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Multi-run Memory Tests for Pattern Sensitive Faults最新文献

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Introduction to Digital Memory 数字存储器概论
Multi-run Memory Tests for Pattern Sensitive Faults Pub Date : 2018-07-07 DOI: 10.1007/978-3-319-91204-2_1
I. Mrozek
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引用次数: 0
Basics of Functional RAM Testing 功能RAM测试基础
Multi-run Memory Tests for Pattern Sensitive Faults Pub Date : 2018-07-07 DOI: 10.1007/978-3-319-91204-2_2
I. Mrozek
{"title":"Basics of Functional RAM Testing","authors":"I. Mrozek","doi":"10.1007/978-3-319-91204-2_2","DOIUrl":"https://doi.org/10.1007/978-3-319-91204-2_2","url":null,"abstract":"","PeriodicalId":365189,"journal":{"name":"Multi-run Memory Tests for Pattern Sensitive Faults","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132966280","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Pseudo-Exhaustive Testing Based on March Tests 基于三月测试的伪穷举测试
Multi-run Memory Tests for Pattern Sensitive Faults Pub Date : 2018-07-07 DOI: 10.1007/978-3-319-91204-2_8
I. Mrozek
{"title":"Pseudo-Exhaustive Testing Based on March Tests","authors":"I. Mrozek","doi":"10.1007/978-3-319-91204-2_8","DOIUrl":"https://doi.org/10.1007/978-3-319-91204-2_8","url":null,"abstract":"","PeriodicalId":365189,"journal":{"name":"Multi-run Memory Tests for Pattern Sensitive Faults","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134070473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Multi-Run Tests Based on Address Changing 基于地址更改的多运行测试
Multi-run Memory Tests for Pattern Sensitive Faults Pub Date : 2018-07-07 DOI: 10.1007/978-3-319-91204-2_6
I. Mrozek
{"title":"Multi-Run Tests Based on Address Changing","authors":"I. Mrozek","doi":"10.1007/978-3-319-91204-2_6","DOIUrl":"https://doi.org/10.1007/978-3-319-91204-2_6","url":null,"abstract":"","PeriodicalId":365189,"journal":{"name":"Multi-run Memory Tests for Pattern Sensitive Faults","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124913730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Controlled Random Testing 对照随机检验
Multi-run Memory Tests for Pattern Sensitive Faults Pub Date : 2018-07-07 DOI: 10.1007/978-3-319-91204-2_4
I. Mrozek
{"title":"Controlled Random Testing","authors":"I. Mrozek","doi":"10.1007/978-3-319-91204-2_4","DOIUrl":"https://doi.org/10.1007/978-3-319-91204-2_4","url":null,"abstract":"","PeriodicalId":365189,"journal":{"name":"Multi-run Memory Tests for Pattern Sensitive Faults","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121538206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Multi-Run Tests Based on Background Changing 基于背景变化的多运行测试
Multi-run Memory Tests for Pattern Sensitive Faults Pub Date : 2018-07-07 DOI: 10.1007/978-3-319-91204-2_5
I. Mrozek
{"title":"Multi-Run Tests Based on Background Changing","authors":"I. Mrozek","doi":"10.1007/978-3-319-91204-2_5","DOIUrl":"https://doi.org/10.1007/978-3-319-91204-2_5","url":null,"abstract":"","PeriodicalId":365189,"journal":{"name":"Multi-run Memory Tests for Pattern Sensitive Faults","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126967051","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Multi-Cell Faults 多单元故障
Multi-run Memory Tests for Pattern Sensitive Faults Pub Date : 2018-07-07 DOI: 10.1007/978-3-319-91204-2_3
I. Mrozek
{"title":"Multi-Cell Faults","authors":"I. Mrozek","doi":"10.1007/978-3-319-91204-2_3","DOIUrl":"https://doi.org/10.1007/978-3-319-91204-2_3","url":null,"abstract":"","PeriodicalId":365189,"journal":{"name":"Multi-run Memory Tests for Pattern Sensitive Faults","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129425619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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