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Proceedings of the 15th Conference on Pattern Languages of Programs最新文献

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Thoughts on weak links and Alexandrian life in Scrum 关于Scrum中的薄弱环节和亚历山大式生活的思考
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753212
Pamela M. Rostal
{"title":"Thoughts on weak links and Alexandrian life in Scrum","authors":"Pamela M. Rostal","doi":"10.1145/1753196.1753212","DOIUrl":"https://doi.org/10.1145/1753196.1753212","url":null,"abstract":"This paper looks at the Scrum software development process through a lens that emphasizes small worldness, nestedness, and scale-freeness, all characteristic of networks that feature weak links between their modules. Scrum has gained popularity over the past decade as a means of delivering valuable software to its host organization on a regular basis. Since weak links characterize natural and social systems at every scale, practitioners of Scrum should be able to improve their teams' processes by applying lessons learned from studying weak links. When practitioners look for weak links directly, they may find the task daunting and ask the question: \"How can I tell whether weak links are strengthening or weakening my team's Scrum process if I can't even find them?\" For the answer, this paper looks to Christopher Alexander's characteristics of wholeness, integrity, or life -- strong centers, levels of scale, echoes, alternating repetition, and, in particular, the characteristic called deep interlock and ambiguity -- which may correlate with the presence of weak links.","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"549 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116245683","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The relation between design patterns and schema theory 设计模式与图式理论的关系
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753214
Christian Kohls, K. Scheiter
{"title":"The relation between design patterns and schema theory","authors":"Christian Kohls, K. Scheiter","doi":"10.1145/1753196.1753214","DOIUrl":"https://doi.org/10.1145/1753196.1753214","url":null,"abstract":"Patterns capture the design knowledge of experts. But how is this expertise represented by the expert? When we mine for patterns, what is the ground in which we seek? Are there patterns in our head? And if so, how do the patterns in our head relate to the design patterns in the real world and the patterns we document? This paper tries to give some answers by referring to the principles of psychological schema theory. Schemas are some sort of patterns in our heads. A special type of schema, the problem schema, has many features in common with design patterns. The paper will discuss how schemata are organized in memory, how they are activated and constructed. At the end, we will discuss implications for the mining of patterns.","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122834186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Coordinator-worker-context process pattern 协调者-工作人员-上下文流程模式
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753221
J. Liebenau
{"title":"Coordinator-worker-context process pattern","authors":"J. Liebenau","doi":"10.1145/1753196.1753221","DOIUrl":"https://doi.org/10.1145/1753196.1753221","url":null,"abstract":"This paper describes the Coordinator-Worker-Context process pattern---a pattern for designing processes that contain embedded elements responsible for ensuring proper execution and coordination. Coordinator-Worker-Context addresses some of the problems that occur in complex processes involving both human workers and automated systems.","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124570445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Quality of test specification by application of patterns 通过应用模式来提高测试规范的质量
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753200
J. Zander-Nowicka, P. Mosterman, I. Schieferdecker
{"title":"Quality of test specification by application of patterns","authors":"J. Zander-Nowicka, P. Mosterman, I. Schieferdecker","doi":"10.1145/1753196.1753200","DOIUrl":"https://doi.org/10.1145/1753196.1753200","url":null,"abstract":"Embedded system and software testing requires sophisticated methods, which are nowadays frequently supported by application of test patterns. This eases the test development process and contributes to the reusability and maintainability of the test specification. However, it does not guarantee the proper level of quality and test coverage in different dimensions of the test specification. In this paper the quality of the test is investigated and numerous metrics are defined. They are based mainly on the applied test patterns. They give a measure of quality for the test design and executed test cases with respect to a number of aspects. They also evidence the value of patterns application. If weighted, they enable to assess the executed tests.","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121950696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
The dynamic factory pattern 动态工厂模式
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753207
León Welicki, J. Yoder, R. Wirfs-Brock
{"title":"The dynamic factory pattern","authors":"León Welicki, J. Yoder, R. Wirfs-Brock","doi":"10.1145/1753196.1753207","DOIUrl":"https://doi.org/10.1145/1753196.1753207","url":null,"abstract":"The Dynamic Factory pattern describes a factory that can create product instances based on concrete type definitions stored as external metadata. This facilitates adding new products to a system without having to modify code in the factory class.","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121335747","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A pattern language for developing analog to digital converter data sampling firmware 用于开发模数转换器数据采样固件的模式语言
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753208
Sachin Bammi, Peter R. Swinburne, Adefeyike Odutayo
