[1992] Proceedings Third International Symposium on Software Reliability Engineering最新文献

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An 'extended execution time' software reliability model “扩展执行时间”软件可靠性模型
W. Everett
{"title":"An 'extended execution time' software reliability model","authors":"W. Everett","doi":"10.1109/ISSRE.1992.285863","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285863","url":null,"abstract":"The use of software reliability growth models has become popular. However, the use of most such models is delayed until late in the software product life-cycle (i.e. during testing) as they require failure time data to determine the model parameters. Currently, there is only one model, the basic execution time (BET) model that can be applied earlier in the product life-cycle as its parameters can be related directly to software characteristics. The derivation of the BET model implies uniform execution of program instructions. However, branches and loops in software programs results in non-uniform execution of program instructions. This paper introduces an extension of the BET model, the extended execution time (EET) model that takes into account non-uniform execution of instructions. The non-uniform execution is accounted for by a parameter in the EET model that can be related to measurable characteristics of the software product. This paper further shows the EET model reduces to the BET when instruction execution is uniform and has behavior similar to the Musa-Okumoto logarithmic model in the limit as instruction execution becomes highly non-uniform.<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115307806","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Software quality metrics in space systems 空间系统中的软件质量度量
V. Valette, F. Vallée
{"title":"Software quality metrics in space systems","authors":"V. Valette, F. Vallée","doi":"10.1109/ISSRE.1992.285897","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285897","url":null,"abstract":"The French Space Agency uses a special computer environment to collect quality and reliability data on the software it develops, and to analyze and predict the performance potential of that software throughout its life cycle. The authors present the environment, along with the way data is organized and collected during software development and maintenance. They show the impact their work in this field has on complexity metrics and software reliability measurements. They present practical applications and results concerning quite a large number of space projects in a real context.<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122110205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Error-free software development for critical systems using the B-Methodology 使用b方法进行关键系统的无错误软件开发
M. Carnot, C. DaSilva, B. Dehbonei, F. Mejia
{"title":"Error-free software development for critical systems using the B-Methodology","authors":"M. Carnot, C. DaSilva, B. Dehbonei, F. Mejia","doi":"10.1109/ISSRE.1992.285893","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285893","url":null,"abstract":"A description is given of the process of software development for critical systems using the B-Methodology designed by J.R. Abrial. The author explains the insights of the B formal development process: specification and implementation through refinements where each refinement step is proved using axioms based on the first-order predicate logic and an extension of the Zermelo set theory. They present the techniques and related tools that facilitate the process of realizing and proving programs. Three tools are described: the typechecker, the proof-obligation generator and the prover. Two industrial critical software systems have been carried out using this methodology: the subway speed control under final on-site tests ( approximately 3000 lines of Modula-2) and the KVS French train speed control that is in the integration test phase ( approximately 15000 lines of Ada).<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128425008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
The discrete time hyperexponential model for software reliability growth evaluation 软件可靠性增长评估的离散时间超指数模型
M. Kaâniche, K. Kanoun
{"title":"The discrete time hyperexponential model for software reliability growth evaluation","authors":"M. Kaâniche, K. Kanoun","doi":"10.1109/ISSRE.1992.285857","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285857","url":null,"abstract":"This paper is devoted to the definition of a reliability growth model-referred to as the discrete time hyperexponential model. This model is aimed at modeling software reliability with respect to the number of executions performed. It is well-suited to some kinds of systems such as transaction processing systems, single mission systems, etc. for which discrete data are collected; in addition, it facilities the modeling of the impact on dependability measures of some software environment characteristics, such as the input probability distribution.<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129031816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Test coverage dependent software reliability estimation by the HGD model 基于HGD模型的测试覆盖率依赖性软件可靠性评估
R. Jacoby, Kaori Masuzawa
{"title":"Test coverage dependent software reliability estimation by the HGD model","authors":"R. Jacoby, Kaori Masuzawa","doi":"10.1109/ISSRE.1992.285845","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285845","url":null,"abstract":"The hyper-geometric distribution model (HGDM) has been presented as a software reliability growth model with the capability to make estimations for various kinds of real observed test-and-debug data. With the HGDM, the discovery and rediscovery of faults during testing and debugging has been discussed. One of the parameters, the 'ease of test' function w(i) represents the total number of faults discovered and rediscovered at a test instance. In this paper, the authors firstly show that the ease of test function w(i) can be expressed as a function of the test coverage for the software under test. Test coverage represents a measure of how much of the software has been tested during a test run. Furthermore, the ease of test function w(i) can integrate a user-experience based parameter c that represents the strength of test cases to discover faults. This parameter c allows the integration of information on the goodness of test cases into the estimation process. The application of the HGDM to a set of real observed data clearly shows that the test coverage measure can be integrated directly into the ease of test function w(i) of the model.<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129314846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Implementing operational profiles to measure system reliability 实现操作概要文件以度量系统可靠性
