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Interplay of Stresses, Interfaces, and Nanoscale Effects: TEM Investigations

Electron Microscopy in Science and Engineering Pub Date : 1900-01-01 DOI:10.1007/978-981-16-5101-4_10
A. Subramaniam, R. Raghavendra, G. Iyer, Arun Kumar
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应力、界面和纳米效应的相互作用:透射电镜研究
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Electron Microscopy in Science and Engineering
Electron Microscopy in Science and Engineering
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