{"title":"Switching And Control Devices For DC-Supplied Distribution Systems","authors":"F. Mocci, M. Tosi","doi":"10.1109/ELECTR.1991.718298","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718298","url":null,"abstract":"Some technical solutions are presented for load management automation in dc distribution systems where peak reduction of maximum load is desired or energy availability is limited, such as in photovoltaic plants. A comparison is made between electro-mechanical and solid-state relays for use with a microprocessor-based control station. The design of the switching devices, based on the use of novel semiconductors, aims at achieving automatic variations of load layout, providing at the same time even more effective control and protection than conventional ac devices. Some experimental results are shown.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"112 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125560627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Accomodating Temporal Variations in Neural Networks","authors":"L. Gupta, M. R. Sayeh, A. M. Upadhye","doi":"10.1109/ELECTR.1991.718261","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718261","url":null,"abstract":"Neural networks are very effective pattern classifiers, however, a major limitation is that they are unsuitable for classifying patterns with inherent time-variations. This paper describes an approach to incorporate a temporal structure in a neural network system which will accomodate the time variations in local feature sets encountered in problems such as partial shape classification.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128796108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. W. Gutzman, J. J. Munson, H. Wiesel, R. L. Lawson
{"title":"Pilot Implementation Using CIM Technology","authors":"H. W. Gutzman, J. J. Munson, H. Wiesel, R. L. Lawson","doi":"10.1109/ELECTR.1991.718245","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718245","url":null,"abstract":"Implementation of a CIM (Computer Integrated Manufacturing) architecture and its associated products in a complex Manufacturing environment required detailed planning and precise execution. A shotgun approach will not work. Throughout the process of implementing CIM the following requirements are maintained: - The migration must not disrupt the existing business - Tactical solutions must converge over time with the strategic products - CIM solutions must coexist with current systems and processes This paper will describe i he necessary steps required for CIM implementation that meet the enterprise objectives, and the commitments, organization, and processes being used to simplify the business processes in support of a CIM environment and the migration of the information systems architecture.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122482176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Iridium - A Global Personal Communications System","authors":"B. Bertiger","doi":"10.1109/ELECTR.1991.718230","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718230","url":null,"abstract":"An evolution perhaps even a revolution is occurring in the way in which people are having their ability to communicate with each other extended. This revolution is fueled by the global economy of the developed nations as well as the expanding needs for communication services of the developing nations of the world. This desire for the extension of classical communication services has put a severe strain on one particular natural resource, the electromagnetic spectrum. Every country owns the same amount of this resource and though some need more than others, it cannot be traded from country to country. Thus the utilization of the spectrum has moved from the portion which is easily mined i.e. the -Low end of the spectrum to that which is more difficult to utilize -- the microwave region. Motorola has developed a system that brings the availability of wireless personal communications to every part of the globe. A key element in the implementation of this system is its ability to make microwaves, as a communications media, affordable for the average consumer. Affordability is pervasive, in that, it applies not only to the actual communication devices but to the effective and efficient use of the spectrum. The remainder of this paper will be devoted to describing this system -- called Iridium -- with attention to where the system extends the commercialization of microwave technology.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126766989","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Practical Cache Design Techniques For Today's RISC And CISC CPUS","authors":"J. Handy","doi":"10.1109/ELECTR.1991.718222","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718222","url":null,"abstract":"Cache memories are moving into the forefront of popularity. Most microprocessor system designers can now expect to be called upon to design or implement a cache at some time in their carreers. It is somewhat difficult deciding where to start when first confronted with the task of designing a cache from scratch. This paper will focus on techniques which can be used in microprocessor cache designs to improve system throughput. Examples are shown using Intel's i486 processor, and the P3000 RISC processor.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125923618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Health Hazards Of Weak Electromagnetic Fields?","authors":"K. Foster","doi":"10.1109/ELECTR.1991.718197","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718197","url":null,"abstract":"For the past several decades, public and scientific debates have continued over a shifting range of issues about possible adverse health effects of nonionizing electromagnetic fields. Electromagnetic fields are surely hazardous, at some level of exposure. However, the well-established hazards (such as shock and burn) are obvious, mundane, and easily avoided. Various exposure standards and engineering codes offer effective protection against them. More controversial is the possibility of hazard at lower levels of exposure. Hazards have been alleged by some critics to be associated with: low-level microwave or radiofrequency radiation, and electric and/or magnetic fields associated with video display terminals (VDTs), household appliances, neighborhood distribution lines, and high voltage power transmission lines. These critics cite diverse laboratory and epidemiologic studies to support their claims of subtle hazard. I describe the scientific background of one such issue: the possibility of increased cancer risk from exposure to 50-60 Hz electric or magnetic fields. I argue that the evidence for any such hazard is weak, and much of the problem arises from scientific ambiguity, which is a common feature of risk assessment.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126089869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Statistical Tolerance Methods For Manufacturing","authors":"S. Miller","doi":"10.1109/ELECTR.1991.718225","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718225","url":null,"abstract":"This goal of this paper is to present a computational methodology based upon statistical tolerance models that we have employed for many and diverse applications that has particular value as a concurrent engineering technique and, thus, a technique for improving product quality and reliability. We will present the generic framework that we follow that is common to all applications of this technique. Then we will give two real-life examples of applications of this methodology and how it was used to achieve several of the goals of concurrent and computer aided engineering.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128121474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Strategy For The Coming Global Electronics Market Of The 1990's","authors":"R. Stander","doi":"10.1109/ELECTR.1991.718193","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718193","url":null,"abstract":"The set of papers in this session deals with how to develop a strategy for global marketing of electronic products in the new environment of the 1990's. The pattern of market globalization and resulting strategies presented in this first paper is applicable to electronics firms home-based in any industrialized nation. However, the problem of eroding U.S. position in global electronics is obviously so serious that we really want to provide focus and perspective here. Equilibrium does not exist in competition (J. Schumpeter); the panorama of new technologies, products and market segments keeps changing. The balance is continually impacted by improved production techniques and new approaches to marketing. Though there may be some gloom about the U.S. electronics industry, the changes that are occurring for the 1990's will provide U.S. electronics firms as much chance as any if appropriate marketing and alliance strategies are pursued together with manufacturing and quality programs.","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133713108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Continuing Education And Professional Development","authors":"H. Roman","doi":"10.1109/ELECTR.1991.718236","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718236","url":null,"abstract":"","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132329287","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Data Acquisition And Instrument Control With Personal Computers","authors":"R. Almgren","doi":"10.1109/ELECTR.1991.718288","DOIUrl":"https://doi.org/10.1109/ELECTR.1991.718288","url":null,"abstract":"","PeriodicalId":339281,"journal":{"name":"Electro International, 1991","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121297051","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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