R. P. D. Vries, Kuen-Jong Lee, T. Cheng, Yao-Wen Chang, Ting-Ting Hwang, Cheng-Wen Wu
{"title":"Words from symposium chair and co-chair","authors":"R. P. D. Vries, Kuen-Jong Lee, T. Cheng, Yao-Wen Chang, Ting-Ting Hwang, Cheng-Wen Wu","doi":"10.1109/vdat.2009.5158076","DOIUrl":"https://doi.org/10.1109/vdat.2009.5158076","url":null,"abstract":"The International Symposium on VLSI Design, Automation and Test (VLSI-DAT), spun-off from the influential International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) in 2006, has stepped into the 4 year. Every year, scientists and engineers discuss and present the state-of-the-art technology and macro development of the industry's future. The VLSI-DAT symposium is becoming more significant, since Taiwan not only occupies a prominent position in the global semiconductor industry, but also is increasingly competitive globally in IC design technology for communication and information products.","PeriodicalId":246670,"journal":{"name":"2009 International Symposium on VLSI Design, Automation and Test","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133333107","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}