2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)最新文献

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Towards Property Driven Hardware Security 走向财产驱动的硬件安全
Wei Hu, Alric Althoff, Armita Ardeshiricham, R. Kastner
{"title":"Towards Property Driven Hardware Security","authors":"Wei Hu, Alric Althoff, Armita Ardeshiricham, R. Kastner","doi":"10.1109/MTV.2016.12","DOIUrl":"https://doi.org/10.1109/MTV.2016.12","url":null,"abstract":"Secure hardware design is a challenging task due to the fact that security properties are difficult or impossible to model and subsequently verify using traditional hardware design tools. The \"state of the art\" for hardware design security relies heavily on functional verification, manual inspection, and code review to identify security vulnerabilities. This labor intensive process significantly reduces productivity while proving no guarantee that a security flaw will be identified. In this paper, we describe a property driven approach to hardware security, which allows automatic synthesis and verification of both qualitative and quantitative security properties. We address hardware security by enforcing information flow and statistical security properties. By incorporating a new security property specification language, such security properties can be specified, translated and verified using hardware design tools. We present design examples to demonstrate our property driven hardware security solution for proving isolation, detecting timing channel, eliminating hardware Trojan, and enforcing security related statistical properties.","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"236 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116093747","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Tough Bugs vs. Smart Tools - L2/L3 Cache Verification Using System Verilog, UVM and Verdi Transaction Debugging 棘手的bug vs.智能工具- L2/L3缓存验证使用系统Verilog, UVM和Verdi事务调试
V. Viswanathan, Juliet Runhaar, Doug Reed, Jun Zhao
{"title":"Tough Bugs vs. Smart Tools - L2/L3 Cache Verification Using System Verilog, UVM and Verdi Transaction Debugging","authors":"V. Viswanathan, Juliet Runhaar, Doug Reed, Jun Zhao","doi":"10.1109/MTV.2016.15","DOIUrl":"https://doi.org/10.1109/MTV.2016.15","url":null,"abstract":"Verdi's Transaction Debug helps record, visualize, analyze and debug transactions at higher level of abstractions. With recorders integrated inside the Verdi UVM libraries and convenient Verdi APIs, UVM sequences and user-level transactions are recorded automatically and available for debug. In this paper, we discuss some of L2/L3 SV/UVM test scenarios and how Verdi Transaction Debug was used to model and debug out-of-order transactions. For example, in a cache miss scenario, L3 forwards the request to external bus where four responses are fetched out of order. Using Verdi APIs, Centaur modeled the request as a Parent Transaction and the four Responses as Children Transactions. Verdi Transaction Debug was then used to quickly find the linked parent (Request) - children (Responses) transactions, which were spread across hundreds of clock cycles, by highlighting the related transactions. This allowed for quickly debugging failing tests due to missing responses or unfinished transactions.","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114455919","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An Efficient Scenario Based Testing Methodology Using UVM 一种基于场景的UVM测试方法
Khaled Fathy, K. Salah
{"title":"An Efficient Scenario Based Testing Methodology Using UVM","authors":"Khaled Fathy, K. Salah","doi":"10.1109/MTV.2016.14","DOIUrl":"https://doi.org/10.1109/MTV.2016.14","url":null,"abstract":"Most of modern verification architects use randomness supported by system verilog (SV) to enable defining a generic path for a test to follow. This generic path stresses on a subset of features, and allows randomization to explore corners in depth. Setting up such test case requires a well-defined stimulus generation methodology that consumes less time to cover all the corner-cases. Moreover, Off-the-shelf scenario libraries, synchronization and scheduling process methodology for the parallel stimuli need to be reused across several test cases. In this paper, a novel methodology for creating test scenarios is proposed. Moreover, making use of object oriented principles to build composite layered scenario sequences with a generic parallel stimuli synchronization process is introduced. The proposed methodology is built as a generic library code to be reused in many designs. The results of applying this methodology on test cases show enhancements on reusability, test cases count, coverage closure and performance.","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127056973","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Hardware-Based Workload Forensics and Malware Detection in Microprocessors 微处理器中基于硬件的工作负载取证和恶意软件检测
