2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)最新文献

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UHS: An Ultra-fast Hybrid Storage Consolidating NVM and SSD in Parallel UHS:并行整合NVM和SSD的超高速混合存储
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10137151
Qingsong Zhu, Q. Cao, Jie Yao
{"title":"UHS: An Ultra-fast Hybrid Storage Consolidating NVM and SSD in Parallel","authors":"Qingsong Zhu, Q. Cao, Jie Yao","doi":"10.23919/DATE56975.2023.10137151","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137151","url":null,"abstract":"Non-Volatile Memory (NVM) with persistency and near-DRAM performance has been commonly used as first-level fast storage atop Solid-State Drives (SSDs) and Hard Disk Drives (HDDs), constituting classic hierarchy architecture to achieve high cost-performance. However, such NVM/SSD tiered storage overuses primary NVM with limited actual performance and under-utilizes secondary SSD with increasing bandwidth. Besides, NVM and SSD exhibit distinguished I/O characteristics, but are complementary for different I/O patterns. This motivates us to design a superior hybrid storage to fully exploit NVM and SSD simultaneously. In this paper, we propose UHS, an Ultra-fast Hybrid Storage consolidating NVM and SSD to reap their own merits with key enabled techniques. First, UHS builds a uniform yet heterogenous block-level storage view for the upper applications, e.g., file systems or key-value stores. UHS provides static address-mapping to explicitly partition the global block-space into coarse-grain NVM-zones and SSD-zones, which mainly serve the metadata and file data respectively. Second, UHS presents a fine-grain request-level NVM buffer to dynamically absorb small file-writes in runtime and then migrates them to the SSDs in the background. Third, UHS designs I/O-affinity write allocation and hash-based buffer indexing to trade off write gain and read cost of the NVM-buffer. Finally, UHS designs a multi-thread I/O model to take full advantage of parallelism in both NVM and SSD. We implement UHS and evaluate it under a variety of workloads. The experiments show that UHS outperforms SSD, NVM, Bcache-writeback (representative hierarchy storage), and Device-Mapper (state-of-the-art hybrid storage) up to 8X, 1.5X, 3.5X, and 6X respectively.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127012110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Lightweight and Adaptive Cache Allocation Scheme for Content Delivery Networks 一种面向内容分发网络的轻量级自适应缓存分配方案
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10136922
Ke Liu, Hua Wang, Ke Zhou, Cong Li
{"title":"A Lightweight and Adaptive Cache Allocation Scheme for Content Delivery Networks","authors":"Ke Liu, Hua Wang, Ke Zhou, Cong Li","doi":"10.23919/DATE56975.2023.10136922","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10136922","url":null,"abstract":"Content delivery networks (CDNs) caching systems usually use multi-tenant shared caching due to their operational simplicity. However, this approach often results in interference among applications. Dynamic cache allocation schemes based on miss ratio curve (MRC) could be a good choice except for its high computational overheads and performance fluctuations. In this paper, we propose a lightweight and adaptive cache allocation scheme for CDNs (LACA). Rather than searching near-optimal configurations for each tenant, LACA detects in real time whether any tenants are using cache space inefficiently (named abnormal tenants), and then adjusts space restricted within these abnormal tenants by constructing their local MRCs instead of the global ones. We have deployed LACA in Tencent's CDN system and LACA can reduce the miss ratio by 27.1 % and reduce the average user access latency by 28.5 ms. Compared with the-state-of-the-art schemes, LACA also achieves a higher-accuracy local MRC with marginal overhead.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127030996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ChiselFV: A Formal Verification Framework for Chisel ChiselFV:一个凿子的正式验证框架
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10137221
Mufan Xiang, Yongjian Li, Yongxin Zhao
{"title":"ChiselFV: A Formal Verification Framework for Chisel","authors":"Mufan Xiang, Yongjian Li, Yongxin Zhao","doi":"10.23919/DATE56975.2023.10137221","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137221","url":null,"abstract":"Modern digital hardware is becoming ever more complex. And agile development, an efficient idea in software development, has been introduced into hardware. Furthermore, as a new hardware construction language, Chisel helps to raise the level of hardware design abstraction with the support of object-oriented and functional programming. Chisel plays a crucial role in future hardware design and open-source hardware development. However, the formal verification for Chisel is still limited. In this paper, we propose ChiselFV, a formal verification framework that has supported detailed formal hardware property descriptions and integrated mature formal hardware verification flows based on SymbiYosys. It builds on top of Chisel and uses Scala to drive the verification process. Thus the framework can be seen as an extension of Chisel. ChiselFV makes it easy to verify hardware designs formally when implementing them in Chisel.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"65 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130594772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SPHERE-DNA: Privacy-Preserving Federated Learning for eHealth SPHERE-DNA:保护隐私的电子健康联邦学习