B. Juhlin
{"title":"Implementing operational profiles to measure system reliability","authors":"B. Juhlin","doi":"10.1109/ISSRE.1992.285896","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285896","url":null,"abstract":"A method is presented, devised for creating operational profiles (OPs) by 'decomposing' an OP into two components: a configuration profile (CP) and a usage profile (UP). This decomposition is necessary in order to reduce the broad variation in customer usage into a set of test environments (OPs) that can be implemented as part of a commercial product development/test process. These test environments must, of course, emulate actual customers closely enough so that the data gathered from the testing can be used to predict the reliability observed in the field. The author describes the decomposition of an operational profile into its components and provides examples from the project in which this method was first used (an AT&T International Private Branch Exchange development).<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129355277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
The scaling problem in neural networks for software reliability prediction 软件可靠性预测中神经网络的尺度问题
N. Karunanithi, Y. Malaiya
{"title":"The scaling problem in neural networks for software reliability prediction","authors":"N. Karunanithi, Y. Malaiya","doi":"10.1109/ISSRE.1992.285856","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285856","url":null,"abstract":"Recently, neural networks have been applied for software reliability growth prediction. Although the predictive capability of the neural network models are better than some of the well known analytic models, the scaling problem has not been completely addressed yet. With the present neural network models, it is necessary to scale the cumulative faults over a 0.0 to 1.0 range, so the user has to estimate in advance a maximum value for the total number of faults to be detected at the end of the test phase. In practice, such an estimate may not be accurate. Use of an inaccurate value for scaling the cumulative faults can severely affect the predictive capability of neural network models. This paper presents a solution to the scaling problem which uses a clipped linear unit in the output layer. With a clipped linear output unit, the neural networks can predict positive values in any unbounded range. The authors demonstrate the applicability of the proposed network structure with three data sets and compare its predictive accuracy with that of earlier models. Expressions for the failure rate process represented by the models of the proposed network structure are also derived.<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131027704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 39
Enhanced availability of transaction oriented systems using failure tests 使用故障测试增强了面向事务的系统的可用性
E. Gelenbe, M. Hernández
{"title":"Enhanced availability of transaction oriented systems using failure tests","authors":"E. Gelenbe, M. Hernández","doi":"10.1109/ISSRE.1992.285905","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285905","url":null,"abstract":"For a transaction oriented system, the authors propose that in addition to the conventional recovery techniques, such as dumps and roll-back recovery, system availability be enhanced by the introduction of 'failure tests'. They present a model to analyze the effect of the failure rate, the failure tests, and the periodic dumps, on global system availability. They then compute the optimum value of the interval between dumps, and also the best time interval between failure tests for this system. Numerical examples are presented for various failure models.<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129092868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
The operational profile in software reliability engineering: an overview 软件可靠性工程中的操作概要:概述
J. Musa
{"title":"The operational profile in software reliability engineering: an overview","authors":"J. Musa","doi":"10.1109/ISSRE.1992.285850","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285850","url":null,"abstract":"Provides an overview of a step-by-step approach for developing the operational profile used in software reliability engineering. The operational profile can help guide managerial and engineering decisions throughout the product life cycle, including requirements specification, design, implementation and testing. It is particularly valuable in guiding test planning and testing. The development and use of this profile typically involves product and market managers and systems engineers. It is used by software developers and managers, system test planners and testers, and quality assurance and reliability engineers. The presented material has been drawn from experience in developing operational profiles for a variety of applications.<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126622446","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 73
The Schneidewind software reliability model revisited 重新审视Schneidewind软件可靠性模型
M. Xie, Ming Zhao
{"title":"The Schneidewind software reliability model revisited","authors":"M. Xie, Ming Zhao","doi":"10.1109/ISSRE.1992.285846","DOIUrl":"https://doi.org/10.1109/ISSRE.1992.285846","url":null,"abstract":"A software reliability model based on a nonhomogeneous Poisson process (NHPP) was proposed by N.F. Schneidewind (Sigplan Notices, vol.10, p.337, 1975). Since then, many other NHPP models have been suggested and studied by various authors. The authors show that several NHPP models can be derived based on the general assumptions made by Schneidewind. Also, they note that in the original paper, there are several interesting approaches worth further consideration. To mention a few, Schneidewind modelled both the software correction process and the software detection process. Methods of weighted least squares were adopted together with the software reliability forecasting based on previous measurements. In this paper, the Schneidewind model is revisited and some further research result are presented.<<ETX>>","PeriodicalId":296290,"journal":{"name":"[1992] Proceedings Third International Symposium on Software Reliability Engineering","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127802995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 87
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