Liwei Zhou, Y. Makris
{"title":"Hardware-Based Workload Forensics and Malware Detection in Microprocessors","authors":"Liwei Zhou, Y. Makris","doi":"10.1109/MTV.2016.20","DOIUrl":"https://doi.org/10.1109/MTV.2016.20","url":null,"abstract":"We investigate the possibility of performing workload forensics and/or malware detection in microprocessors through exclusively hardware-based methodologies. Specifically, we first introduce a general architecture which a hardware-based forensics or malware detection method would need to follow, as well as the various processor-level information which could potentially be harnessed to ensure system security and/or integrity. In contrast to traditional forensics and/or malware detection methods implemented at the operating system (OS) and/or the hypervisor level, whose data logging and monitoring systems are vulnerable to spoofing attacks at the same level, moving implementation to hardware ensures immunity to such attacks. This work focuses on two recent incarnations of this general concept, illustrating the effectiveness of hardware-based forensics and/or malware detection. Several other recent methods related to this topic are also discussed. Experimental results corroborate that even a low-cost hardware implementation can facilitate highly successful forensics analysis and/or malware detection, while taking advantage of its innate immunity to software-based attacks.","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122168710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A Case Study: Pre-Silicon SoC RAS Validation for NoC Server Processor 案例研究:NoC服务器处理器的预硅SoC RAS验证
Senwen Kan, Matthew Lam, Tyler Porter, Jennifer Dworak
{"title":"A Case Study: Pre-Silicon SoC RAS Validation for NoC Server Processor","authors":"Senwen Kan, Matthew Lam, Tyler Porter, Jennifer Dworak","doi":"10.1109/MTV.2016.26","DOIUrl":"https://doi.org/10.1109/MTV.2016.26","url":null,"abstract":"In this paper, we propose a model along with a novel methodology to represent and validate a Network-On-Chip (NoC) server processor's Reliability, Availability, and Serviceability (RAS) functions during the pre-silicon design phase. The effectiveness of this methodology is demonstrated in a real-life use case on one of the most advanced NoC Server designs in the industry.","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133564396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Fake CPU: A Flexible and Simulation Cost-Effective UVC for Testing Shared Caches 假CPU:一个灵活和模拟成本效益的UVC测试共享缓存
S. Quirem, Prasad Krishna Saravu
{"title":"Fake CPU: A Flexible and Simulation Cost-Effective UVC for Testing Shared Caches","authors":"S. Quirem, Prasad Krishna Saravu","doi":"10.1109/MTV.2016.13","DOIUrl":"https://doi.org/10.1109/MTV.2016.13","url":null,"abstract":"The ability to perform a top-level simulation of a processor is hindered by simulation performance, which can be much slower than unit-level test benches. Simulation performance is also greatly reduced by the presence of an increasing number of cores in a top-level test bench. In this paper, we present the implementation of the Fake CPU UVC, a bus functional model which emulates a real CPU's behavior at its boundaries and drives stimulus alongside the RTL implementation of the CPU. The UVC allows for a much greater amount random stimulus to be driven to the shared cache concurrently with a real CPU with little loss in simulation performance. The UVC drives guided random or unconstrained random stimulus specified in a UVM sequence with transactions potentially aiming to represent high-level operations (stores, prefetches, etc.) or low-level bus transactions (reads, writebacks, etc).","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130019783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Transaction Level Power Modeling (TLPM) Methodology 事务级功率建模(TLPM)方法
Amr B. Darwish, M. El-Moursy, M. Dessouky
{"title":"Transaction Level Power Modeling (TLPM) Methodology","authors":"Amr B. Darwish, M. El-Moursy, M. Dessouky","doi":"10.1109/MTV.2016.21","DOIUrl":"https://doi.org/10.1109/MTV.2016.21","url":null,"abstract":"Power consumption is key specification in electronic design. Evaluating power consumption at early phase of product life cycle is important to decrease the number of the expensive design iterations. A methodology is proposed in this paper for dynamic power estimation using Transaction Level Modeling (TLM). The methodology exploits the existing tools for RTL simulation, design synthesis and SystemC prototyping to provide fast and accurate power estimation using Transaction Level Power Modeling (TLPM). Commercial IP timer is used to validate and evaluate the proposed methodology. Different scenarios are exercised to cover the functionality of the timer. Experimental results show the accuracy and efficiency of the methodology. The error in power estimation is less than 1.7%. Power estimation on TLM achieves upto 7x speedup in simulation time as compared to RTL.","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130090026","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