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10137048
J. Nurmi, Yinda Xu, J. Boutellier, Bo Tan
{"title":"SPHERE-DNA: Privacy-Preserving Federated Learning for eHealth","authors":"J. Nurmi, Yinda Xu, J. Boutellier, Bo Tan","doi":"10.23919/DATE56975.2023.10137048","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137048","url":null,"abstract":"The rapid growth of chronic diseases and medical conditions (e.g. obesity, depression, diabetes, respiratory and musculoskeletal diseases) in many OECD countries has become one of the most significant wellbeing problems, which also poses pressure to the sustainability of healthcare and economies. Thus, it is important to promote early diagnosis, intervention, and healthier lifestyles. One partial solution to the problem is extending long-term health monitoring from hospitals to natural living environments. It has been shown in laboratory settings and practical trials that sensor data, such as camera images, radio samples, acoustics signals, infrared etc., can be used for accurately modelling activity patterns that are related to different medical conditions. However, due to the rising concern related to private data leaks and, consequently, stricter personal data regulations, the growth of pervasive residential sensing for healthcare applications has been slow. To mitigate public concern and meet the regulatory requirements, our national multi-partner SPHERE-DNA project aims to combine pervasive sensing tech-nology with secured and privacy-preserving distributed privacy frameworks for healthcare applications. The project leverages local differential privacy federated learning (LDP-FL) to achieve resilience against active and passive attacks, as well as edge computing to avoid transmitting sensitive data over networks. Combinations of sensor data modalities and security architectures are explored by a machine learning architecture for finding the most viable technology combinations, relying on metrics that allow balancing between computational cost and accuracy for a desired level of privacy. We also consider realistic edge computing platforms and develop hardware acceleration and approximate computing techniques to facilitate the adoption of LDP-FL and privacy preserving signal processing to lightweight edge processors. A proof-of-concept (PoC) multimodal sensing system will be developed and a novel multimodal dataset will be collected during the project to verify the concept.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124220330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Aiding to Multimedia Accelerators: A Hardware Design for Efficient Rounding of Binary Floating Point Numbers 辅助多媒体加速器:二进制浮点数高效舍入的硬件设计
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10136931
Mahendra Rathor, Vishesh Mishra, Urbi Chatterjee
{"title":"Aiding to Multimedia Accelerators: A Hardware Design for Efficient Rounding of Binary Floating Point Numbers","authors":"Mahendra Rathor, Vishesh Mishra, Urbi Chatterjee","doi":"10.23919/DATE56975.2023.10136931","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10136931","url":null,"abstract":"Hardware accelerators for multimedia applications such as JPEG image compression and video compression are quite popular due to their capability of enhancing overall performance and system throughput. The core of essentially all lossy compression techniques is the quantization process. In the quantization process, rounding is performed to obtain integer values for the compressed images and video frames. The recent studies in the photo forensic research has revealed that the direct rounding e.g. round up or round down of floating point numbers results into some compression artifacts such as ‘JPEG dimples’. Therefore in the compression process, performing rounding to the nearest integer value is important especially for High Dynamic Range (HDR) photography and videography. Since rounding to the nearest integer is a data-intensive process, hence its realization as a dedicated hardware is imperative to enhance overall performance. This paper presents a novel high performance hardware architecture for performing rounding of binary floating point numbers to the nearest integer. Additionally, an optimized version of the basic hardware design is also proposed. The proposed optimized version provides 6.7% reduction in area and 7.4% reduction in power consumption in comparison to the proposed basic architecture. Furthermore, the integration of the proposed floating point rounding hardware with the design flow of the computing kernel of the compression processor is also discussed in the paper. The proposed rounding hardware architecture and the integrated design with the computing kernel of compression process have been implemented on an Intel FPGA. The average resource overhead due to this integration is reported to be less than 1%.