{"title":"On-chip monitoring and compensation scheme with fine-grain body biasing for robust and energy-efficient operations","authors":"Islam A. K. M. Mahfuzul, H. Onodera","doi":"10.1109/ASPDAC.2016.7428045","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7428045","url":null,"abstract":"Aggressive technology scaling and strong demand for lowering supply voltage impose a serious challenge in achieving robust and energy-efficient circuit operation. This paper first overviews on device-circuit interactions to enable cross-layer resiliency, and energy optimization. We show that the ability to monitor and control device and circuit characteristics not only increase energy-efficiency by more than 20% but also relax the severe design constraints, which were required because of the uncertainties of variability. We then demonstrate two proof-of-concept circuits in a 65 nm process to show variability resiliency and energy optimization with local body biasing.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115635735","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Generating high coverage tests for SystemC designs using symbolic execution","authors":"Bin Lin, Zhenkun Yang, Kai Cong, Fei Xie","doi":"10.1109/ASPDAC.2016.7428006","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7428006","url":null,"abstract":"SystemC is a system-level modeling language increasingly adopted by the semiconductor industry. Quality assurance for SystemC designs is important, since undetected errors may propagate to final silicon implementations and become very costly to fix. The errors, if not fixed, can cause major damage and even endanger lives. However, quality assurance for SystemC designs is very challenging due to their object-oriented nature, event-driven simulation semantics, and inherent concurrency. In this research, we have developed an approach to generating high coverage tests for SystemC designs using symbolic execution. We have applied this approach to a representative set of SystemC designs. The results show that our approach is able to generate tests that provide high code coverage of the designs with modest time and memory usage. Furthermore, the experiment on a RISC CPU design with more than 2K lines of SystemC code demonstrates that our approach scales to designs of practical sizes.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123066048","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Lu, C. Chang, Zhao-Hong Chen, B. Yeh, Tai-Hua Lu, Peng-Yu Chen, Pin-Hao Tang, Kuen-Jong Lee, L. Chiou, Soon-Jyh Chang, Chien-Hung Tsai, C. Chen, Jai-Ming Lin
{"title":"A testable and debuggable dual-core system with thermal-aware dynamic voltage and frequency scaling","authors":"L. Lu, C. Chang, Zhao-Hong Chen, B. Yeh, Tai-Hua Lu, Peng-Yu Chen, Pin-Hao Tang, Kuen-Jong Lee, L. Chiou, Soon-Jyh Chang, Chien-Hung Tsai, C. Chen, Jai-Ming Lin","doi":"10.1109/ASPDAC.2016.7427980","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7427980","url":null,"abstract":"A sophisticated SoC chip that incorporates many design modules including 2 ARM-like CPUs, a dynamic voltage and frequency scaling (DVFS) design, a master/slave temperature sensing system, and an on-chip test/debug platform is developed and implemented with TSMC 90 nm technology. Measurement results validate the functions and efficiencies of the whole chip.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121222752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jacob Wurm, Khoa Hoang, Orlando Arias, A. Sadeghi, Yier Jin
{"title":"Security analysis on consumer and industrial IoT devices","authors":"Jacob Wurm, Khoa Hoang, Orlando Arias, A. Sadeghi, Yier Jin","doi":"10.1109/ASPDAC.2016.7428064","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7428064","url":null,"abstract":"The fast development of Internet of Things (IoT) and cyber-physical systems (CPS) has triggered a large demand of smart devices which are loaded with sensors collecting information from their surroundings, processing it and relaying it to remote locations for further analysis. The wide deployment of IoT devices and the pressure of time to market of device development have raised security and privacy concerns. In order to help better understand the security vulnerabilities of existing IoT devices and promote the development of low-cost IoT security methods, in this paper, we use both commercial and industrial IoT devices as examples from which the security of hardware, software, and networks are analyzed and backdoors are identified. A detailed security analysis procedure will be elaborated on a home automation system and a smart meter proving that security vulnerabilities are a common problem for most devices. Security solutions and mitigation methods will also be discussed to help IoT manufacturers secure their products.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126763931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Netlist reverse engineering for high-level functionality reconstruction","authors":"Travis Meade, Shaojie Zhang, Yier Jin","doi":"10.1109/ASPDAC.2016.7428086","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7428086","url":null,"abstract":"In a modern IC design flow, from specification development to chip fabrication, various security threats are emergent. Of particular concern are modifications made to third-party IP cores and commercial off-the-shelf (COTS) chips where no golden models are available for comparisons. Toward this direction, we develop a tool, named Reverse Engineering Finite State Machine (REFSM), that helps end-users reconstruct a high-level description of the control logic from a flattened netlist. We demonstrate that REFSM effectively recovers circuit control logic from netlists with varying degrees of complexity. Experimental results also showed that the developed tool can easily identify malicious logic from a flattened (or even obfuscated) netlist. If combined with chip level reverse engineering techniques, the developed REFSM tool can help detect the insertion of hardware Trojans in fabricated circuits.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115092023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A mutual auditing framework to protect IoT against hardware Trojans","authors":"Chen Liu, P. Cronin, Chengmo Yang","doi":"10.1109/ASPDAC.2016.7427991","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7427991","url":null,"abstract":"Internet-of-Things (IoT), wherein sensor nodes of different types are used to monitor different objects, are expected to be used in many critical domains. However, hardware Trojans, which are malicious modifications implanted in individual nodes, may utilize the wireless connection facility to leak confidential information or to collude with each other to cause catastrophic failures in the IoT. To defend against these types of network-level threats, our goal is to develop a lightweight framework to monitor communications in the IoT. Instead of relying on a centralized data center to monitor the behavior of all the nodes, we propose to exploit vendor diversity among the nodes to build a distributed framework wherein nodes monitor the trustworthiness of their neighbors. This mutual auditing scheme is able to detect any attempt to leak information or collude with other malicious nodes, thus constructing trustworthy communication channels between untrustworthy nodes.