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Proposed for presentation at the NSREC 2021 in , .最新文献

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Comparing Atomic Scale Defects in Radiation and High Field Stress in Si/SiO2 MOSFETs. 比较Si/SiO2 mosfet在辐射和高场应力方面的原子尺度缺陷。
Proposed for presentation at the NSREC 2021 in , . Pub Date : 2021-06-01 DOI: 10.2172/1875033
F. Sharov, S. Moxim, P. Lenahan, G. Haase, D. Hughart
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