.069C.023","DOIUrl":"https://doi.org/10.6028/JRES.069C.023","url":null,"abstract":"Glass apparatus is described for the purification and growth of crystals \" 'ith melting points up to a bout 130 °C by a modifled Bridgman t echniquc . The tcmperatures of t he melt and the solid are mainta ined by two immiscible liquids at whose interface a sharp temperature drop ex ists. A scaled Pyrex tube conta ining the specimen is slowly lowered through t he interface . The specimen is mainta ined uncleI' its own vapor pressure in eon tact only with t he glass container . Pro vis ion is made for the removal of the last portions of the specimen t o solidify from each of several successive r ecrystallizations. The equipment has been found effective for the purification of trans-stilbene, dimethyl oxalate, benzoic acid, and benzene. It could also be used for careful studies of t hermal and ra diation st a bility of pure subsLanccs.","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129048698","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Improved ten-picofarad fused silica dielectric capacitor 改进的10皮法拉熔融硅介质电容器
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-07-01 DOI: 10.6028/JRES.069C.020
R. D. Cutkosky, L. H. Lee
{"title":"Improved ten-picofarad fused silica dielectric capacitor","authors":"R. D. Cutkosky, L. H. Lee","doi":"10.6028/JRES.069C.020","DOIUrl":"https://doi.org/10.6028/JRES.069C.020","url":null,"abstract":"","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124720570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 37
Errors in the series-parallel buildup of four-terminal resistors 四端电阻串并联时的误差
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-07-01 DOI: 10.6028/JRES.069C.021
C. Page
{"title":"Errors in the series-parallel buildup of four-terminal resistors","authors":"C. Page","doi":"10.6028/JRES.069C.021","DOIUrl":"https://doi.org/10.6028/JRES.069C.021","url":null,"abstract":"The use of n equal resistors (a) in series and (b) in para llel provides a n n2 : 1 ratio of potentially high acc uracy. Such devices are importan t for extending t he use of t he national one-ohm standard to t he hundred-ohm, and thence to the 10 ODD-ohm, level. Formulas are derived for t he error in t he ratio, expressed (a) in t erms of de ign tolera nce, and (b) in terms of first-order residual misadj ustments which combine to yield the secondorder error of t he ratio. It seems feasible to construct a 1: 100 ohm bu ild up device with a ratio un certa inty of less than. 1 in 108.","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124220578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Cryogenic behavior of selected magnetic materials 所选磁性材料的低温行为
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-07-01 DOI: 10.6028/JRES.069C.027
J. Gniewek, E. Ploge
{"title":"Cryogenic behavior of selected magnetic materials","authors":"J. Gniewek, E. Ploge","doi":"10.6028/JRES.069C.027","DOIUrl":"https://doi.org/10.6028/JRES.069C.027","url":null,"abstract":"","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"113 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124723852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Centerable rotator for measuring properties of crystals 测量晶体性质的可调心旋转器
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-07-01 DOI: 10.6028/jres.069c.022
C. Saylor, H. Lowey
{"title":"Centerable rotator for measuring properties of crystals","authors":"C. Saylor, H. Lowey","doi":"10.6028/jres.069c.022","DOIUrl":"https://doi.org/10.6028/jres.069c.022","url":null,"abstract":"By allowing thc unsupported portion of a spindle to bc relatively long so as to extcnd from t he rim of the microscope stage a ll t he way to the axis, simple controls can be provided for centering a crystal with respect to a horizonta l axis of rotation. III the device which is described, centration can be assured within about a mi cron. The a ngle of rotation with respect to a fixed position can be read with an error not greater than 0.05 degree.","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116666913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cartesian diver as a density comparator 笛卡尔潜水器作为密度比较器
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-07-01 DOI: 10.6028/JRES.069C.026
H. A. Bowman, R. Schoonover