{"title":"A pattern language for developing analog to digital converter data sampling firmware","authors":"Sachin Bammi, Peter R. Swinburne, Adefeyike Odutayo","doi":"10.1145/1753196.1753208","DOIUrl":"https://doi.org/10.1145/1753196.1753208","url":null,"abstract":"Analog to digital converters (ADC) are widely used real-time data acquisition systems. This paper presents a pattern language for sampling data from analog to digital converters (ADC) by presenting commonly used best practices and providing advice on avoiding specific pitfalls in designing ADC data sampling/acquisition firmware. From the classification presented in the paper a user can potentially come up with 15 designs to sample ADCs. The paper first presents seven core patterns followed by three composite ones that the authors have seen being successfully applied in their domain and work experience.","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"358 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133267098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A catalogue of bug patterns for exception handling in aspect-oriented programs 面向方面程序中异常处理的错误模式目录
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753224
Roberta Coelho, A. Rashid, Arndt von Staa, J. Noble, U. Kulesza, C. Lucena
{"title":"A catalogue of bug patterns for exception handling in aspect-oriented programs","authors":"Roberta Coelho, A. Rashid, Arndt von Staa, J. Noble, U. Kulesza, C. Lucena","doi":"10.1145/1753196.1753224","DOIUrl":"https://doi.org/10.1145/1753196.1753224","url":null,"abstract":"Aspects allow a developer to externally add new functionality to a program. This additional functionality may also throw new exceptions that will flow through the program execution until they are handled. Moreover, aspects can also be used to handle exceptions thrown by base code or even other aspects. Unfortunately, exceptions thrown by aspects --- or exceptions that should be handled by them --- may flow through the program execution in unexpected ways leading to failures such as uncaught exceptions or exceptions being caught by the wrong handlers. In a previous empirical study we investigated the causes of such failures in Aspect-Oriented programs. In this paper we present causes of such failures as a catalogue of bug patterns for exception handling in Aspect-Oriented programs.","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134065442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Patterns for data and metadata evolution in adaptive object-models 自适应对象模型中数据和元数据演化的模式
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753203
H. Ferreira, F. F. Correia, León Welicki
{"title":"Patterns for data and metadata evolution in adaptive object-models","authors":"H. Ferreira, F. F. Correia, León Welicki","doi":"10.1145/1753196.1753203","DOIUrl":"https://doi.org/10.1145/1753196.1753203","url":null,"abstract":"An Adaptive Object-Model (AOM) is an architectural pattern based upon a dynamic meta-modeling technique where the object model of the system is explicitly defined as data to be interpreted at run-time. The object model encompasses the full specification of domain objects, states, events, conditions, constraints and business rules. Several design patterns, that have before been documented, describe a set of good-practices within this domain. This paper approaches data and metadata evolution issues in the context of AOMs, by describing three additional patterns --- History of Operations, System Memento and Migration. They establish ways to track, version, and evolve information, at the several abstraction levels that may exist in an AOM.","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"112 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114063733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Additional patterns for fearless change 无畏改变的附加模式
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753213
Mary Lynn Manns, L. Rising
{"title":"Additional patterns for fearless change","authors":"Mary Lynn Manns, L. Rising","doi":"10.1145/1753196.1753213","DOIUrl":"https://doi.org/10.1145/1753196.1753213","url":null,"abstract":"The patterns in this collection are an addition to those that appeared in our book Fearless Change: Patterns for Introducing New Ideas (Manns & Rising, 2005). Our passion for this topic didn't end when the book was published. Rather, we continued to read, observe, take extensive notes and, most importantly, listen to comments and suggestions from our readers. We have not stopped learning about leading change! As people exchange ideas about the environment, and exchange patterns, the overall inventory of patterns in the pattern pool keeps changing. ...Of course, this evolution will never end. (Alexander, C. A., The Timeless Way of Building) A pattern language and the patterns in it are living things. The work is never finished. We are grateful for the opportunity to share as we are learning. This paper contains the following new patterns: Wake-up Call, Town Meeting, Emotional Connection, Elevator Pitch, and Pick Your Battles. References to existing patterns in our book or in this paper appear in brackets, e.g. [Do Food]. Summaries for the existing patterns are in the Appendix. The patterns follow a variation of Alexander's format. Each pattern includes: • Name in bold • Alias (if applicable) • Abstract in bold • Opening Story in italics that conveys the essence of the pattern • Context • Problem statement in bold • Description of the Problem and Forces • \"Therefore\" in italics • Essence of the Solution in bold • Elaboration of the Solution • Resulting Context • Known Uses in italics","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131292072","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Report on the 2nd Workshop on Software Patterns and Quality: (SPAQu'08) 第二届软件模式与质量研讨会报告(spqu '08)
Proceedings of the 15th Conference on Pattern Languages of Programs Pub Date : 2008-10-18 DOI: 10.1145/1753196.1753198
H. Washizaki, Nobukazu Yoshioka, E. Fernández, Jan Jurjens
{"title":"Report on the 2nd Workshop on Software Patterns and Quality: (SPAQu'08)","authors":"H. Washizaki, Nobukazu Yoshioka, E. Fernández, Jan Jurjens","doi":"10.1145/1753196.1753198","DOIUrl":"https://doi.org/10.1145/1753196.1753198","url":null,"abstract":"We held the 2nd Workshop on Software Patterns and Quality (SPAQu'08) as a focus group of the 15th Conference on Pattern Languages of Programs (PLoP '08), to discuss the theoretical, social, technological and practical issues related to quality aspects of software patterns, including security aspects. In this report we summarize the objectives and results of the workshop.","PeriodicalId":332993,"journal":{"name":"Proceedings of the 15th Conference on Pattern Languages of Programs","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128715283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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