2.5D/3D Integration Technologies for Circuit Obfuscation 电路混淆的2.5D/3D集成技术
Yang Xie, Chongxi Bao, Yuntao Liu, Ankur Srivastava
{"title":"2.5D/3D Integration Technologies for Circuit Obfuscation","authors":"Yang Xie, Chongxi Bao, Yuntao Liu, Ankur Srivastava","doi":"10.1109/MTV.2016.17","DOIUrl":"https://doi.org/10.1109/MTV.2016.17","url":null,"abstract":"Attacks on hardware can take on many forms. As modern chips are designed and fabricated in a global supply chain, circuit designs are subject to counterfeiting, piracy, and malicious modification by untrusted foundries, which are known as supply chain attacks. In this paper, we first survey existing circuit obfuscation techniques that are proposed to thwart the aforementioned attacks. Then, we investigate the application of 2.5D/3D integration technologies in circuit obfuscation. We introduce a security-aware design flow that utilizes the 2.5D IC and logic locking technique to counter the supply chain attacks. Opportunities and challenges in the 2.5D/3D IC based security applications are highlighted.","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131657157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Multi-processor Memory Scoreboard: A Multi-processor Memory Ordering and Data Consistency Checker 多处理器内存记分牌:一个多处理器内存排序和数据一致性检查器
Prasad Krishna Saravu
{"title":"Multi-processor Memory Scoreboard: A Multi-processor Memory Ordering and Data Consistency Checker","authors":"Prasad Krishna Saravu","doi":"10.1109/MTV.2016.16","DOIUrl":"https://doi.org/10.1109/MTV.2016.16","url":null,"abstract":"In this paper a verification architecture called Multi-Processor Memory Scoreboard (also referred as MPMS, thechecker, the scoreboard in this paper) developed at SamsungAustin Research & Development Center is described. This isa RTL simulation based scoreboard which performs data consistency and memory ordering checks as required by ARMv8ISA memory model and finds RTL errors very close to thefailure point. Along with the knowledge of architectural memoryordering requirements, the scoreboard employs age-order andtime-order relations of instructions of the test programs andperforms data consistency and memory ordering checks.","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128628500","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Echoing the "Generality Concept" through the Bus Functional Model Architecture in Universal Verification Environments 通过通用验证环境中的总线功能模型体系结构响应“通用概念”
Ahmed El-Yamany
{"title":"Echoing the \"Generality Concept\" through the Bus Functional Model Architecture in Universal Verification Environments","authors":"Ahmed El-Yamany","doi":"10.1109/MTV.2016.18","DOIUrl":"https://doi.org/10.1109/MTV.2016.18","url":null,"abstract":"Verification acts as a major milestone in any semiconductorindustry. With the huge investment and time-to-marketpressure, the verification process must be expeditious and decisive. Since the introduction of the Universal Verification Environment(UVM) by Accellera in 2011, new techniques and packages aredeliberately added to facilitate the process of verification andgeneralize it as the UVM originally meant to act in order to, emphasize the reusability concept. This paper proposes a newlayer to be added in the UVM generic environments when thetheme of verification is the same for each intellectual property (IP) with only diversity in interfaces. We validate our concept througha generic verification environment for flash memory controllerswe proposed in a previous work. The paper uses the generalityconcept introduced to create an optimized generic (UVM) architecture to verify the main types of the flash memorycontrollers with much less effort and tediousness. This genericUVM architecture is developed to verify multiple protocols withgeneric-HOST-/Memory interfaces. The main type of memorycontrollers we are dealing with are the flash memory controllersas the Flex-One NAND, Open NAND Flash Interface–ONFI-,Embedded Multi-Media Card (e.MMC), Universal Flash Storage(UFS) and the SD-CARD memory controller examined with –opensource WB interface.","PeriodicalId":323077,"journal":{"name":"2016 17th International Workshop on Microprocessor and SOC Test and Verification (MTV)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128950795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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