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"144 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120880826","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
STSearch: State Tracing-based Search Heuristics for RTL Validation 基于状态跟踪的RTL验证搜索启发式
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10136970
Ziyue Zheng, Yangdi Lyu
{"title":"STSearch: State Tracing-based Search Heuristics for RTL Validation","authors":"Ziyue Zheng, Yangdi Lyu","doi":"10.23919/DATE56975.2023.10136970","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10136970","url":null,"abstract":"Branch coverage is important in the functional val-idation of Register-Transfer-Level (RTL) models. While random tests can cover the majority of easy-to-reach branches, there are still many hard-to-activate branches in today's industrial designs. These remaining corner branches are typically the source of bugs and hardware trojans. Directed test generation approaches using formal methods effectively activate a specific branch but are limited by the state explosion problem. Semi-formal methods, such as concolic testing, improve the scalability by exploring one path at a time. This paper presents a novel concolic testing framework to exercise the corner branches through state tracing-based search heuristics (STSearch). The proposed approach heuristically gen-erates and evaluates input sequences based on a novel heuristic indicator that evaluates the distance between the current state and the target branch condition. The heuristic indicator is designed to utilize both the static structural property of the design and the state from dynamic simulation. Compared to the existing concolic testing approaches, where a full new path is generated in each round by solving path constraints, the cycle-based heuristic search in the proposed approach is more effective and efficient. Experimental results show that our approach significantly outperforms the state-of-the-art approaches in both running time and memory usage.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121176353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Built-in Self-Test and Built-in Self-Repair Strategies Without Golden Signature for Computing in Memory 内存计算的内置自检和内置自修复策略
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10137074
Yu-Chih Tsai, Wen-Chien Ting, Chia-Chun Wang, Chia-Cheng Chang, Ren-Shuo Liu
{"title":"Built-in Self-Test and Built-in Self-Repair Strategies Without Golden Signature for Computing in Memory","authors":"Yu-Chih Tsai, Wen-Chien Ting, Chia-Chun Wang, Chia-Cheng Chang, Ren-Shuo Liu","doi":"10.23919/DATE56975.2023.10137074","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137074","url":null,"abstract":"This paper proposes built-in self-test (BIST) and built-in self-repair (BISR) strategies for computing in memory (CIM), including a novel test method and two repair schemes. They all focus on mitigating the impacts of inherent and in-evitable CIM inaccuracy on convolution neural networks (CNNs). Regarding the proposed BIST strategy, it exploits the distributive law to achieve at-speed CIM tests without storing testing vectors or golden results. Besides, it can assess the severity of the inherent inaccuracies among CIM bitlines instead of only offering a pass/fail outcome. In addition to BIST, we propose two BISR strategies. First, we propose to slightly offset the dynamic range of CIM outputs toward the negative side to create a margin for negative noises. By not cutting CIM outputs off at zero, negative noises are preserved to cancel out positive noises statistically, and accuracy impacts are mitigated. Second, we propose to remap the bitlines of CIM according to our BIST outcomes. Briefly speaking, we propose to map the least noisy bitlines to be the MSBs. This remapping can be done in the digital domain without touching the CIM internals. Experiments show that our proposed BIST and BISR strategies can restore CIM to less than 1% Top-1 accuracy loss with slight hardware overhead.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121360410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Device-Aware Test for Back-Hopping Defects in STT-MRAMs stt - mram回跳缺陷的器件感知测试
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10137071
