Proceedings of the 2nd International Conference on Perspective Technologies and Methods in MEMS Design最新文献

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Application Of The Edge-Based Image Segmentation 基于边缘的图像分割的应用
K. Strzecha, A. Fabijariska, D. Sankowski
{"title":"Application Of The Edge-Based Image Segmentation","authors":"K. Strzecha, A. Fabijariska, D. Sankowski","doi":"10.1109/MEMSTECH.2006.288656","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2006.288656","url":null,"abstract":"In this paper computerized system fcr high temperature measurements of superficial properties has been presented. The process of superficial properties determination is based on digital image processing and analysis algorithms. Image segmentation methods in aforementioned system have been discussed. Particular attention has been paid to new approach for edge-based image segmentation involving parallel performance of gradient operator and thresholding mechanism","PeriodicalId":260202,"journal":{"name":"Proceedings of the 2nd International Conference on Perspective Technologies and Methods in MEMS Design","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116643092","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
MBS signal dedicated to the identification of dynamic properties of electric resistance furnaces MBS信号专用于电阻炉动态特性的识别
A. Frączyk
{"title":"MBS signal dedicated to the identification of dynamic properties of electric resistance furnaces","authors":"A. Frączyk","doi":"10.1109/MEMSTECH.2006.288669","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2006.288669","url":null,"abstract":"In this paper an advantage of MBS signal dedicated to identification of dynamic properties of electric resistance furnace is presented. The utility of generated signal for the identification of electric resistance furnace was verified in the full range of angular frequencies by the computer simulation","PeriodicalId":260202,"journal":{"name":"Proceedings of the 2nd International Conference on Perspective Technologies and Methods in MEMS Design","volume":"197 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129964027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Continuation of Developing an Electrokinetic Phenomena Model in VHDL-AMS Language 在VHDL-AMS语言中开发电动力学现象模型的延续
K. Slusarczyk, A. Napieralski
{"title":"Continuation of Developing an Electrokinetic Phenomena Model in VHDL-AMS Language","authors":"K. Slusarczyk, A. Napieralski","doi":"10.1109/MEMSTECH.2006.288663","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2006.288663","url":null,"abstract":"In this paper the continuation of developing electro-kinetic phenomena models in VHDL-AMS language is presented. At the beginning the origin of the project is presented, than the model assumptions are introduced and discussed. A short derivation of models' equations is also given, and finally simulation results are demonstrated and discussed","PeriodicalId":260202,"journal":{"name":"Proceedings of the 2nd International Conference on Perspective Technologies and Methods in MEMS Design","volume":"19 7","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131992108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Rf-Mems Components In Mobile Communication Terminal 移动通信终端中的Rf-Mems元件
A. Singhal, G. Gupta
{"title":"Rf-Mems Components In Mobile Communication Terminal","authors":"A. Singhal, G. Gupta","doi":"10.1109/MEMSTECH.2006.288679","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2006.288679","url":null,"abstract":"Micro-machined passive components open new perspectives to the integration of multi-standard RF transceivers for mobile communications. The different types of components are reviewed and their potential use in transceiver architectures is outlined","PeriodicalId":260202,"journal":{"name":"Proceedings of the 2nd International Conference on Perspective Technologies and Methods in MEMS Design","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128276422","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Automated calculation of piezoresistive microsensors by CAD/CAM/CAE 压阻式微传感器的CAD/CAM/CAE自动计算
K. Kolesnyk, E.P. Bruk, A.S. Dvorchyn
{"title":"Automated calculation of piezoresistive microsensors by CAD/CAM/CAE","authors":"K. Kolesnyk, E.P. Bruk, A.S. Dvorchyn","doi":"10.1109/MEMSTECH.2006.288658","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2006.288658","url":null,"abstract":"The control program is developed for conducting of the automated calculation of piezoresistive microsensors type for measuring of pressure by the API functions of CAD/CAM/CAE. Research of influencing of geometrical parameters and pressure is conducted on initial descriptions of sensor","PeriodicalId":260202,"journal":{"name":"Proceedings of the 2nd International Conference on Perspective Technologies and Methods in MEMS Design","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124239577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Subsystem Development on the Functional Level of MEMS Design MEMS设计中功能层面的子系统开发
V. Teslyuk, Y. Kushnir, S. Soltysyak
{"title":"Subsystem Development on the Functional Level of MEMS Design","authors":"V. Teslyuk, Y. Kushnir, S. Soltysyak","doi":"10.1109/MEMSTECH.2006.288682","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2006.288682","url":null,"abstract":"In this paper, a subsystem development on the functional level of MEMS design is considered","PeriodicalId":260202,"journal":{"name":"Proceedings of the 2nd International Conference on Perspective Technologies and Methods in MEMS Design","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117329406","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Singular value decomposition for texture defect detection in visual inspection systems 视觉检测系统中纹理缺陷检测的奇异值分解
L. Tomczak, V. Mosorov
{"title":"Singular value decomposition for texture defect detection in visual inspection systems","authors":"L. Tomczak, V. Mosorov","doi":"10.1109/MEMSTECH.2006.288681","DOIUrl":"https://doi.org/10.1109/MEMSTECH.2006.288681","url":null,"abstract":"In this paper the authors propose an algorithm for texture defects detection, which doesn't use supervised classification. The algorithm can be simply applied in an automatic visual inspection system. For localization of texture defects features calculation of each non-overlapping region of an image via the singular value decomposition (SVD) and image processing techniques. In next step the algorithm uses the fuzzy c-means clustering (FCM) to classify each region into two clusters. Finally the authors define a distance between centres of defective and non-defective clusters using some threshold value chosen empirically","PeriodicalId":260202,"journal":{"name":"Proceedings of the 2nd International Conference on Perspective Technologies and Methods in MEMS Design","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131094697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
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