{"title":"Aging Mitigation Techniques for Microprocessors Using Anti-aging Software","authors":"H. Abbas, Mark Zwolinski, Basel Halak","doi":"10.1007/978-3-030-23781-3_3","DOIUrl":"https://doi.org/10.1007/978-3-030-23781-3_3","url":null,"abstract":"","PeriodicalId":326050,"journal":{"name":"Ageing of Integrated Circuits","volume":"140 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116516471","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Effects of Ageing on the Reliability and Performance of Integrated Circuits","authors":"Daniele Rossi","doi":"10.1007/978-3-030-23781-3_2","DOIUrl":"https://doi.org/10.1007/978-3-030-23781-3_2","url":null,"abstract":"","PeriodicalId":326050,"journal":{"name":"Ageing of Integrated Circuits","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122855220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On-Chip Ageing Monitoring and System Adaptation","authors":"L. Anghel, F. Cacho, R. Shah","doi":"10.1007/978-3-030-23781-3_6","DOIUrl":"https://doi.org/10.1007/978-3-030-23781-3_6","url":null,"abstract":"","PeriodicalId":326050,"journal":{"name":"Ageing of Integrated Circuits","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134109581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Helen-Maria Dounavi, Yiorgos Sfikas, Y. Tsiatouhas
{"title":"Aging Monitors for SRAM Memory Cells and Sense Amplifiers","authors":"Helen-Maria Dounavi, Yiorgos Sfikas, Y. Tsiatouhas","doi":"10.1007/978-3-030-23781-3_7","DOIUrl":"https://doi.org/10.1007/978-3-030-23781-3_7","url":null,"abstract":"","PeriodicalId":326050,"journal":{"name":"Ageing of Integrated Circuits","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130245906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}