Fundamental Problems of Optoelectronics and Microelectronics最新文献

Formation of azimuthally and radially polarized Bessel light beams in one-dimensional photonic crystals having photorefractive properties 具有光折变特性的一维光子晶体中方位和径向偏振贝塞尔光束的形成

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-03-27 DOI: 10.1117/12.725710

S. Kurilkina, V. Belyi, N. Kazak, S. Shandarov, P. Ropot

引用次数: 0

Approach to retina optical coherence tomography image processing 视网膜光学相干断层成像图像处理方法

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-03-27 DOI: 10.1117/12.726454

J. Yuan, Ruihua Liu, Gao Xuan, Jun Yang, Libo Yuan

{"title":"Approach to retina optical coherence tomography image processing","authors":"J. Yuan, Ruihua Liu, Gao Xuan, Jun Yang, Libo Yuan","doi":"10.1117/12.726454","DOIUrl":"https://doi.org/10.1117/12.726454","url":null,"abstract":"Optical coherence tomography (OCT) is a recently developed imaging technology. By using Zeiss STRATUS OCT one could obtain clear tomography pictures of retina and macula lutea. The clinical use of image processing requires both medical knowledge and expertise in image processing techniques. This paper focused on processing of retina OCT image to design the automatic retina OCT image identification system that could help us evaluate retina, examine and clinically diagnose the fundus diseases. The motivation of our work is to extract the contour and highlight the feature area of the focus clearly and exactly. Generally it is related to image segmentation, enhancement and binarization etc. In the paper we try to reduce the image noise and make the symbolic area connected through color segmentation, low-pass filter and mathematical morphology algorithm etc., finally discern some common and different properties of postprocessing image compared with the real OCT image. Experiments were done on cystoid macular edema, macular hole and normal retina OCT image. The results show that the project raised is feasible and suitable for further image identification and classification according to ophthalmology criteria.","PeriodicalId":309501,"journal":{"name":"Fundamental Problems of Optoelectronics and Microelectronics","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131679906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

The amplification of stimulated Brillouin scattering in backward pumped S band distributed fiber Raman amplifier 反向泵浦S波段分布式光纤拉曼放大器中受激布里渊散射的放大

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-03-27 DOI: 10.1117/12.726523

Hongling Liu, Zai-xuan Zhang, Chenxia Li, Hai-fen Xu, Jian-feng Wang, Insoo Kim

引用次数: 0

Atomic motion in the thermal field of dissipative matter near the surface of material 材料表面附近耗散物质热场中的原子运动

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-03-05 DOI: 10.1117/12.726450

B. B. Averbukh, I. B. Averbukh

{"title":"Atomic motion in the thermal field of dissipative matter near the surface of material","authors":"B. B. Averbukh, I. B. Averbukh","doi":"10.1117/12.726450","DOIUrl":"https://doi.org/10.1117/12.726450","url":null,"abstract":"The theory of atomic motion in resonant radiation in the vicinity of the material surface has attracted considerable attention in recent years because of the possibility of applying the theory to different problems of micro- and nanophysics. In the present paper the influence of the thermal field on the atomic motion near the surface of dielectric matter is analyzed. Thermal field due to fluctuations of charge in matter, exist not only inside every dissipative matter but externally including standing waves and plane running waves. We derive expressions for the corresponding forces F1 and F2 and discuss their. If the distance z between the atom and surface is large ( kz >> 1 ) the force F2 which is independent from z is substantial. This force is directed opposite to atomic velocity. The spectral density of the F1 is proportional to the gradient of spectral density of thermal energy which is proportional (at z → 0 ) to z-3 . Therefore if the distance z is small ( kz << 1 ) the force F1 can be quite substantial. If the atomic frequency lie in the visible or infrared areas of spectrum the forces F1 and F2 tends to reflect the atom from the dielectric surface.","PeriodicalId":309501,"journal":{"name":"Fundamental Problems of Optoelectronics and Microelectronics","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116776433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Conoscopic methods of optic crystal research 光学晶体研究的视觉方法

