Atomic Force Microscopy - Basic Principles to Advanced Applications [Working Title]最新文献

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Application of Atomic Force Microscopy in Organic and Perovskite Photovoltaics 原子力显微镜在有机和钙钛矿光伏中的应用

Atomic Force Microscopy - Basic Principles to Advanced Applications [Working Title] Pub Date : 2021-06-10 DOI: 10.5772/INTECHOPEN.98478

C. Pathak

引用次数: 3

Diffraction Grating Groove Metrology Using AFM & STM 用AFM和STM测量衍射光栅槽

Atomic Force Microscopy - Basic Principles to Advanced Applications [Working Title] Pub Date : 2021-04-26 DOI: 10.5772/INTECHOPEN.97257

L. Goray

{"title":"Diffraction Grating Groove Metrology Using AFM & STM","authors":"L. Goray","doi":"10.5772/INTECHOPEN.97257","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.97257","url":null,"abstract":"AFM & STM metrology has been around for a long time, and especially intense since it has been awarded by the Nobel Prize in Physics in 1986. Since then, many AFM & STM groove profile measurements on surface relief diffraction gratings have been presented. However, a wide review of the results of the use of AFM & STM methods for groove metrology of various surface relief gratings has not really been undertaken. The following problems are discussed in this chapter: the cantilever tip deconvolution, geometry, and radius; groove shapes and abrupt groove slopes; roughness; PSD functions; etc. Also, the author demonstrates comparisons with other widely-used metrology techniques and examples of AFM & STM data of bulk, coated, and multilayer-coated ruled, or holographic, or lithographic gratings having realistic groove profiles. These gratings were chosen because high quality efficiency data exists, in particular, for space gratings or/and X-ray gratings characterized by synchrotron radiation sources; and their groove profiles, together with random nanoroughness, were measured by AFM or STM to be included in rigorous efficiency and scattered light intensity calculus. In the present chapter, both the earlier published results and the recent, non-published yet results are described and discussed.","PeriodicalId":253445,"journal":{"name":"Atomic Force Microscopy - Basic Principles to Advanced Applications [Working Title]","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127859428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Nanomaterials Characterisation through Magnetic Field Dependent AFM 利用磁场依赖原子力显微镜表征纳米材料

Atomic Force Microscopy - Basic Principles to Advanced Applications [Working Title] Pub Date : 2021-04-15 DOI: 10.5772/INTECHOPEN.97249

M. Coïsson, G. Barrera, F. Celegato, P. Tiberto

{"title":"Nanomaterials Characterisation through Magnetic Field Dependent AFM","authors":"M. Coïsson, G. Barrera, F. Celegato, P. Tiberto","doi":"10.5772/INTECHOPEN.97249","DOIUrl":"https://doi.org/10.5772/INTECHOPEN.97249","url":null,"abstract":"Atomic force microscopy is a versatile technique allowing to exploit many different physical effects for measuring a number of materials properties. The magnetic properties of surfaces and thin films are traditionally accessed through magnetic force microscopy, which produces magnetic field gradient maps generated by the magnetisation distribution at the surface of the sample. However, more advanced techniques can be derived from this fundamental setup, allowing for a richer characterisation of magnetic samples. In this chapter, we will describe how to extend a magnetic force microscope to allow magnetic field-dependent characterisations. Magnetisation reversal processes, as well as full hysteresis loops, can be investigated with such a technique, with field resolution adequate for identifying significant features such as domains reversal, nucleation or annihilation of domains, and other irreversible mechanisms. The same principle can also be exploited for the measurement of magnetostriction on thin films, and can be taken as guideline for other advanced applications of atomic force microscopy.","PeriodicalId":253445,"journal":{"name":"Atomic Force Microscopy - Basic Principles to Advanced Applications [Working Title]","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133889403","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0