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Electron Microscopy in Science and Engineering最新文献

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In-Situ Transmission Electron Microscopy Investigation of Phase Transformation Behavior of Alloy Nanoparticles 合金纳米颗粒相变行为的原位透射电镜研究
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_8
Khushubo Tiwari, K. Biswas
{"title":"In-Situ Transmission Electron Microscopy Investigation of Phase Transformation Behavior of Alloy Nanoparticles","authors":"Khushubo Tiwari, K. Biswas","doi":"10.1007/978-981-16-5101-4_8","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_8","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123145496","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fostering Morphological Mutations to Metal Nucleobase Complexes 培养金属核碱基配合物的形态突变
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_9
R. Kamal Saravanan, Ilesha Avasthi, R. K. Prajapati, S. Verma
{"title":"Fostering Morphological Mutations to Metal Nucleobase Complexes","authors":"R. Kamal Saravanan, Ilesha Avasthi, R. K. Prajapati, S. Verma","doi":"10.1007/978-981-16-5101-4_9","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_9","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123683621","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electron Probe Micro-Analyzer: An Equipment for Accurate and Precise Micro-Composition Analysis 电子探针微量分析仪:一种精确的微量成分分析设备
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_6
K. Kulkarni, Aparna Tripathi, Abhinav Varshney, J. Chandra, Siva Kumar, S. Sangal, D. Paul, Kallol Mondal
{"title":"Electron Probe Micro-Analyzer: An Equipment for Accurate and Precise Micro-Composition Analysis","authors":"K. Kulkarni, Aparna Tripathi, Abhinav Varshney, J. Chandra, Siva Kumar, S. Sangal, D. Paul, Kallol Mondal","doi":"10.1007/978-981-16-5101-4_6","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_6","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134141462","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Nanosciences and Advanced Imaging Centre: Unravelling Attributes by Electron Microscopy 纳米科学和高级成像中心:通过电子显微镜揭示属性
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_7
R. K. Prajapati, M. Kulkarni, P. Dwivedi, S. Sivakumar
{"title":"Nanosciences and Advanced Imaging Centre: Unravelling Attributes by Electron Microscopy","authors":"R. K. Prajapati, M. Kulkarni, P. Dwivedi, S. Sivakumar","doi":"10.1007/978-981-16-5101-4_7","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_7","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133119907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of Electron Backscatter Diffraction (EBSD) Method in Earth Sciences 电子背散射衍射(EBSD)方法在地球科学中的应用
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_5
D. Dutta, Vikram Maji, Saquib Abdullah, S. Misra
{"title":"Application of Electron Backscatter Diffraction (EBSD) Method in Earth Sciences","authors":"D. Dutta, Vikram Maji, Saquib Abdullah, S. Misra","doi":"10.1007/978-981-16-5101-4_5","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_5","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132589262","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Interplay of Stresses, Interfaces, and Nanoscale Effects: TEM Investigations 应力、界面和纳米效应的相互作用:透射电镜研究
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_10
A. Subramaniam, R. Raghavendra, G. Iyer, Arun Kumar
{"title":"Interplay of Stresses, Interfaces, and Nanoscale Effects: TEM Investigations","authors":"A. Subramaniam, R. Raghavendra, G. Iyer, Arun Kumar","doi":"10.1007/978-981-16-5101-4_10","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_10","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128765708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Small-Scale Deformation Experiments Inside an SEM 扫描电镜内的小尺度变形实验
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_1
S. Basu
{"title":"Small-Scale Deformation Experiments Inside an SEM","authors":"S. Basu","doi":"10.1007/978-981-16-5101-4_1","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_1","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134338836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Exploring Carbon Surface Using Electron Microscopy: Applications to Energy, Environment, and Health 利用电子显微镜探索碳表面:在能源、环境和健康方面的应用
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_3
P. Gupta, N. Verma
{"title":"Exploring Carbon Surface Using Electron Microscopy: Applications to Energy, Environment, and Health","authors":"P. Gupta, N. Verma","doi":"10.1007/978-981-16-5101-4_3","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_3","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"177 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121073675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electron Backscatter Diffraction Technique: Fundamentals to Applications 电子背散射衍射技术:基础到应用
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_4
Shashank Shekhar, N. Sharma, S. Sahu, S. Misra
{"title":"Electron Backscatter Diffraction Technique: Fundamentals to Applications","authors":"Shashank Shekhar, N. Sharma, S. Sahu, S. Misra","doi":"10.1007/978-981-16-5101-4_4","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_4","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127185307","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
In-Situ Micromechanical Testing in Scanning Electron Microscopy 扫描电镜原位微力学测试
Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI: 10.1007/978-981-16-5101-4_2
R. Sarvesha, S. Singh
{"title":"In-Situ Micromechanical Testing in Scanning Electron Microscopy","authors":"R. Sarvesha, S. Singh","doi":"10.1007/978-981-16-5101-4_2","DOIUrl":"https://doi.org/10.1007/978-981-16-5101-4_2","url":null,"abstract":"","PeriodicalId":268275,"journal":{"name":"Electron Microscopy in Science and Engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126672151","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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