S. Schmucker, E. Frederick, Q. Campbell, J. Ivie, E. Anderson, K. Dwyer, A. Baczewski, George Wang, R. Butera, S. Misra
{"title":"Atomic Precision Advanced Manufacturing and Lessons for Area-Selective Deposition.","authors":"S. Schmucker, E. Frederick, Q. Campbell, J. Ivie, E. Anderson, K. Dwyer, A. Baczewski, George Wang, R. Butera, S. Misra","doi":"10.2172/1877517","DOIUrl":"https://doi.org/10.2172/1877517","url":null,"abstract":"","PeriodicalId":256346,"journal":{"name":"Proposed for presentation at the 21st International Conference on Atomic Layer Deposition held June 27-30, 2021 in Virtual,","volume":"4 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132644390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}