Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting最新文献_第2页

Loss reduction in distribution systems: a new approach using partitioning techniques 减少配电系统损耗:一种使用分区技术的新方法

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.299179

R. Sárfi, M. Salama, A. Vannelli, A. Chikhani

引用次数: 10

Automatic power management of desktop computers 桌面电脑的自动电源管理

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.299143

D. Tiller, D. Phil, G. Newsham

引用次数: 1

Soft switched capacitively coupled DC-AC converter for high power 高功率软开关电容耦合DC-AC变换器

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.298990

M. Ehsani, T.S. Wu

引用次数: 6

Droplet charge-to-mass ratio measurement in an EHD liquid-liquid extraction system EHD液-液萃取系统中液滴电荷质量比的测量

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.299124

W. He, J. Chang, M. Baird

{"title":"Droplet charge-to-mass ratio measurement in an EHD liquid-liquid extraction system","authors":"W. He, J. Chang, M. Baird","doi":"10.1109/IAS.1993.299124","DOIUrl":"https://doi.org/10.1109/IAS.1993.299124","url":null,"abstract":"An experimental investigation has been carried out in a rectangular lucite cell equipped with parallel electrode plates along the two sides of the cell. The droplets are formed at a grounded hollow electrode. Distilled water is used as the droplet phase and a viscous mineral oil is used as the continuous phase. Experiments have been conducted at various flow rates of the dispersed phase with quiescent continuous phase; the applied DC voltage is from 0 to 15 kV. Charge acquired on droplets both at the hollow electrode and downstream near the bottom of the cell was observed from hollow electrode current waveforms and by a Faraday-cup through direct sampling, respectively. The results reported from the present investigation, extending from the single discrete droplet regime (at low applied voltage) to the dispersed multidroplet regime (at high applied voltage), indicate that the modified Rayleigh instability model and the Vonnegut and Neubauer model can predict the maximum droplet charge acquired in liquid-liquid systems. The modified Vonnegut model can predict most of the experimental results when the applied electric field is high enough and EHD (electrohydrodynamic) forces become dominant.<<ETX>>","PeriodicalId":345027,"journal":{"name":"Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128368317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Control of a direct-drive DC motor by fuzzy logic 用模糊逻辑控制直驱直流电动机

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.298871

H. Le-Huy, M. Hamdi

引用次数: 22

Switching comparison of generation 1 and generation 2P-MCTs and ultrafast N-IGBTs 第一代和第一代p - mct和超快n - igbt的开关比较

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.299098

P.D. Kendle, V. Temple, S. Arthur

{"title":"Switching comparison of generation 1 and generation 2P-MCTs and ultrafast N-IGBTs","authors":"P.D. Kendle, V. Temple, S. Arthur","doi":"10.1109/IAS.1993.299098","DOIUrl":"https://doi.org/10.1109/IAS.1993.299098","url":null,"abstract":"Measurements have been made evaluating the switching and conduction characteristics of the first commercially available 600-V MCT (MOS controlled thyristor), the second-generation, 600-V MCT still under development, and a fast commercially N-IGBT (insulated-gate bipolar transistor). The data presented indicate that great strides have been made in improving the electrical performance of the P-MCT in the generation 2 device. Using the fmax curve as a figure of merit, the lower switching losses of the N-IGBT are favorable, under the test conditions used, compared to the generation 1 P-MCT up to approximately 50 A. The lower conduction losses of the MCT become the predominant factor for larger current levels. The generation 2 P-MCT combines the same conduction loss characteristics as its predecessor, with drastic reductions in turn-off switching times and losses. The combined effect gives the generation 2 P-MCT the lowest losses over the whole current and frequency range evaluated. The N-IGBT provides a better safe operating area than either of the P-MCTs, though capacitive snubbers can be employed to improve this situation.<<ETX>>","PeriodicalId":345027,"journal":{"name":"Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129336753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Development of fuzzy-logic processing objects for industrial control applications 工业控制应用中模糊逻辑处理对象的开发

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.299140

P. Lin

引用次数: 4

Short-circuit current calculation: a comparison between methods of IEC and ANSI standards using dynamic simulation as reference 短路电流计算:以动态仿真为参考的IEC和ANSI标准方法的比较

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.299168

Antonio Berizzi, A. Silvestri, Dario Zaninelli, S. Massucco

{"title":"Short-circuit current calculation: a comparison between methods of IEC and ANSI standards using dynamic simulation as reference","authors":"Antonio Berizzi, A. Silvestri, Dario Zaninelli, S. Massucco","doi":"10.1109/IAS.1993.299168","DOIUrl":"https://doi.org/10.1109/IAS.1993.299168","url":null,"abstract":"A comparison is presented between two of the most significant international standards for short-circuit calculation: the IEC 909 Standard and the ANSI/IEEE C37.010-1979. The ANSI standard is more oriented toward breaker selection while the IEC standard gives general guidelines for short-circuit current computation. A set of short-circuit currents, directly extracted from the standards or obtainable after some elaborations, were determined as values useful for the comparison. A detailed dynamic analysis performed by using a well-known program for electromagnetic simulation was used as reference for the comparison between the two standards. The comparison shows that the IEC 909 is somewhat more ponderous than the ANSI standard. Hypothesis and assumptions are more numerous and more detailed in the IEC 909 than in the ANSI standard. In the former standard, more information and more formulas about the possibility of neglecting motor contributions are presented, as well as the basis for determining whether short-circuit is to be considered near or far from generators. The results of calculations confirm that both standards give satisfactory approximations of the short-circuit currents, which are mostly on the safety side.<<ETX>>","PeriodicalId":345027,"journal":{"name":"Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130300014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 33

Transient thermal impedance modeling of semiconductor heat sinking 半导体散热的瞬态热阻抗建模

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.299072

K.H. Sueker

引用次数: 6

A miniature size electrostatic induction motor 微型静电感应电动机

Conference Record of the 1993 IEEE Industry Applications Conference Twenty-Eighth IAS Annual Meeting Pub Date : 1993-10-02 DOI: 10.1109/IAS.1993.299080

J. Moon, D.H. Lee

引用次数: 3