Kaushikaram Subramanian, Heike Petzold, B. Seelbinder, L. Hersemann, I. Nüsslein, M. Kreysing
{"title":"Inside cover","authors":"Kaushikaram Subramanian, Heike Petzold, B. Seelbinder, L. Hersemann, I. Nüsslein, M. Kreysing","doi":"10.31390/taboo.16.1.01","DOIUrl":"https://doi.org/10.31390/taboo.16.1.01","url":null,"abstract":"","PeriodicalId":242588,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014","volume":"137 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114832529","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Nakaie, J. Matsui, Y. Miyamoto, T. Kuriyama, H. Maeda, W. Takatsuji, Y. Ueno, T. Itoh
{"title":"2013 friendship award in recognition of RCJ 2012 best paper award/Japan","authors":"T. Nakaie, J. Matsui, Y. Miyamoto, T. Kuriyama, H. Maeda, W. Takatsuji, Y. Ueno, T. Itoh","doi":"10.23919/eos/esd.2018.8509767","DOIUrl":"https://doi.org/10.23919/eos/esd.2018.8509767","url":null,"abstract":"","PeriodicalId":242588,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120962677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"President's award","authors":"M. Farris","doi":"10.2113/gscpgbull.56.2.205","DOIUrl":"https://doi.org/10.2113/gscpgbull.56.2.205","url":null,"abstract":"To be considered for this award a faculty member may be nominated by a fellow faculty member, by a current or former student, or by a staff member. Nominees will be asked to complete a reference sheet supplying personal and professional information. After a review of all nominations, a selection committee appointed by the Vice President for Academic Affairs will recommend three candidates. The Vice President for Academic Affairs will then forward the recommended candidates to the President who will make the final selection.","PeriodicalId":242588,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127932029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"General chairman's welcome","authors":"H. Gossner","doi":"10.1109/autest.2004.1436699","DOIUrl":"https://doi.org/10.1109/autest.2004.1436699","url":null,"abstract":"On behalf of the ESD Association and the 2014 Symposium Steering Committee, I would like to give you a warm welcome to the 36th International EOS/ESD Symposium held at the Westin La Paloma in Tucson, AZ.","PeriodicalId":242588,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127613397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Etherton, Nathan Jack, Shih-Hung Chen, C. Duvvury, Xiaofeng Fan, F. Farbiz, G. Boselli, D. Linten, K. Esmark, Timothy Maloney, M. Mergens, Qpx GmbH, M. Okushima, J. Salcedo, M. Scholz, S. Beebe, G. Hellings, R. Ashton, Fabrice Caignet, Wei Huang, D. Pommerenke, Ankit Srivastava, Richard T. K. Wong, M. Lam, R. Gibson, Victor Cao, A. Salman
{"title":"Technical program committee 2014","authors":"M. Etherton, Nathan Jack, Shih-Hung Chen, C. Duvvury, Xiaofeng Fan, F. Farbiz, G. Boselli, D. Linten, K. Esmark, Timothy Maloney, M. Mergens, Qpx GmbH, M. Okushima, J. Salcedo, M. Scholz, S. Beebe, G. Hellings, R. Ashton, Fabrice Caignet, Wei Huang, D. Pommerenke, Ankit Srivastava, Richard T. K. Wong, M. Lam, R. Gibson, Victor Cao, A. Salman","doi":"10.1109/eosesd.2015.7314749","DOIUrl":"https://doi.org/10.1109/eosesd.2015.7314749","url":null,"abstract":"-vTLP/HBM/MM/CDM Device Testing: Testers, Methods, and Correlation Issues Sub-Committee Chair: Theo Smedes, NXP Semiconductors Robert Ashton, ON Semiconductor Evan Grund, Grund Technical Solutions, LLC Marty Johnson, Texas Instruments, 1m: David J ohnsson, High Power Pulse Instruments GmbH Tom Meuse, Thermo Fisher S cientijic Masanori Sawada, HANW A Electronics Wolfgang Stadler, Intel Mobile Communications","PeriodicalId":242588,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114112908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}