{"title":"From electronic photography to seeing chips-the future of image sensing","authors":"P. Seitz","doi":"10.1109/AT.1995.535967","DOIUrl":"https://doi.org/10.1109/AT.1995.535967","url":null,"abstract":"Thanks to the advances of semiconductor technology, solid state image sensors with impressive properties can be realized today: CCDs with 26 million pixels are commercially available. Pixel size has been reduced to 5/spl times/5 /spl mu/m/sup 2/ and less. This enables one to integrate electronic circuitry with each pixel, providing added functionality for custom photo-ASICs and smart image sensors: single-chip cameras with on-chip analog-to-digital converters for less than $20 are advertised; image sensors have been developed including novel functionality such as real-time selectable pixel size and shape, the capability of performing arbitrary convolutions simultaneously with the exposure, as well as variable, programmable sensitivity of the pixels leading to image sensors with a dynamic range exceeding 100 dB. It is concluded that the possibilities offered with custom smart image sensors will influence the design and the performance of future imaging systems in many disciplines, reaching from optical metrology to machine vision on the factory floor and in robotics applications.","PeriodicalId":268081,"journal":{"name":"AT'95: Advanced Technologies Intelligent Vision","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125313853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"High precision optical measurement with smart photosensors","authors":"S. Schneider, U. Benner","doi":"10.1109/AT.1995.535970","DOIUrl":"https://doi.org/10.1109/AT.1995.535970","url":null,"abstract":"The smart integrating photosensor is described. A scale (linear or circular code and incremental track) is displayed on a specially designed detector by means of a simple telecentric imaging system. The arrangement is also realised in the reflective illumination mode. The code track detector is capable of 20-bit resolution. If a bit on the scale has length X, a length of 220 times X can therefore be encoded. The resolution of this system is X. Now it's the turn of the incremental detector. It is designed in such a way that the image of the incremental track is converted into four quasi harmonic-free photo current signals offset by 90/spl deg/ during the scanning process. Signals of this quality are converted by electronic interpolators into digital signals whose resolution is limited by the detector noise. It has been proved that the incremental system achieves a resolution of X/256.","PeriodicalId":268081,"journal":{"name":"AT'95: Advanced Technologies Intelligent Vision","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116854738","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Active pixels for image sensing with programmable, high dynamic range","authors":"O. Vietze, P. Seitz","doi":"10.1109/AT.1995.535969","DOIUrl":"https://doi.org/10.1109/AT.1995.535969","url":null,"abstract":"A novel silicon solid-state photodetector pixel structure is presented which exhibits an enhanced dynamic range. This is achieved by subtraction an offset current from the pixel's photosite while retaining a linear readout characteristic. The offset current can be programmed by a specific programming voltage. This novel circuit is suitable for conventional photodiode sensor architectures as well as for the recently demonstrated active pixel sensor (APS) concepts with improved fixed pattern and readout noise performance. Experimental results from a single pixel test-cell fabricated on a standard 2/spl mu/ CMOS-process show a programmable offset range of >140 dB with a dynamic range of >50 dB for a given offset current. Arranged in a linear or two-dimensional array, this basic photodetector cell is useful for image sensors in machine vision and optical metrology applications.","PeriodicalId":268081,"journal":{"name":"AT'95: Advanced Technologies Intelligent Vision","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129368874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Smart CCD image sensors for optical metrology and machine vision","authors":"T. Spirig, P. Seitz, O. Vietze","doi":"10.1109/AT.1995.535968","DOIUrl":"https://doi.org/10.1109/AT.1995.535968","url":null,"abstract":"Two types of CCD image sensors are described. The first sensor is a two-dimensional, synchronous detector/demodulator (\"Lock-In CCD\") of spatially modulated light fields for applications in heterodyne interferometry and time-of-flight range imaging. Simultaneous measurements of amplitude, phase and background level are carried out at each pixel site. This is made possible by the principle of synchronized, periodic multi-tap sampling and photo charge accumulation. The second sensor, the \"Convolver CCD\" is capable of performing image acquisition and real-time, parallel convolution with an arbitrary kernel. Tap weight accuracies of typically 2% of the largest tap values have been obtained for a variety of linear filters that are commonly used in machine vision. The sensors have been realized by using a commercially available multi-project wafer CMOS/CCD process. For both sensors, the principle, design, operation and measurement results are presented and discussed.","PeriodicalId":268081,"journal":{"name":"AT'95: Advanced Technologies Intelligent Vision","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129997549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"From sensors to microsystems: a case study","authors":"N. Bui, G. Visalli, P. Monney, V. Vitous","doi":"10.1109/AT.1995.535972","DOIUrl":"https://doi.org/10.1109/AT.1995.535972","url":null,"abstract":"The purpose of the paper is to describe the development of an optical interface used in the system REGISTRON of BOBST for the alignment of paper in a rotary printing press. This alignment is based on the detection of small repairs preprinted on the paper. This miniaturisation and the cost optimisation leads to a system based on two ASICs: one ASIC including 8 photodiodes integrated with their transimpedance amplifier in a CMOS standard process and one ASIC which performs the operations of multiplexing, amplifying the signals delivered by 32 photodiodes. While the first ASIC is designed in full-custom, the second ASIC is realised in a mixed-mode gate-array.","PeriodicalId":268081,"journal":{"name":"AT'95: Advanced Technologies Intelligent Vision","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134479779","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multisensorial cameras in industrial quality inspection","authors":"R. Massen","doi":"10.1109/AT.1995.535971","DOIUrl":"https://doi.org/10.1109/AT.1995.535971","url":null,"abstract":"Industrial surface inspection can greatly be improved if not just greylevel intensity, but also colour and local height can be imaged at once. The multi-sensorial camera produces for every pixel not a scalar attribute, but a complete feature vector with many, preferably uncorrelated components. A typical example is the \"3D&Colour\" line scan camera which generates a feature vector (Intensity, Hue, Saturation, Z=height) for every pixel at resolutions of typically 2048 pixels along the line of scan and with scanning frequencies up to several kHz. The processing of such a vectorial image starts with a LUT-based, trainable pixel classifier who transforms the vectorial image into a stack of binary class label images. This significant data reduction results in only little information loss and leads to further processing based on well-established image region processing techniques.","PeriodicalId":268081,"journal":{"name":"AT'95: Advanced Technologies Intelligent Vision","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126665044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
求助内容：
应助结果提醒方式：