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"6 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116090027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Accurate remaining range estimation for Electric vehicles","authors":"Joonki Hong, Sang-Jae Park, N. Chang","doi":"10.1109/ASPDAC.2016.7428106","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7428106","url":null,"abstract":"EVs (Electric vehicle) generally have only around 22% driving ranges compared with ICEVs (Internal combustion engine vehicle) with a similar price range. Running out of the EV battery SoC (State of charge) while driving gives the same inconvenience as a vehicle breakdown. In this paper, we emphasize that an accurate remaining range estimation can efficiently mitigate the range anxiety of EV drivers. Most EV drivers reserve 30% of the on-dash estimated remaining range gauge of their EV because they do not trust the current remaining range estimation accuracy of production EVs. In other words, an accurate remaining range estimation is equivalent to increasing the EV battery capacity up to 30%. Just like the analogous concepts used in the power estimation of digital circuits, a model-based remaining range estimation consists of the two consecutive steps, a driving profile estimation and a power consumption estimation using the power model. In this paper, we focus on increasing the accuracy of the power model. We come up with a hybrid modeling methodology combining a physics equation based model with empirical data. We validate the accuracy of the hybrid model in the remaining range estimation with the target EV. We collect the power consumption, velocity, road inclination, etc. of the EV in every half second with an onboard monitoring system, a perform multivariable linear regression and create an accurate EV power model. The proposed remaining range estimation yields only 2.52% error while the state-of-the-art model-based EV remaining range estimation shows 9.33% error when the same future route and speed estimation are given.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114277544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design and allocation of loosely coupled multi-bit flip-flops for power reduction in post-placement optimization","authors":"Hyoungseok Moon, Taewhan Kim","doi":"10.1109/ASPDAC.2016.7428022","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7428022","url":null,"abstract":"Merging 1-bit flip-flops into multi-bit flip-flops in the post-placement stage is one of the most effective techniques for minimizing clock power. The obstacles that hinder the merging process for multi-bit flip-flops are (1) the input and output timing constraint on every flip-flop, (2) the area constraint on every partitioned bin in the placement plane, and (3) the routing capacity constraint on every bin edge. This work tries to eliminate constraint-1 and constraint-2 so that a full benefit of multi-bit flip-flops can be reaped. Precisely, rather than using the conventional structure of multi-bit flip-flops, we introduce a new style of multi-bit flip-flop, called loosely coupled multi-bit flip-flop (LC-MBFF). The merit of LC-MBFF is that the logically constituent 1-bit flip-flops in LC-MBFF can be physically apart (i.e., no relocation), providing no need to set aside white space in constraint-2 and no need to check timing in constraint-1. Utilizing LC-MBFFs, we propose a routability and clock-tree driven multi-bit flip-flop allocation algorithm, which fully explores the diverse allocation of LC-MBFF structures to maximally reduce clock power consumption. Experimental results with ISCAS89 and IWLS2005 benchmark circuits show that our proposed allocation algorithm using the newly designed multi-bit flip-flops is able to reduce on average the clock power by 8.50% while the best known multi-bit flip-flop allocation algorithm [7] reduces by 5.37%.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121879767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jian Deng, Haotian Liu, Kim Batselier, Yu-Kwong Kwok, N. Wong
{"title":"STORM: A nonlinear model order reduction method via symmetric tensor decomposition","authors":"Jian Deng, Haotian Liu, Kim Batselier, Yu-Kwong Kwok, N. Wong","doi":"10.1109/ASPDAC.2016.7428070","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7428070","url":null,"abstract":"Nonlinear model order reduction has always been a challenging but important task in various science and engineering fields. In this paper, a novel symmetric tensor-based order-reduction method (STORM) is presented for simulating large-scale nonlinear systems. The multidimensional data structure of symmetric tensors, as the higher order generalization of symmetric matrices, is utilized for the effective capture of high-order nonlinearities and efficient generation of compact models. Compared to the recent tensor-based nonlinear model order reduction (TNMOR) algorithm [1], STORM shows advantages in two aspects. First, STORM avoids the assumption of the existence of a low-rank tensor approximation. Second, with the use of the symmetric tensor decomposition, STORM allows significantly faster computation and less storage complexity than TNMOR. Numerical experiments demonstrate the superior computational efficiency and accuracy of STORM against existing nonlinear model order reduction methods.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127048647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Architecture design with STT-RAM: Opportunities and challenges","authors":"Ping Chi, Shuangchen Li, Yuanqing Cheng, Yu Lu, Seung H. Kang, Yuan Xie","doi":"10.1109/ASPDAC.2016.7427997","DOIUrl":"https://doi.org/10.1109/ASPDAC.2016.7427997","url":null,"abstract":"The emerging spin-transfer torque magnetic random-access memory (STT-RAM) has attracted a lot of interest from both academia and industry in recent years. It has been considered as a promising replacement of SRAM and DRAM in the cache and memory system design thanks to many advantages, including non-volatility, low leakage power, SRAM comparable read performance and read energy consumption, higher density than SRAM, better scalability than conventional CMOS technologies, and good CMOS compatibility. However, the disadvantages of STT-RAM, such as higher write energy and longer write latency than SRAM, also bring design challenges. This paper introduces state-of-the-art architectural approaches to adopt STT-RAM in the cache and memory system design by taking advantage of the opportunities brought by STT-RAM as well as overcoming the challenges.","PeriodicalId":320183,"journal":{"name":"2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123892790","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}