S. Yuan, M. Taouil, M. Fieback, Hanzhi Xun, E. Marinissen, G. Kar, Sidharth Rao, S. Couet, S. Hamdioui
{"title":"Device-Aware Test for Back-Hopping Defects in STT-MRAMs","authors":"S. Yuan, M. Taouil, M. Fieback, Hanzhi Xun, E. Marinissen, G. Kar, Sidharth Rao, S. Couet, S. Hamdioui","doi":"10.23919/DATE56975.2023.10137071","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10137071","url":null,"abstract":"The development of Spin-transfer torque magnetic RAM (STT-MRAM) mass production requires high-quality dedicated test solutions, for which understanding and modeling of manufacturing defects of the magnetic tunnel junction (MTJ) is crucial. This paper introduces and characterizes a new defect called Back-Hopping (BH); it also provides its fault models and test solutions. The BH defect causes MTJ state to oscillate during write operations, leading to write failures. The characterization of the defect is carried out based on manufactured MTJ devices. Due to the observed non-linear characteristics, the BH defect cannot be modelled with a linear resistance. Hence, device-aware defect modeling is applied by considering the intrinsic physical mechanisms; the model is then calibrated based on measurement data. Thereafter, the fault modeling and analysis is performed based on circuit-level simulations; new fault primitives/models are derived. These accurately describe the way the STT-MRAM behaves in the presence of BH defect. Finally, dedicated march test and a Design-for-Test solutions are proposed.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114338782","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
SIMSnn: A Weight-Agnostic ReRAM-based Search-In-Memory Engine for SNN Acceleration SIMSnn:一种权重不可知的基于reram的SNN加速搜索引擎
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10136973
Fangxin Liu, Wenbo Zhao, Zongwu Wang, Xiaokang Yang, Li Jiang
{"title":"SIMSnn: A Weight-Agnostic ReRAM-based Search-In-Memory Engine for SNN Acceleration","authors":"Fangxin Liu, Wenbo Zhao, Zongwu Wang, Xiaokang Yang, Li Jiang","doi":"10.23919/DATE56975.2023.10136973","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10136973","url":null,"abstract":"Bio-plausible spiking neural networks (SNNs) have gained a great momentum due to its inherent efficiency of processing event-driven information. The dominant computation-matrix bit-wise And-Add operations-in SNN is naturally fit for process-in-memory architecture (PIM). The long input spike train of SNN and the bit-serial processing mechanism of PIM, however, incur considerable latency and frequent analog-to-digital conversion, offsetting the performance gain and energy-efficiency. In this paper, we propose a novel Search-in-Memory (SIM) architecture to accelerate the SNN inference, named SIMSnn. Rather than processing the input bit-by-bit over multiple time steps, SIMSnn can take in a sequence of spikes and search the result by parallel associative matches in the CAM crossbar. As a weight-agnostic SNN accelerator, SIMSnn can adapt to various evolving SNNs without rewriting the crossbar array.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"200 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114739333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ObfusLock: An Efficient Obfuscated Locking Framework for Circuit IP Protection† ObfusLock:一种有效的电路IP保护模糊锁定框架
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Pub Date : 2023-04-01 DOI: 10.23919/DATE56975.2023.10136964
You Li, Guannan Zhao, Yunqi He, H. Zhou
{"title":"ObfusLock: An Efficient Obfuscated Locking Framework for Circuit IP Protection†","authors":"You Li, Guannan Zhao, Yunqi He, H. Zhou","doi":"10.23919/DATE56975.2023.10136964","DOIUrl":"https://doi.org/10.23919/DATE56975.2023.10136964","url":null,"abstract":"With the rapid evolution of the IC supply chain, circuit IP protection has become a critical realistic issue for the semiconductor industry. One promising technique to resolve the issue is logic locking. It adds key inputs to the original circuit such that only authorized users can get the correct function, and it modifies the circuit to obfuscate it against structural analysis. However, there is a trilemma among locking, obfuscation, and efficiency within all existing logic locking methods that at most two of the objectives can be achieved. In this work, we propose ObfusLock, the first logic locking method that simultaneously achieves all three objectives: locking security, obfuscation safety, and locking efficiency. ObfusLock is based on solid mathematical proofs, incurs small overheads (<5% on average), and has passed experimental tests of various existing attacks.","PeriodicalId":340349,"journal":{"name":"2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"128 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125633422","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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