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Smart Card Research and Advanced Application Conference最新文献

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A Bit-Level Approach to Side Channel Based Disassembling 基于侧信道分解的位级方法
Smart Card Research and Advanced Application Conference Pub Date : 2019-11-11 DOI: 10.1007/978-3-030-42068-0_9
Valence Cristiani, Maxime Lecomte, Thomas Hiscock
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引用次数: 19
Yet Another Size Record for AES: A First-Order SCA Secure AES S-Box Based on (mathrm {GF}(2^8)) Multiplication AES的另一个大小记录:基于(mathrm {GF}(2^8))乘法的一阶SCA安全AES S-Box
Smart Card Research and Advanced Application Conference Pub Date : 2018-11-12 DOI: 10.1007/978-3-030-15462-2_8
Felix Wegener, A. Moradi
{"title":"Yet Another Size Record for AES: A First-Order SCA Secure AES S-Box Based on (mathrm {GF}(2^8)) Multiplication","authors":"Felix Wegener, A. Moradi","doi":"10.1007/978-3-030-15462-2_8","DOIUrl":"https://doi.org/10.1007/978-3-030-15462-2_8","url":null,"abstract":"","PeriodicalId":338028,"journal":{"name":"Smart Card Research and Advanced Application Conference","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128075914","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An In-Depth and Black-Box Characterization of the Effects of Laser Pulses on ATmega328P 激光脉冲对ATmega328P影响的深入黑盒表征
Smart Card Research and Advanced Application Conference Pub Date : 2018-11-12 DOI: 10.1007/978-3-030-15462-2_11
Dilip S. V. Kumar, A. Beckers, J. Balasch, Benedikt Gierlichs, I. Verbauwhede
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引用次数: 16
Convolutional Neural Network Based Side-Channel Attacks in Time-Frequency Representations 基于卷积神经网络的时频侧信道攻击
Smart Card Research and Advanced Application Conference Pub Date : 2018-11-12 DOI: 10.1007/978-3-030-15462-2_1
Guang Yang, Huizhong Li, Jingdian Ming, Yongbin Zhou
{"title":"Convolutional Neural Network Based Side-Channel Attacks in Time-Frequency Representations","authors":"Guang Yang, Huizhong Li, Jingdian Ming, Yongbin Zhou","doi":"10.1007/978-3-030-15462-2_1","DOIUrl":"https://doi.org/10.1007/978-3-030-15462-2_1","url":null,"abstract":"","PeriodicalId":338028,"journal":{"name":"Smart Card Research and Advanced Application Conference","volume":"191 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117155492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Improving Side-Channel Analysis Through Semi-supervised Learning 利用半监督学习改进侧信道分析
Smart Card Research and Advanced Application Conference Pub Date : 2018-11-12 DOI: 10.1007/978-3-030-15462-2_3
S. Picek, Annelie Heuser, A. Jović, Karlo Knezevic, Tania Richmond
{"title":"Improving Side-Channel Analysis Through Semi-supervised Learning","authors":"S. Picek, Annelie Heuser, A. Jović, Karlo Knezevic, Tania Richmond","doi":"10.1007/978-3-030-15462-2_3","DOIUrl":"https://doi.org/10.1007/978-3-030-15462-2_3","url":null,"abstract":"","PeriodicalId":338028,"journal":{"name":"Smart Card Research and Advanced Application Conference","volume":"4 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120883268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Exploiting JCVM on Smart Cards Using Forged References in the API Calls 在API调用中使用伪造引用利用智能卡上的JCVM
Smart Card Research and Advanced Application Conference Pub Date : 2018-11-12 DOI: 10.1007/978-3-030-15462-2_13
S. Volokitin
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引用次数: 1
Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse Engineering 电磁活动与逻辑活动:逆向工程的近场扫描
Smart Card Research and Advanced Application Conference Pub Date : 2018-11-12 DOI: 10.1007/978-3-030-15462-2_10
Marc Lacruche, P. Maurine
{"title":"Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse Engineering","authors":"Marc Lacruche, P. Maurine","doi":"10.1007/978-3-030-15462-2_10","DOIUrl":"https://doi.org/10.1007/978-3-030-15462-2_10","url":null,"abstract":"","PeriodicalId":338028,"journal":{"name":"Smart Card Research and Advanced Application Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115762525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Breaking All the Things - A Systematic Survey of Firmware Extraction Techniques for IoT Devices 打破所有的东西-物联网设备固件提取技术的系统调查
Smart Card Research and Advanced Application Conference Pub Date : 2018-11-12 DOI: 10.1007/978-3-030-15462-2_12
Sebastian Vasile, David F. Oswald, Tom Chothia
{"title":"Breaking All the Things - A Systematic Survey of Firmware Extraction Techniques for IoT Devices","authors":"Sebastian Vasile, David F. Oswald, Tom Chothia","doi":"10.1007/978-3-030-15462-2_12","DOIUrl":"https://doi.org/10.1007/978-3-030-15462-2_12","url":null,"abstract":"","PeriodicalId":338028,"journal":{"name":"Smart Card Research and Advanced Application Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115197915","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
Leakage Bounds for Gaussian Side Channels 高斯侧通道的泄漏边界
Smart Card Research and Advanced Application Conference Pub Date : 2017-11-13 DOI: 10.1007/978-3-319-75208-2_6
Thomas Unterluggauer, Thomas Korak, S. Mangard, R. Schilling, L. Benini, Frank K. Gürkaynak, M. Muehlberghuber
{"title":"Leakage Bounds for Gaussian Side Channels","authors":"Thomas Unterluggauer, Thomas Korak, S. Mangard, R. Schilling, L. Benini, Frank K. Gürkaynak, M. Muehlberghuber","doi":"10.1007/978-3-319-75208-2_6","DOIUrl":"https://doi.org/10.1007/978-3-319-75208-2_6","url":null,"abstract":"","PeriodicalId":338028,"journal":{"name":"Smart Card Research and Advanced Application Conference","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121296572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
An EM Fault Injection Susceptibility Criterion and Its Application to the Localization of Hotspots 电磁断层注入敏感性判据及其在热点定位中的应用
Smart Card Research and Advanced Application Conference Pub Date : 2017-11-13 DOI: 10.1007/978-3-319-75208-2_11
Maxime Madau, M. Agoyan, P. Maurine
{"title":"An EM Fault Injection Susceptibility Criterion and Its Application to the Localization of Hotspots","authors":"Maxime Madau, M. Agoyan, P. Maurine","doi":"10.1007/978-3-319-75208-2_11","DOIUrl":"https://doi.org/10.1007/978-3-319-75208-2_11","url":null,"abstract":"","PeriodicalId":338028,"journal":{"name":"Smart Card Research and Advanced Application Conference","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114806728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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