Electronic Packaging Science and Technology最新文献

筛选
英文 中文
Essence of Integrated Circuits and Packaging Design 集成电路与封装设计的本质
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch6
{"title":"Essence of Integrated Circuits and Packaging Design","authors":"","doi":"10.1002/9781119418344.ch6","DOIUrl":"https://doi.org/10.1002/9781119418344.ch6","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126991635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Artificial Intelligence in Electronic Packaging Reliability 电子封装可靠性中的人工智能
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch14
{"title":"Artificial Intelligence in Electronic Packaging Reliability","authors":"","doi":"10.1002/9781119418344.ch14","DOIUrl":"https://doi.org/10.1002/9781119418344.ch14","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"40 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130452888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electromigration 电迁移
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch10
{"title":"Electromigration","authors":"","doi":"10.1002/9781119418344.ch10","DOIUrl":"https://doi.org/10.1002/9781119418344.ch10","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117203595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Performance, Power, Thermal, and Reliability 性能,功率,热和可靠性
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch7
{"title":"Performance, Power, Thermal, and Reliability","authors":"","doi":"10.1002/9781119418344.ch7","DOIUrl":"https://doi.org/10.1002/9781119418344.ch7","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115449856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Solid‐State Reactions Between Copper and Solder 铜和焊料之间的固态反应
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch5
{"title":"Solid‐State Reactions Between Copper and Solder","authors":"","doi":"10.1002/9781119418344.ch5","DOIUrl":"https://doi.org/10.1002/9781119418344.ch5","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131600354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Cu‐to‐Cu and Other Bonding Technologies in Electronic Packaging 电子封装中的Cu - to - Cu和其他键合技术
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch2
{"title":"Cu‐to‐Cu and Other Bonding Technologies in Electronic Packaging","authors":"","doi":"10.1002/9781119418344.ch2","DOIUrl":"https://doi.org/10.1002/9781119418344.ch2","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121043101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Solid–Liquid Interfacial Diffusion Reaction (SLID) Between Copper and Solder 铜和焊料之间的固液界面扩散反应(slide)
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch4
{"title":"Solid–Liquid Interfacial Diffusion Reaction (SLID) Between Copper and Solder","authors":"","doi":"10.1002/9781119418344.ch4","DOIUrl":"https://doi.org/10.1002/9781119418344.ch4","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133761752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Randomly‐Oriented and (111) Uni‐directionally‐Oriented Nanotwin Copper 随机取向和(111)单向取向纳米孪晶铜
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch3
{"title":"Randomly‐Oriented and (111) Uni‐directionally‐Oriented Nanotwin Copper","authors":"","doi":"10.1002/9781119418344.ch3","DOIUrl":"https://doi.org/10.1002/9781119418344.ch3","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131229589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Irreversible Processes in Electronic Packaging Technology 电子封装技术中的不可逆过程
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch9
{"title":"Irreversible Processes in Electronic Packaging Technology","authors":"","doi":"10.1002/9781119418344.ch9","DOIUrl":"https://doi.org/10.1002/9781119418344.ch9","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"217 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133974059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Failure Analysis 失效分析
Electronic Packaging Science and Technology Pub Date : 2021-12-17 DOI: 10.1002/9781119418344.ch13
{"title":"Failure Analysis","authors":"","doi":"10.1002/9781119418344.ch13","DOIUrl":"https://doi.org/10.1002/9781119418344.ch13","url":null,"abstract":"","PeriodicalId":339473,"journal":{"name":"Electronic Packaging Science and Technology","volume":"42 11","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120996194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信