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-03-05 DOI: 10.1117/12.726442

A. Syuy, V. Stroganov, V. Krishtop, Vladimir V. Lihtin

{"title":"Conoscopic methods of optic crystal research","authors":"A. Syuy, V. Stroganov, V. Krishtop, Vladimir V. Lihtin","doi":"10.1117/12.726442","DOIUrl":"https://doi.org/10.1117/12.726442","url":null,"abstract":"Since each year all are more grown different synthetic crystal since crystals find the most broad using in science and technology. Obviously, as important efficient and fine methods of the study and analysis crystal, including optical. The interference pictures play in optical method of the study crystal important role. At imposition two coherent bunches of the light with alike polarization appears the interference picture - a spatial interleaving maximum and minimum intensive. If coherent bunch are polarized mutually perpendicular, that interference picture does not appear, but result to interferences is a light circular or elliptical polarized. For observation of the interferences in this case necessary polarization interference bunch by means of analyzer to bring about one direction. The optical scheme is offered for observation conoscopic figures of the unusual type. They are received interference pictures with light bunch, having small angular divergence in the manner of parallel stripes, rings, ellipses. Experimental is determined border corner, under which occurs transition from standard conoscopic figure to quotient case. The optical spottiness exist on background conoscopic figures. As object of the study used the crystals LiNbO3, LiNbO3:Fe (0,3 %), LiNbO3:Ru (0,3%), LiNbO3:Fe+Cu (0,3+0,01 %), LiNbO3:Fe+Rh (0,3+0,01 %), LiJO3, Ba1-xSrxNb2,O6, KDP. Thicknesses crystal lies within the range of from 0,5 mm before 23 mm.","PeriodicalId":309501,"journal":{"name":"Fundamental Problems of Optoelectronics and Microelectronics","volume":"295 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116213346","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A novel fiber-mercury temperature sensor 一种新型纤维水银温度传感器

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-03-05 DOI: 10.1117/12.726506

Wentao Zhang, Jingyun Dai, Baochen Sun, Yan-liang Du

引用次数: 0

Goos-Hänchen shift in anisotropic left-handed materials Goos-Hänchen各向异性左手材料的位移

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-03-05 DOI: 10.1117/12.726475

Yongyuan Jiang, Yongqiang Zhang, Yao Fu, C. Hou, Zhongxiang Zhou, Xiu-Dong Sun

引用次数: 0

Research of photoprocesses in compositions of the polymer-semiconductor 聚合物半导体组成中的光过程研究

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-03-05 DOI: 10.1117/12.726613

D. Shtarev, I. Prosanov, A. A. Tsiganenko

{"title":"Research of photoprocesses in compositions of the polymer-semiconductor","authors":"D. Shtarev, I. Prosanov, A. A. Tsiganenko","doi":"10.1117/12.726613","DOIUrl":"https://doi.org/10.1117/12.726613","url":null,"abstract":"Solid heterogeneous photocatalytic system consisting of polyvinyl alcohol (PVA), ZnO and BiCl3 exhibits photosensitivity to UV light. Under irradiation the change of composition surface color occurs. In other words, direct blackening is produced by this way. Such material differs from similar systems by relatively high photosensitivity, simplicity and image stability. Therefore PVA-ZnO-BiCl3 composition can be regarded as a prospective material for the optical information recording and irradiation detecting. Some photostimulated processes which lead to direct blackening involve all components of composition. For the improvement of photosensitive characteristics (maximal density of blackening, sensitivity and so on) and production of a materials with predictable properties it is necessary to investigate which namely processes occur in this system under irradiation. Have a sequence of the processes known it is possible also to make a conclusion about underlying mechanism of photographic effect. To solve this problem it is necessarily first of all to determine which compounds are produced in photosensitive composition under irradiation.","PeriodicalId":309501,"journal":{"name":"Fundamental Problems of Optoelectronics and Microelectronics","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128831549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