{"title":"Cartesian diver as a density comparator","authors":"H. A. Bowman, R. Schoonover","doi":"10.6028/JRES.069C.026","DOIUrl":"https://doi.org/10.6028/JRES.069C.026","url":null,"abstract":"A hydrostat ic weighing system is described t hat provicies inciepenci (' nt valu ('s of apparent mass with a standard deviat ion of a bou t 0.2 microgra m. The ciefi ni t ion of \" inciep(, IHI<'n t\" used here includes the requirement t hat t he sample under observat ion be removed from Lhe water, dried, and recleaned between measurements. This precis ion is between one a nd two orders better than ex ist ing hydros tatic balances, a nd permits high-quali ty density measLU(,ments without r e course to large sample s izes . The system is used as a co mparator , hen ce t he absolute acc uracy of results can be no better t han t hat of t he standards used . Dntn are prese nted which were taken during experiments on two 2-gram pieces of s ingle cry s tal s ilicon, a nd the s tandard deviat ion ill dens ity of a s ingle determina tion was computed to be 4.4 X IO7 g/cm3 (0.22 ppm). The system is particularly well suited to detection of slight dens ity changes in small s ize sampl e'S. In this ser v ice, it is not subject to t he r eq uirement for high acc uracy standards. Data arc reportC'd on dens ity cha nges of abou t 50 ppm that occlllTed in a 250 m illi gram ceramic crysLal. Two independe nt determinat ions on t his change differed by only 7 percent.","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122321882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Phase and amplitude contrast microscopy in partially coherent light 部分相干光下的相位和振幅对比显微术
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-07-01 DOI: 10.6028/JRES.069C.024
M. De, P. Mondal
{"title":"Phase and amplitude contrast microscopy in partially coherent light","authors":"M. De, P. Mondal","doi":"10.6028/JRES.069C.024","DOIUrl":"https://doi.org/10.6028/JRES.069C.024","url":null,"abstract":"This paper describes the effects obt\" ined in phase contrast imagery with parLially coherent illumina tion of plmse objects. The objects chosen fol' study include simple Zernike type of periodic phase gratings of Lhe 00 form (i) A (1,)= l +i. L'l· cos wU and (ii) A (n)= l +i· ~ L'ln' cos nwn, with axial 0 1' oblique partially coherent n~l illumination. The concept of \"effective source\" has been utilized, and Lhe nonlinearit y in t he inLensity tm nsmission due to partial coherence has been analyzed in terms of \" fundamental contrasL\" and \"remnant.\"","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128862910","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Exposure time relations for Kossel microdiffraction photographs 科塞尔显微衍射照片的曝光时间关系
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-07-01 DOI: 10.6028/JRES.069C.025
H. Yakowitz, D. Vieth
{"title":"Exposure time relations for Kossel microdiffraction photographs","authors":"H. Yakowitz, D. Vieth","doi":"10.6028/JRES.069C.025","DOIUrl":"https://doi.org/10.6028/JRES.069C.025","url":null,"abstract":"\" The exposure t !me for a Kossel photograph may vary from n few seconds to a few hours. Iher?f.orc, It IS des lI 'a ble to be a ble to est imate the exposure t im e for various experim enta l cond ItIOns . lIence, semlempll\"l Cal r elatIOns for the exposure t im e of a K o sel microd iffract ion ~attern have been developed. ,Equat ions a re presented for bot h t ra nsmiss ion and back l efi ec tlOn I{o sel photographs. rhc e equat ions are testcd for validity u ing t ,vo different commmc ia lly a va dable x-ray fi lms . . It I ~ shown t hat t he agreement of act ual exposure t imes WIth predIc ted exposure t imes IS valid WI t hin 10 to 15 percent.","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128096275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Two-terminal dielectric measurements up to 6 x 108 Hz 双端介电测量高达6 × 108hz
Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation Pub Date : 1965-07-01 DOI: 10.6028/JRES.069C.019
M. Broadhurst, A. J. Bur
{"title":"Two-terminal dielectric measurements up to 6 x 108 Hz","authors":"M. Broadhurst, A. J. Bur","doi":"10.6028/JRES.069C.019","DOIUrl":"https://doi.org/10.6028/JRES.069C.019","url":null,"abstract":"","PeriodicalId":367668,"journal":{"name":"Journal of Research of the National Bureau of Standards, Section C: Engineering and Instrumentation","volume":"187 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1965-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114200080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信
小红书