{"title":"The Effects of Ageing on the Reliability and Performance of Integrated Circuits","authors":"Daniele Rossi","doi":"10.1007/978-3-030-23781-3_2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":326050,"journal":{"name":"Ageing of Integrated Circuits","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ageing of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-23781-3_2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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