The application of ultrasonic phased array system to the inspection of fillet weld of flat plate 超声波相控阵系统在平板角焊缝检测中的应用

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-03-05 DOI: 10.1117/12.725803

B. Shan, Hua Wang, Xin Wang, Z. Duan, J. Ou

{"title":"The application of ultrasonic phased array system to the inspection of fillet weld of flat plate","authors":"B. Shan, Hua Wang, Xin Wang, Z. Duan, J. Ou","doi":"10.1117/12.725803","DOIUrl":"https://doi.org/10.1117/12.725803","url":null,"abstract":"The ultrasonic phased array inspection imaging system was developed in this paper, which is integrated on the basis of the each module and the exploitation of subsystem, it is made up of computer, ultrasonic circuit system, scanning device, phased array transducer and imaging software. The ultrasonic phased array inspection imaging system has the functions of controlling ultrasonic transmission and reception, controlling sound beam steering and focusing, controlling scanner moving, receiving flaw information and position formation, restructuring flaw image and commenting damage. Experiment was done on the fillet weld block of T shape flat plate with some artifical flaws using the ultrasonic phased array system, the flaws characteristic could be exactly estimated through comparing and analyzing the flaws position in B-scan image and the waveform feature in A-scan curve, and the flaws size could be measured from the image of C-scan and D-scan. Experiment results indicate that the flaws detected by the manual ultrasonic inspection technology could be found over again by the ultrasonic phased array inspection technology, the flaws size measured by the latter is close to the former, the whole trend of development of flaws are factually imaging by the latter.","PeriodicalId":309501,"journal":{"name":"Fundamental Problems of Optoelectronics and Microelectronics","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129328066","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Nanosecond reverse saturable absorption in metal cluster cis-Cp*2Mo2S4Cu2I2•(CH2Cl2)2 solution 金属簇顺式- cp *2Mo2S4Cu2I2•(CH2Cl2)2溶液的纳秒可逆饱和吸收

Fundamental Problems of Optoelectronics and Microelectronics Pub Date : 2007-02-07 DOI: 10.1117/12.725711

Junyi Yang, Jihua Gu, Guang Shi, Yunbo Li, Yinglin Song, Z. Ren, J. Lang

{"title":"Nanosecond reverse saturable absorption in metal cluster cis-Cp*2Mo2S4Cu2I2•(CH2Cl2)2 solution","authors":"Junyi Yang, Jihua Gu, Guang Shi, Yunbo Li, Yinglin Song, Z. Ren, J. Lang","doi":"10.1117/12.725711","DOIUrl":"https://doi.org/10.1117/12.725711","url":null,"abstract":"Nonlinear absorptive property of a novel metal cluster cis-Cp*2Mo2S4Cu2I2•(CH2Cl2)2 in CH2Cl2 solution is studied by using an open-aperture Z-scan technique with laser pulse of 8ns pulse-width at the wavelength of 532nm .The experimental results shows that the cluster has strong nonlinear absorption under the 8ns pulse excitation. A picosecond time resolved pump-probe experiments at 532nm has been used to study the nonlinear origin of the cluster. The pump-probe response of the metal cluster is similar to that of C60 solution, which implies that the nonlinear mechanisms are the same of the two materials. By establishing a five-level model for the cluster, several nonlinear optical parameters, such as the relaxation time of the excited singlet state, the absorption cross sections of the excited state of the cluster arc obtained. According to the results of the experiments and numerical simulations, a conclusion can be obtained that, at 532nm , the effective absorption of the triplet state of the cluster solution is the dominant mechanism causing the reverse saturable absorption. The theoretical results are in good agreement with the experimental data, which not only shows the availability of the kinetic model but also demonstrates the close relationship between the nonlinear absorptive property of the cluster and its dynamic processes.","PeriodicalId":309501,"journal":{"name":"Fundamental Problems of Optoelectronics and Microelectronics","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122789794","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0